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Citation(s) in
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3
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For:
Hamada S
, Kawahara K, Tsurekawa S, Watanabe T, Sekiguchi T.
Impact of Grain Boundary Character on Electrical Property in Polycrystalline Silicon.
ACTA ACUST UNITED AC
2011. [DOI:
10.1557/proc-586-163
]
[
Citation(s) in
RCA
: 14
]
[
Impact Index Per Article: 1.1
]
[
Reference Citation Analysis
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[Indexed: 11/13/2022]
Number
Cited by Other Article(s)
1
Tsurekawa S
, Kido K, Hamada S, Watanabe T, Sekiguchi T. Electrical activity of grain boundaries in polycrystalline silicon – influences of grain boundary structure, chemistry and temperature.
ACTA ACUST UNITED AC
2005. [DOI:
10.3139/146.101020
]
[
Citation(s) in
RCA
: 9
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
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[Indexed: 11/20/2022]
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2
Distribution of Plane Matching Boundaries for Different Types and Sharpness of Textures.
ACTA ACUST UNITED AC
2005. [DOI:
10.4028/www.scientific.net/msf.475-479.3871
]
[
Citation(s) in
RCA
: 9
]
[
Impact Index Per Article: 0.5
]
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[Indexed: 11/21/2022]
Abstract
The stability of the plane matching boundary is discussed in connection with the deviation from the exact plane matching orientation and the atomic density per unit area of the lattice plane. The statistic calculation of the plane matching boundary distribution in the different types and sharpness of texture revealed that the coverage by plane matching boundaries (>80%) is much higher than the coverage by CSL boundaries (~60%). The sharpness of texture strongly affects the distribution of plane matching boundaries.
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3
Large Grain Polycrystalline Silicon Film Produced by Nano-Aluminum-Enhanced Crystallization of Amorphous Silicon.
ACTA ACUST UNITED AC
2005. [DOI:
10.1149/1.1928232
]
[
Citation(s) in
RCA
: 17
]
[
Impact Index Per Article: 0.9
]
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[Indexed: 11/16/2022]
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