Kalinin SV, Strelcov E, Belianinov A, Somnath S, Vasudevan RK, Lingerfelt EJ, Archibald RK, Chen C, Proksch R, Laanait N, Jesse S. Big, Deep, and Smart Data in Scanning Probe Microscopy.
ACS NANO 2016;
10:9068-9086. [PMID:
27676453 DOI:
10.1021/acsnano.6b04212]
[Citation(s) in RCA: 56] [Impact Index Per Article: 7.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/11/2023]
Abstract
Scanning probe microscopy (SPM) techniques have opened the door to nanoscience and nanotechnology by enabling imaging and manipulation of the structure and functionality of matter at nanometer and atomic scales. Here, we analyze the scientific discovery process in SPM by following the information flow from the tip-surface junction, to knowledge adoption by the wider scientific community. We further discuss the challenges and opportunities offered by merging SPM with advanced data mining, visual analytics, and knowledge discovery technologies.
Collapse