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Number Cited by Other Article(s)
1
Bottoms CM, Stein GE, Doxastakis M. Accelerated Diffusion Following Deprotection in Chemically Amplified Resists. J Phys Chem B 2022;126:6562-6574. [PMID: 35984912 DOI: 10.1021/acs.jpcb.2c03775] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
2
Bottoms CM, Terlier T, Stein GE, Doxastakis M. Ion Diffusion in Chemically Amplified Resists. Macromolecules 2021. [DOI: 10.1021/acs.macromol.0c02052] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
3
Ober MS, Romer DR, Etienne J, Thomas PJ, Jain V, Cameron JF, Thackeray JW. Backbone Degradable Poly(aryl acetal) Photoresist Polymers: Synthesis, Acid Sensitivity, and Extreme Ultraviolet Lithography Performance. Macromolecules 2019. [DOI: 10.1021/acs.macromol.8b01038] [Citation(s) in RCA: 11] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
4
Kozawa T, Tagawa S. Determination of Optimum Thermalization Distance Based on Trade-off Relationship between Resolution, Line Edge Roughness and Sensitivity of Chemically Amplified Extreme Ultraviolet Resists. J PHOTOPOLYM SCI TEC 2011. [DOI: 10.2494/photopolymer.24.137] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
5
Shioya T, Maruyama K, Kimura T. Novel Material Development for EUV Resist towards sub-20nm half pitch. J PHOTOPOLYM SCI TEC 2011. [DOI: 10.2494/photopolymer.24.199] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
6
Kozawa T, Yamamoto H, Tagawa S. Effect of Inhomogeneous Acid Distribution on Line Edge Roughness-Relationship to Line Edge Roughness Originating from Chemical Gradient. J PHOTOPOLYM SCI TEC 2010. [DOI: 10.2494/photopolymer.23.625] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
7
Kimura T, Nishino K, Shimizu M, Hirai Y, Maruyama K, Kai T. JSR EUV Resist Development toward 22nmhp Design and Beyond. J PHOTOPOLYM SCI TEC 2010. [DOI: 10.2494/photopolymer.23.643] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
8
Kozawa T, Tagawa S. Image Formation in Chemically Amplified Resists upon Exposure to Extreme Ultraviolet Radiation. J PHOTOPOLYM SCI TEC 2009. [DOI: 10.2494/photopolymer.22.51] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
9
Latent image formation in chemically amplified extreme ultraviolet resists with low activation energy for deprotection reaction. ACTA ACUST UNITED AC 2008. [DOI: 10.1116/1.2990787] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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