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For: Wan Q, Zhu M, Liu Y. Monitoring the process mean using a synthetic X ¯ control chart with two sampling intervals. IFS 2020. [DOI: 10.3233/jifs-190600] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022]
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