Huang R, Shi D. Treatment of noise caused by radiation damage during cryo-EM data collection.
Structure 2023;
31:1523-1525. [PMID:
38065075 DOI:
10.1016/j.str.2023.11.005]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/01/2023] [Revised: 11/10/2023] [Accepted: 11/11/2023] [Indexed: 12/18/2023]
Abstract
Here, we discuss how noise that is caused by radiation damage during cryo-EM data collections accumulates during single-particle analysis (SPA), MicroED, and cryo-ET. For MicroED and SPA, bad data can be identified and excluded during data collection and processing, whereas cryo-ET will require systematic radiation damage assessments that can be derived from SPA.
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