X-ray Free-Electron Laser

A workflow for single-particle structure determination via iterative phasing of rotational invariants in fluctuation X-ray scattering

Fluctuation X-ray scattering (FXS) offers a complementary approach for nano- and bioparticle imaging with an X-ray free-electron laser (XFEL), by extracting structural information from correlations in scattered XFEL pulses. Here a workflow is presented for single-particle structure determination using FXS. The workflow includes procedures for extracting the rotational invariants from FXS patterns, performing structure reconstructions via iterative phasing of the invariants, and aligning and averaging multiple reconstructions. The reconstruction pipeline is implemented in the open-source software xFrame and its functionality is demonstrated on several simulated structures.

A Review of High-Gain Free-Electron Laser Theory

High-gain free-electron lasers, conceived in the 1980s, are nowadays the only bright sources of coherent X-ray radiation available. In this article, we review the theory developed by R. Bonifacio and coworkers, who have been some of the first scientists envisaging its operation as a single-pass amplifier starting from incoherent undulator radiation, in the so called self-amplified spontaneous emission (SASE) regime. We review the FEL theory, discussing how the FEL parameters emerge from it, which are fundamental for describing, designing and understanding all FEL experiments in the high-gain, single-pass operation.