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For: Yan P, Liu X, Sun F, Zhao Q, Zhong S, Wang Y. Measurement of In-Plane Displacement in Two Orthogonal Directions by Digital Speckle Pattern Interferometry. Applied Sciences 2019;9:3882. [DOI: 10.3390/app9183882] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Number Cited by Other Article(s)
1
Jiang H, Yang F, Dai X, He X, Peng G. Tri-wavelength simultaneous ESPI for 3D micro-deformation field measurement. APPLIED OPTICS 2022;61:615-622. [PMID: 35200904 DOI: 10.1364/ao.445824] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/12/2021] [Accepted: 12/11/2021] [Indexed: 06/14/2023]
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