Reference Citation Analysis: Find an Article, Find a Category, Find a Journal, Find a Scholar

For: Zeng Y, Ren H, Yang T, Xiao S, Xiong N. A Novel Similarity Measure of Single-Valued Neutrosophic Sets Based on Modified Manhattan Distance and Its Applications. Electronics 2022;11:941. [DOI: 10.3390/electronics11060941] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/27/2023]

For:	Zeng Y, Ren H, Yang T, Xiao S, Xiong N. A Novel Similarity Measure of Single-Valued Neutrosophic Sets Based on Modified Manhattan Distance and Its Applications. Electronics 2022;11:941. [DOI: 10.3390/electronics11060941] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/27/2023]

Number	Cited by Other Article(s)
1	Chen X, Ye P, Huang L, Wang C, Cai Y, Deng L, Ren H. Exploring science-technology linkages: A deep learning-empowered solution. Inf Process Manag 2023. [DOI: 10.1016/j.ipm.2022.103255] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/24/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse

Number

Cited by Other Article(s)

Chen X, Ye P, Huang L, Wang C, Cai Y, Deng L, Ren H. Exploring science-technology linkages: A deep learning-empowered solution. Inf Process Manag 2023. [DOI: 10.1016/j.ipm.2022.103255] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/24/2022]