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For: Sánchez P, Lorenzo O, Menéndez A, Menéndez JL, Gomez D, Pereiro R, Fernández B. Characterization of doped amorphous silicon thin films through the investigation of dopant elements by glow discharge spectrometry: a correlation of conductivity and bandgap energy measurements. Int J Mol Sci 2011;12:2200-15. [PMID: 21731436 DOI: 10.3390/ijms12042200] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/04/2011] [Revised: 03/15/2011] [Accepted: 03/28/2011] [Indexed: 11/16/2022]  Open
Number Cited by Other Article(s)
1
Wei Yuan W, Norizan MN, Mohamad IS, Jamalullail N, Saad NH. Optimization of intrinsic layer thickness, dopant layer thickness and concentration for a-SiC/a-SiGe multilayer solar cell efficiency performance using Silvaco software. EPJ WEB OF CONFERENCES 2017. [DOI: 10.1051/epjconf/201716201044] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
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