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Mutilin SV, Yakovkina LV, Seleznev VA, Prinz VY. Kinetics of Catalyst-Free and Position-Controlled Low-Pressure Chemical Vapor Deposition Growth of VO 2 Nanowire Arrays on Nanoimprinted Si Substrates. MATERIALS (BASEL, SWITZERLAND) 2022; 15:ma15217863. [PMID: 36363453 PMCID: PMC9656171 DOI: 10.3390/ma15217863] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/07/2022] [Revised: 10/30/2022] [Accepted: 11/06/2022] [Indexed: 05/27/2023]
Abstract
In the present article, the position-controlled and catalytic-free synthesis of vanadium dioxide (VO2) nanowires (NWs) grown by the chemical vapor deposition (CVD) on nanoimprinted silicon substrates in the form of nanopillar arrays was analyzed. The NW growth on silicon nanopillars with different cross-sectional areas was studied, and it has been shown that the NWs' height decreases with an increase in their cross-sectional area. The X-ray diffraction technique, scanning electron microscopy, and X-ray photoelectron spectroscopy showed the high quality of the grown VO2 NWs. A qualitative description of the growth rate of vertical NWs based on the material balance equation is given. The dependence of the growth rate of vertical and horizontal NWs on the precursor concentration in the gas phase and on the growth time was investigated. It was found that the height of vertical VO2 NWs along the [100] direction exhibited a linear dependence on time and increased with an increase in the precursor concentration. For horizontal VO2 NWs, the height along the direction [011] varied little with the growth time and precursor concentration. These results suggest that the high-aspect ratio vertical VO2 NWs formed due to different growth modes of their crystal faces forming the top of the growing VO2 crystals and their lateral crystal faces related to the difference between the free energies of these crystal faces and implemented experimental conditions. The results obtained permit a better insight into the growth of high-aspect ratio VO2 NWs and into the formation of large VO2 NW arrays with a controlled composition and properties.
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Affiliation(s)
- Sergey V. Mutilin
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Aven., 630090 Novosibirsk, Russia
| | - Lyubov V. Yakovkina
- Nikolaev Institute of Inorganic Chemistry SB RAS, 3 Lavrentiev Aven., 630090 Novosibirsk, Russia
| | - Vladimir A. Seleznev
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Aven., 630090 Novosibirsk, Russia
| | - Victor Ya. Prinz
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev Aven., 630090 Novosibirsk, Russia
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2
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Krisponeit JO, Fischer S, Esser S, Moshnyaga V, Schmidt T, Piper LFJ, Flege JI, Falta J. The morphology of VO 2/TiO 2(001): terraces, facets, and cracks. Sci Rep 2020; 10:22374. [PMID: 33361795 PMCID: PMC7758337 DOI: 10.1038/s41598-020-78584-9] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/14/2020] [Accepted: 11/20/2020] [Indexed: 12/03/2022] Open
Abstract
Vanadium dioxide (VO2) features a pronounced, thermally-driven metal-to-insulator transition at 340 K. Employing epitaxial stress on rutile \documentclass[12pt]{minimal}
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\begin{document}$$\text{TiO}_{2}(001)$$\end{document}TiO2(001) substrates, the transition can be tuned to occur close to room temperature. Striving for applications in oxide-electronic devices, the lateral homogeneity of such samples must be considered as an important prerequisite for efforts towards miniaturization. Moreover, the preparation of smooth surfaces is crucial for vertically stacked devices and, hence, the design of functional interfaces. Here, the surface morphology of \documentclass[12pt]{minimal}
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\begin{document}$$\text{VO}_2/\text{TiO}_2(001)$$\end{document}VO2/TiO2(001) films was analyzed by low-energy electron microscopy and diffraction as well as scanning probe microscopy. The formation of large terraces could be achieved under temperature-induced annealing, but also the occurrence of facets was observed and characterized. Further, we report on quasi-periodic arrangements of crack defects which evolve due to thermal stress under cooling. While these might impair some applicational endeavours, they may also present crystallographically well-oriented nano-templates of bulk-like properties for advanced approaches.
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Affiliation(s)
- Jon-Olaf Krisponeit
- Institute of Solid State Physics, University of Bremen, 28359, Bremen, Germany. .,MAPEX Center for Materials and Processes, University of Bremen, 28359, Bremen, Germany.
| | - Simon Fischer
- Institute of Solid State Physics, University of Bremen, 28359, Bremen, Germany
| | - Sven Esser
- Experimentalphysik VI, Universität Augsburg, 86159, Augsburg, Germany.,I. Physikalisches Institut, Georg-August-Universität Göttingen, 37077, Göttingen, Germany
| | - Vasily Moshnyaga
- I. Physikalisches Institut, Georg-August-Universität Göttingen, 37077, Göttingen, Germany
| | - Thomas Schmidt
- Institute of Solid State Physics, University of Bremen, 28359, Bremen, Germany.,MAPEX Center for Materials and Processes, University of Bremen, 28359, Bremen, Germany
| | | | - Jan Ingo Flege
- Applied Physics and Semiconductor Spectroscopy, Brandenburg University of Technology Cottbus-Senftenberg, 03046, Cottbus, Germany
| | - Jens Falta
- Institute of Solid State Physics, University of Bremen, 28359, Bremen, Germany.,MAPEX Center for Materials and Processes, University of Bremen, 28359, Bremen, Germany
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3
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Fleer N, Pelcher KE, Nieto K, Braham EJ, Zou J, Horrocks GA, Naoi Y, Depner SW, Schultz BJ, Amano J, Sellers DG, Banerjee S. Elucidating the Crystallite Size Dependence of the Thermochromic Properties of Nanocomposite VO 2 Thin Films. ACS OMEGA 2018; 3:14280-14293. [PMID: 31458119 PMCID: PMC6644338 DOI: 10.1021/acsomega.8b02093] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/18/2018] [Accepted: 10/16/2018] [Indexed: 06/10/2023]
Abstract
Fenestration elements that enable spectrally selective dynamic modulation of the near-infrared region of the electromagnetic spectrum are of great interest as a means of decreasing the energy consumption of buildings by adjusting solar heat gain in response to external temperature. The binary vanadium oxide VO2 exhibits a near-room-temperature insulator-metal electronic transition accompanied by a dramatic modulation of the near-infrared transmittance. The low-temperature insulating phase is infrared transparent but blocks infrared transmission upon metallization. There is considerable interest in harnessing the thermochromic modulation afforded by VO2 in nanocomposite thin films. However, to prepare a viable thermochromic film, the visible-light transmittance must be maintained as high as possible while maximizing thermochromic modulation in the near-infrared region of the electromagnetic spectrum, which necessitates the development of high-crystalline-quality VO2 nanocrystals of the optimal particle size embedded within the appropriate host matrix and refractive index matched to the host medium. Here, we demonstrate the preparation of acrylate-based nanocomposite thin films with varying sizes of embedded VO2 nanoparticles. The observed strong size dependence of visible-light transmittance and near-infrared modulation is explicable on the basis of optical simulations. In this article, we elucidate multiple scattering and absorption mechanisms, including Mie scattering, temperature-/phase-variant refractive-index mismatch between VO2 nanocrystals and the encapsulating matrix, and the appearance of a surface plasmon resonance using temperature-variant absorptance and diffuse transmittance spectroscopy measurements performed as a function of particle loading for the different sizes of VO2 nanocrystals. Nanocrystals with dimensions of 44 ± 30 nm show up to >32% near-infrared energy modulation across the near-infrared region of the electromagnetic spectrum while maintaining high visible-light transmission. The results presented here, providing mechanistic elucidation of the size dependence of the different scattering mechanisms, underscore the importance of nanocrystallite dimensions, refractive-index matching, and individualized dispersion of particles within the host matrix for the preparation of viable thermochromic thin films mitigating Mie scattering and differential refractive-index scattering.
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Affiliation(s)
- Nathan
A. Fleer
- Department
of Chemistry, Texas A&M University, College Station, Texas 77842-3012, United States
- Department
of Materials Science and Engineering, Texas
A&M University, College
Station, Texas 77843-3003, United States
| | - Kate E. Pelcher
- Department
of Chemistry, Texas A&M University, College Station, Texas 77842-3012, United States
- Department
of Materials Science and Engineering, Texas
A&M University, College
Station, Texas 77843-3003, United States
| | - Kelly Nieto
- Department
of Chemistry, Texas A&M University, College Station, Texas 77842-3012, United States
- Department
of Materials Science and Engineering, Texas
A&M University, College
Station, Texas 77843-3003, United States
| | - Erick J. Braham
- Department
of Chemistry, Texas A&M University, College Station, Texas 77842-3012, United States
- Department
of Materials Science and Engineering, Texas
A&M University, College
Station, Texas 77843-3003, United States
| | - Jian Zou
- School
of Chemistry and Chemical Engineering, Southwest
University, Bayi Road, Beibei Qu, Chongqing Shi 400716, China
| | - Gregory A. Horrocks
- Department
of Chemistry, Texas A&M University, College Station, Texas 77842-3012, United States
- Department
of Materials Science and Engineering, Texas
A&M University, College
Station, Texas 77843-3003, United States
| | - Yuki Naoi
- Konica
Minolta Laboratory USA, 2855 Campus Drive, Suite 100, San Mateo, California 94403, United States
| | - Sean W. Depner
- Dimien
LLC, 1576 Sweet Home
Road, Suite 231, Amherst, New York 14228, United
States
| | - Brian J. Schultz
- Dimien
LLC, 1576 Sweet Home
Road, Suite 231, Amherst, New York 14228, United
States
| | - Jun Amano
- Konica
Minolta Laboratory USA, 2855 Campus Drive, Suite 100, San Mateo, California 94403, United States
| | - Diane G. Sellers
- Department
of Chemistry, Texas A&M University, College Station, Texas 77842-3012, United States
- Department
of Materials Science and Engineering, Texas
A&M University, College
Station, Texas 77843-3003, United States
| | - Sarbajit Banerjee
- Department
of Chemistry, Texas A&M University, College Station, Texas 77842-3012, United States
- Department
of Materials Science and Engineering, Texas
A&M University, College
Station, Texas 77843-3003, United States
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Lauzier J, Sutton L, de la Venta J. Magnetic irreversibility in VO 2/Ni bilayers. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2018; 30:374004. [PMID: 30043758 DOI: 10.1088/1361-648x/aad5af] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
We studied the temperature dependence of the magnetic properties of VO2/Ni bilayers. The Ni films were deposited on either monoclinic or rutile phase VO2. The temperature induced VO2 transformation from a monoclinic to a rutile structure induces strain in the Ni film. Due to an inverse magnetoelastic effect the coercivity of the Ni films is strongly modified. Both Ni films show strong enhancement of the coercivity near the transition temperature. The coercivity enhancement of Ni is associated with the phase coexistence observed in the VO2 first order phase transition. Above the transition temperature, Ni deposited on monoclinic VO2 shows a coercivity enhancement whereas Ni deposited on rutile VO2 shows suppression of the coercivity. The samples were cycled several times to check if the changes in coercivity were reversible. While samples with Ni deposited on rutile VO2 show reversibility, samples with Ni deposited on monoclinic VO2 shown an irreversibility after the first structural phase transition. This irreversibility can be associated with cracking of the VO2 layer as it relieves stress due to the transition and has implications for the resistance versus temperature behavior of the VO2.
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Affiliation(s)
- J Lauzier
- Department of Physics, Colorado State University, Fort Collins, CO 80523, United States of America
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Yang Y, Yao Y, Zhang B, Lin H, Luo Z, Gao C, Zhang C, Kang C. Investigating Metal⁻Insulator Transition and Structural Phase Transformation in the (010)-VO₂/(001)-YSZ Epitaxial Thin Films. MATERIALS 2018; 11:ma11091713. [PMID: 30217052 PMCID: PMC6163228 DOI: 10.3390/ma11091713] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/18/2018] [Revised: 09/05/2018] [Accepted: 09/11/2018] [Indexed: 11/16/2022]
Abstract
The VO2 thin films with sharp metal–insulator transition (MIT) were epitaxially grown on (001)-oriented Yttria-stabilized zirconia substrates (YSZ) using radio-frequency (RF) magnetron sputtering techniques. The MIT and structural phase transition (SPT) were comprehensively investigated under in situ temperature conditions. The amplitude of MIT is in the order of magnitude of 104, and critical temperature is 342 K during the heating cycle. It is interesting that both electron concentration and mobility are changed by two orders of magnitude across the MIT. This research is distinctively different from previous studies, which found that the electron concentration solely contributes to the amplitude of the MIT, although the electron mobility does not. Analysis of the SPT showed that the (010)-VO2/(001)-YSZ epitaxial thin film presents a special multi-domain structure, which is probably due to the symmetry matching and lattice mismatch between the VO2 and YSZ substrate. The VO2 film experiences the SPT from the M1 phase at low temperature to a rutile phase at a high temperature. Moreover, the SPT occurs at the same critical temperature as that of the MIT. This work may shed light on a new MIT behavior and may potentially pave the way for preparing high-quality VO2 thin films on cost-effective YSZ substrates for photoelectronic applications.
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Affiliation(s)
- Yuanjun Yang
- School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China.
| | - Yingxue Yao
- School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China.
| | - Benjian Zhang
- School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China.
| | - Hui Lin
- School of Electronic Science and Applied Physics, Hefei University of Technology, Hefei 230009, China.
| | - Zhenlin Luo
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026, China.
| | - Chen Gao
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026, China.
| | - Cong Zhang
- School of Physics and Electronic Information, Henan Polytechnic University, Jiaozuo 454000, China.
| | - Chaoyang Kang
- School of Physics and Electronic Information, Henan Polytechnic University, Jiaozuo 454000, China.
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