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For: Radek M, Liedke B, Schmidt B, Voelskow M, Bischoff L, Hansen JL, Larsen AN, Bougeard D, Böttger R, Prucnal S, Posselt M, Bracht H. Ion-Beam-Induced Atomic Mixing in Ge, Si, and SiGe, Studied by Means of Isotope Multilayer Structures. Materials (Basel) 2017;10:E813. [PMID: 28773172 DOI: 10.3390/ma10070813] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/07/2017] [Revised: 07/11/2017] [Accepted: 07/12/2017] [Indexed: 11/30/2022]
Number Cited by Other Article(s)
1
The Preparation of Amorphous ZrC/Nanocrystalline Ni Multilayers and the Resistance to He+ Irradiation. MATERIALS 2022;15:ma15093059. [PMID: 35591394 PMCID: PMC9101292 DOI: 10.3390/ma15093059] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/26/2022] [Revised: 04/15/2022] [Accepted: 04/19/2022] [Indexed: 02/05/2023]
2
Analysis of medium-range order based on simulated segmented ring detector STEM-images: amorphous Si. Ultramicroscopy 2019;200:169-179. [DOI: 10.1016/j.ultramic.2019.02.023] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/16/2018] [Revised: 02/22/2019] [Accepted: 02/26/2019] [Indexed: 11/21/2022]
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