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For: Yu D, Liu H, Zhang X, Gong T. Critical Current Simulation and Measurement of Second Generation, High-Temperature Superconducting Coil under External Magnetic Field. Materials (Basel) 2018;11:E339. [PMID: 29495386 PMCID: PMC5872918 DOI: 10.3390/ma11030339] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/08/2018] [Revised: 02/20/2018] [Accepted: 02/24/2018] [Indexed: 11/20/2022]

For:	Yu D, Liu H, Zhang X, Gong T. Critical Current Simulation and Measurement of Second Generation, High-Temperature Superconducting Coil under External Magnetic Field. Materials (Basel) 2018;11:E339. [PMID: 29495386 PMCID: PMC5872918 DOI: 10.3390/ma11030339] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/08/2018] [Revised: 02/20/2018] [Accepted: 02/24/2018] [Indexed: 11/20/2022]

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(The first 100,000 artilces are displayed in RCA.)