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For: Schöler M, Brecht C, Wellmann PJ. Annealing-Induced Changes in the Nature of Point Defects in Sublimation-Grown Cubic Silicon Carbide. Materials (Basel) 2019;12:ma12152487. [PMID: 31390722 PMCID: PMC6695932 DOI: 10.3390/ma12152487] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/24/2019] [Revised: 07/15/2019] [Accepted: 08/02/2019] [Indexed: 11/16/2022]

For:	Schöler M, Brecht C, Wellmann PJ. Annealing-Induced Changes in the Nature of Point Defects in Sublimation-Grown Cubic Silicon Carbide. Materials (Basel) 2019;12:ma12152487. [PMID: 31390722 PMCID: PMC6695932 DOI: 10.3390/ma12152487] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/24/2019] [Revised: 07/15/2019] [Accepted: 08/02/2019] [Indexed: 11/16/2022]

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(The first 100,000 artilces are displayed in RCA.)