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For: Zhong Y, Dai Y, Shi F, Song C, Tian Y, Lin Z, Zhang W, Shen Y. Effects of Ion Beam Etching on the Nanoscale Damage Precursor Evolution of Fused Silica. Materials (Basel) 2020;13:E1294. [PMID: 32182972 DOI: 10.3390/ma13061294] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/15/2020] [Revised: 03/10/2020] [Accepted: 03/11/2020] [Indexed: 11/21/2022]
Number Cited by Other Article(s)
1
Ion-Track Template Synthesis and Characterization of ZnSeO3 Nanocrystals. CRYSTALS 2022. [DOI: 10.3390/cryst12060817] [Citation(s) in RCA: 4] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/04/2023]
2
Towards Investigating Surface Quality of Single-Crystal Silicon Optics Polished with Different Processes. COATINGS 2022. [DOI: 10.3390/coatings12020158] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/05/2023]
3
Lamberti L. In Situ TEM and AFM for Investigation of Materials. MATERIALS 2021;14:ma14092140. [PMID: 33922445 PMCID: PMC8122761 DOI: 10.3390/ma14092140] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Download PDF] [Subscribe] [Scholar Register] [Received: 04/19/2021] [Accepted: 04/21/2021] [Indexed: 01/10/2023]
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