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For: Krawczyk M, Pisarek M, Szoszkiewicz R, Jablonski A. Surface Characterization of MoS2 Atomic Layers Mechanically Exfoliated on a Si Substrate. Materials (Basel) 2020;13:E3595. [PMID: 32823911 PMCID: PMC7475815 DOI: 10.3390/ma13163595] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/16/2020] [Revised: 08/08/2020] [Accepted: 08/12/2020] [Indexed: 11/16/2022]
Number Cited by Other Article(s)
1
Szoszkiewicz R. Local Interactions of Atmospheric Oxygen with MoS2 Crystals. MATERIALS (BASEL, SWITZERLAND) 2021;14:5979. [PMID: 34683567 PMCID: PMC8540515 DOI: 10.3390/ma14205979] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/11/2021] [Revised: 09/29/2021] [Accepted: 10/07/2021] [Indexed: 11/17/2022]
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