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Wang LM, Cao L, Ji WH, Du R, Tang M, Chen SL, Yan LL, Xiao Y, Zhang JR. Application of Neutron Scattering in Organic Photovoltaic Materials. CHINESE JOURNAL OF STRUCTURAL CHEMISTRY 2023. [DOI: 10.1016/j.cjsc.2023.100023] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/30/2023]
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Feng J, Yuan G, Mao L, Leao J, Ramic K, de Stefanis E, Bedell R, Liu L(E. Multi-layer structure of Inconel 625 coatings prepared by magnetron sputtering. SURFACE & COATINGS TECHNOLOGY 2021; 405:10.1016/j.surfcoat.2020.126545. [PMID: 37719657 PMCID: PMC10502688 DOI: 10.1016/j.surfcoat.2020.126545] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 09/19/2023]
Abstract
The coating/substrate interface and oxide layers of the Inconel 625 film may have significant impacts on its material properties, especially the corrosion behavior of the film. However, since the interface and oxide layer can be very thin and experimental toolbox to characterize them is limited, the detailed vertical structure of Inconel 625 coatings remains poorly understood. In this study, a multi-layer structure in Inconel 625 film prepared by magnetron sputtering is revealed using X-ray reflectometry (XRR) and neutron reflectometry (NR) techniques. Thickness and major composition of each layer are obtained. The results indicate that there exists a ~2 nm-thick Cr-rich Inconel sublayer underneath the main Inconel 625 film. An oxide layer mainly consisting of NiO with thickness of ~2 nm is found on the surface of the main Inconel 625 film. In addition, we identified a ~2 Å contamination layer between sapphire substrate and Inconel film even after argon ion sputtering cleaning. We also found that the thickness of the main Inconel 625 film grows linearly with the deposition time, with thicknesses of other layers remaining constant. Our findings provide insight into the multi-layered structures of Inconel 625 coatings with atomic-scale spatial resolution and give directions for future study to improve the corrosion resistance of Inconel 625 coatings.
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Affiliation(s)
- Jinghua Feng
- Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
| | - Guangcui Yuan
- NIST Center for Neutron Resesectarch, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
- Department of Physics, Georgetown University, Washington D. C. 20057, USA
| | - Li Mao
- Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
| | - Juscelino Leao
- NIST Center for Neutron Resesectarch, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, USA
| | - Kemal Ramic
- Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
| | - Emily de Stefanis
- Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
| | - Ryan Bedell
- Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
| | - Li (Emily) Liu
- Department of Mechanical, Aerospace, and Nuclear Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, USA
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Stoev K, Sakurai K. Recent Progresses in Nanometer Scale Analysis of Buried Layers and Interfaces in Thin Films by X-rays and Neutrons. ANAL SCI 2020; 36:901-922. [PMID: 32147630 DOI: 10.2116/analsci.19r010] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
Abstract
In the early 1960s, scientists achieved the breakthroughs in the fields of solid surfaces and artificial layered structures. The advancement of surface science has been supported by the advent of ultra-high vacuum technologies, newly discovered and established scanning probe microscopy with atomic resolution, as well as some other advanced surface-sensitive spectroscopy and microscopy. On the other hand, it has been well recognized that a number of functions are related to the structures of the interfaces, which are the thin planes connecting different materials, most likely by layering thin films. Despite the scientific significance, so far, research on such buried layers and interfaces has been limited, because the probing depth of almost all existing sophisticated analytical methods is limited to the top surface. The present article describes the recent progress in the nanometer scale analysis of buried layers and interfaces, particularly by using X-rays and neutrons. The methods are essentially promising to non-destructively probe such buried structures in thin films. The latest scientific research has been reviewed, and includes applications to bio-chemical, organic, electronic, magnetic, spintronic, self-organizing and complicated systems as well as buried liquid-liquid and solid-liquid interfaces. Some emerging analytical techniques and instruments, which provide new attractive features such as imaging and real time analysis, are also discussed.
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