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For: Omura Y. Empirical and Theoretical Modeling of Low-Frequency Noise Behavior of Ultrathin Silicon-on-Insulator MOSFETs Aiming at Low-Voltage and Low-Energy Regime. Micromachines (Basel) 2018;10:E5. [PMID: 30583561 DOI: 10.3390/mi10010005] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/04/2018] [Revised: 12/15/2018] [Accepted: 12/18/2018] [Indexed: 11/16/2022]
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1
Editorial for the Special Issue on Miniaturized Transistors. MICROMACHINES 2019;10:mi10050300. [PMID: 31052516 PMCID: PMC6562691 DOI: 10.3390/mi10050300] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Download PDF] [Subscribe] [Scholar Register] [Received: 04/25/2019] [Accepted: 04/25/2019] [Indexed: 12/20/2022]
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