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Yao B, Xu Y, Jing J, Zhang W, Guo Y, Zhang Z, Zhang S, Liu J, Xue C. Comparison and Verification of Three Algorithms for Accuracy Improvement of Quartz Resonant Pressure Sensors. MICROMACHINES 2023; 15:23. [PMID: 38258142 PMCID: PMC10819135 DOI: 10.3390/mi15010023] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/03/2023] [Revised: 12/16/2023] [Accepted: 12/18/2023] [Indexed: 01/24/2024]
Abstract
Pressure measurement is of great importance due to its wide range of applications in many fields. AT-cut quartz, with its exceptional precision and durability, stands out as an excellent pressure transducer due to its superior accuracy and stable performance over time. However, its intrinsic temperature dependence significantly hinders its potential application in varying temperature environments. Herein, three different learning algorithms (i.e., multivariate polynomial regression, multilayer perceptron networks, and support vector regression) are elaborated in detail and applied to establish the prediction models for compensating the temperature effect of the resonant pressure sensor, respectively. The AC-cut quartz, which is sensitive to temperature variations, is paired with the AT-cut quartz, providing the essential temperature information. The output frequencies derived from the AT-cut and AC-cut quartzes are selected as input data for these learning algorithms. Through experimental validation, all three methods are effective, and a remarkable improvement in accuracy can be achieved. Among the three methods, the MPR model has exceptionally high accuracy in predicting pressure. The calculated residual error over the temperature range of -10-40 °C is less than 0.008% of 40 MPa full scale (FS). An intelligent automatic compensation and real-time processing system for the resonant pressure sensor is developed as well, which may contribute to improving the efficiency in online calibration and large-scale industrialization. This paper paves a promising way for the temperature compensation of resonant pressure sensors.
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Affiliation(s)
- Bin Yao
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (B.Y.); (Y.G.); (S.Z.); (J.L.)
| | - Yanbo Xu
- Pen-Tung Sah Institute of Micro-Nano Science and Technology, Xiamen University, Xiamen 361102, China; (Y.X.); (J.J.); (W.Z.)
| | - Junming Jing
- Pen-Tung Sah Institute of Micro-Nano Science and Technology, Xiamen University, Xiamen 361102, China; (Y.X.); (J.J.); (W.Z.)
| | - Wenjun Zhang
- Pen-Tung Sah Institute of Micro-Nano Science and Technology, Xiamen University, Xiamen 361102, China; (Y.X.); (J.J.); (W.Z.)
| | - Yuzhen Guo
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (B.Y.); (Y.G.); (S.Z.); (J.L.)
| | - Zengxing Zhang
- Pen-Tung Sah Institute of Micro-Nano Science and Technology, Xiamen University, Xiamen 361102, China; (Y.X.); (J.J.); (W.Z.)
- Tan Kah Kee Innovation Laboratory, Xiamen 361005, China
| | - Shiqiang Zhang
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (B.Y.); (Y.G.); (S.Z.); (J.L.)
| | - Jianwei Liu
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (B.Y.); (Y.G.); (S.Z.); (J.L.)
| | - Chenyang Xue
- Key Laboratory of Instrumentation Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan 030051, China; (B.Y.); (Y.G.); (S.Z.); (J.L.)
- Tan Kah Kee Innovation Laboratory, Xiamen 361005, China
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Han X, Huang M, Wu Z, Gao Y, Xia Y, Yang P, Fan S, Lu X, Yang X, Liang L, Su W, Wang L, Cui Z, Zhao Y, Li Z, Zhao L, Jiang Z. Advances in high-performance MEMS pressure sensors: design, fabrication, and packaging. MICROSYSTEMS & NANOENGINEERING 2023; 9:156. [PMID: 38125202 PMCID: PMC10730882 DOI: 10.1038/s41378-023-00620-1] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 04/02/2023] [Revised: 10/10/2023] [Accepted: 10/11/2023] [Indexed: 12/23/2023]
Abstract
Pressure sensors play a vital role in aerospace, automotive, medical, and consumer electronics. Although microelectromechanical system (MEMS)-based pressure sensors have been widely used for decades, new trends in pressure sensors, including higher sensitivity, higher accuracy, better multifunctionality, smaller chip size, and smaller package size, have recently emerged. The demand for performance upgradation has led to breakthroughs in sensor materials, design, fabrication, and packaging methods, which have emerged frequently in recent decades. This paper reviews common new trends in MEMS pressure sensors, including minute differential pressure sensors (MDPSs), resonant pressure sensors (RPSs), integrated pressure sensors, miniaturized pressure chips, and leadless pressure sensors. To realize an extremely sensitive MDPS with broad application potential, including in medical ventilators and fire residual pressure monitors, the "beam-membrane-island" sensor design exhibits the best performance of 66 μV/V/kPa with a natural frequency of 11.3 kHz. In high-accuracy applications, silicon and quartz RPS are analyzed, and both materials show ±0.01%FS accuracy with respect to varying temperature coefficient of frequency (TCF) control methods. To improve MEMS sensor integration, different integrated "pressure + x" sensor designs and fabrication methods are compared. In this realm, the intercoupling effect still requires further investigation. Typical fabrication methods for microsized pressure sensor chips are also reviewed. To date, the chip thickness size can be controlled to be <0.1 mm, which is advantageous for implant sensors. Furthermore, a leadless pressure sensor was analyzed, offering an extremely small package size and harsh environmental compatibility. This review is structured as follows. The background of pressure sensors is first presented. Then, an in-depth introduction to MEMS pressure sensors based on different application scenarios is provided. Additionally, their respective characteristics and significant advancements are analyzed and summarized. Finally, development trends of MEMS pressure sensors in different fields are analyzed.
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Affiliation(s)
- Xiangguang Han
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Mimi Huang
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Zutang Wu
- Northwest Institute of Nuclear Technology, Xi’an, 710024 China
| | - Yi Gao
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Yong Xia
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Ping Yang
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Shu Fan
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Xuhao Lu
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Xiaokai Yang
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Lin Liang
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Wenbi Su
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Lu Wang
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Zeyu Cui
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Yihe Zhao
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Zhikang Li
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Libo Zhao
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
| | - Zhuangde Jiang
- State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
- International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technologies, Xi’an Jiaotong University, Xi’an, 710049 China
- School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an, 710049 China
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Xiang C, Lu Y, Cheng C, Wang J, Chen D, Chen J. A Resonant Pressure Microsensor with a Wide Pressure Measurement Range. MICROMACHINES 2021; 12:mi12040382. [PMID: 33916030 PMCID: PMC8066463 DOI: 10.3390/mi12040382] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/09/2021] [Revised: 03/26/2021] [Accepted: 03/27/2021] [Indexed: 11/17/2022]
Abstract
This paper presents a resonant pressure microsensor with a wide range of pressure measurements. The developed microsensor is mainly composed of a silicon-on-insulator (SOI) wafer to form pressure-sensing elements, and a silicon-on-glass (SOG) cap to form vacuum encapsulation. To realize a wide range of pressure measurements, silicon islands were deployed on the device layer of the SOI wafer to enhance equivalent stiffness and structural stability of the pressure-sensitive diaphragm. Moreover, a cylindrical vacuum cavity was deployed on the SOG cap with the purpose to decrease the stresses generated during the silicon-to-glass contact during pressure measurements. The fabrication processes mainly contained photolithography, deep reactive ion etching (DRIE), chemical mechanical planarization (CMP) and anodic bonding. According to the characterization experiments, the quality factors of the resonators were higher than 15,000 with pressure sensitivities of 0.51 Hz/kPa (resonator I), −1.75 Hz/kPa (resonator II) and temperature coefficients of frequency of 1.92 Hz/°C (resonator I), 1.98 Hz/°C (resonator II). Following temperature compensation, the fitting error of the microsensor was within the range of 0.006% FS and the measurement accuracy was as high as 0.017% FS in the pressure range of 200 ~ 7000 kPa and the temperature range of −40 °C to 80 °C.
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Affiliation(s)
- Chao Xiang
- Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China; (C.X.); (Y.L.); (C.C.); (J.C.)
- School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
| | - Yulan Lu
- Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China; (C.X.); (Y.L.); (C.C.); (J.C.)
- School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
| | - Chao Cheng
- Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China; (C.X.); (Y.L.); (C.C.); (J.C.)
- School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
| | - Junbo Wang
- Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China; (C.X.); (Y.L.); (C.C.); (J.C.)
- School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Correspondence: (J.W.); (D.C.); Tel.: +86-010-588-87191 (J.W.); +86-010-588-87182 (D.C.)
| | - Deyong Chen
- Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China; (C.X.); (Y.L.); (C.C.); (J.C.)
- School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
- Correspondence: (J.W.); (D.C.); Tel.: +86-010-588-87191 (J.W.); +86-010-588-87182 (D.C.)
| | - Jian Chen
- Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100190, China; (C.X.); (Y.L.); (C.C.); (J.C.)
- School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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