• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4670602)   Today's Articles (2106)
For: Hari S, Trompenaars PHF, Mulders JJL, Kruit P, Hagen CW. Combined Focused Electron Beam-Induced Deposition and Etching for the Patterning of Dense Lines without Interconnecting Material. Micromachines (Basel) 2020;12:8. [PMID: 33374159 DOI: 10.3390/mi12010008] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/30/2020] [Revised: 12/21/2020] [Accepted: 12/22/2020] [Indexed: 11/17/2022]
Number Cited by Other Article(s)
1
Glessi C, Polman FA, Hagen CW. Water-assisted purification during electron beam-induced deposition of platinum and gold. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2024;15:884-896. [PMID: 39076692 PMCID: PMC11285079 DOI: 10.3762/bjnano.15.73] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/07/2024] [Accepted: 06/20/2024] [Indexed: 07/31/2024]
2
Hari S, van Dorp WF, Mulders JJL, Trompenaars PHF, Kruit P, Hagen CW. Sidewall angle tuning in focused electron beam-induced processing. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2024;15:447-456. [PMID: 38711581 PMCID: PMC11070960 DOI: 10.3762/bjnano.15.40] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/15/2024] [Accepted: 03/20/2024] [Indexed: 05/08/2024]
3
Ion-Track Template Synthesis and Characterization of ZnSeO3 Nanocrystals. CRYSTALS 2022. [DOI: 10.3390/cryst12060817] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/04/2023]
4
Córdoba R. Editorial for the Special Issue on Nanofabrication with Focused Electron/Ion Beam Induced Processing. MICROMACHINES 2021;12:mi12080893. [PMID: 34442515 PMCID: PMC8400715 DOI: 10.3390/mi12080893] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Subscribe] [Scholar Register] [Received: 07/22/2021] [Accepted: 07/27/2021] [Indexed: 11/16/2022]
5
In Situ Atomic-Scale Observation of Silver Oxidation Triggered by Electron Beam Irradiation. NANOMATERIALS 2021;11:nano11041021. [PMID: 33923534 PMCID: PMC8073916 DOI: 10.3390/nano11041021] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/25/2021] [Revised: 04/02/2021] [Accepted: 04/13/2021] [Indexed: 11/20/2022]
PrevPage 1 of 1 1Next
© 2004-2025 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA