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For: Yao R, Fu X, Li W, Zhou S, Ning H, Tang B, Wei J, Cao X, Xu W, Peng J. Bias Stress Stability of Solution-Processed Nano Indium Oxide Thin Film Transistor. Micromachines (Basel) 2021;12:111. [PMID: 33499221 DOI: 10.3390/mi12020111] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/28/2020] [Revised: 01/18/2021] [Accepted: 01/19/2021] [Indexed: 11/16/2022]

For:	Yao R, Fu X, Li W, Zhou S, Ning H, Tang B, Wei J, Cao X, Xu W, Peng J. Bias Stress Stability of Solution-Processed Nano Indium Oxide Thin Film Transistor. Micromachines (Basel) 2021;12:111. [PMID: 33499221 DOI: 10.3390/mi12020111] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/28/2020] [Revised: 01/18/2021] [Accepted: 01/19/2021] [Indexed: 11/16/2022]

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Cited by Other Article(s)

Verzellesi G. Editorial for the Special Issue on Wide Bandgap Based Devices: Design, Fabrication and Applications, Volume II. MICROMACHINES 2022;13:mi13030403. [PMID: 35334695 PMCID: PMC8954295 DOI: 10.3390/mi13030403] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Download PDF] [Subscribe] [Scholar Register] [Received: 02/27/2022] [Accepted: 02/27/2022] [Indexed: 02/04/2023]