Koval OY, Fedorov VV, Kryzhanovskaya NV, Sapunov GA, Kirilenko DA, Pirogov EV, Filosofov NG, Serov AY, Shtrom IV, Bolshakov AD, Mukhin IS. Structural and optical characterization of dilute phosphide planar heterostructures with high nitrogen content on silicon.
CrystEngComm 2020. [DOI:
10.1039/c9ce01498e]
[Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Despite poor crystallinity, a dilute nitride phosphide heterostructure with 5% nitrogen content demonstrates PL response at RT centered at 1.76 eV.
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