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Laukkanen P, Punkkinen M, Kuzmin M, Kokko K, Liu X, Radfar B, Vähänissi V, Savin H, Tukiainen A, Hakkarainen T, Viheriälä J, Guina M. Bridging the gap between surface physics and photonics. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2024; 87:044501. [PMID: 38373354 DOI: 10.1088/1361-6633/ad2ac9] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/18/2023] [Accepted: 02/19/2024] [Indexed: 02/21/2024]
Abstract
Use and performance criteria of photonic devices increase in various application areas such as information and communication, lighting, and photovoltaics. In many current and future photonic devices, surfaces of a semiconductor crystal are a weak part causing significant photo-electric losses and malfunctions in applications. These surface challenges, many of which arise from material defects at semiconductor surfaces, include signal attenuation in waveguides, light absorption in light emitting diodes, non-radiative recombination of carriers in solar cells, leakage (dark) current of photodiodes, and light reflection at solar cell interfaces for instance. To reduce harmful surface effects, the optical and electrical passivation of devices has been developed for several decades, especially with the methods of semiconductor technology. Because atomic scale control and knowledge of surface-related phenomena have become relevant to increase the performance of different devices, it might be useful to enhance the bridging of surface physics to photonics. Toward that target, we review some evolving research subjects with open questions and possible solutions, which hopefully provide example connecting points between photonic device passivation and surface physics. One question is related to the properties of the wet chemically cleaned semiconductor surfaces which are typically utilized in device manufacturing processes, but which appear to be different from crystalline surfaces studied in ultrahigh vacuum by physicists. In devices, a defective semiconductor surface often lies at an embedded interface formed by a thin metal or insulator film grown on the semiconductor crystal, which makes the measurements of its atomic and electronic structures difficult. To understand these interface properties, it is essential to combine quantum mechanical simulation methods. This review also covers metal-semiconductor interfaces which are included in most photonic devices to transmit electric carriers to the semiconductor structure. Low-resistive and passivated contacts with an ultrathin tunneling barrier are an emergent solution to control electrical losses in photonic devices.
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Affiliation(s)
- Pekka Laukkanen
- Department of Physics and Astronomy, University of Turku, Turku, Finland
| | - Marko Punkkinen
- Department of Physics and Astronomy, University of Turku, Turku, Finland
| | - Mikhail Kuzmin
- Department of Physics and Astronomy, University of Turku, Turku, Finland
| | - Kalevi Kokko
- Department of Physics and Astronomy, University of Turku, Turku, Finland
| | - Xiaolong Liu
- Department of Electronics and Nanoengineering, Aalto University, Espoo, Finland
| | - Behrad Radfar
- Department of Electronics and Nanoengineering, Aalto University, Espoo, Finland
| | - Ville Vähänissi
- Department of Electronics and Nanoengineering, Aalto University, Espoo, Finland
| | - Hele Savin
- Department of Electronics and Nanoengineering, Aalto University, Espoo, Finland
| | - Antti Tukiainen
- Optoelectronics Research Centre, Tampere University, Tampere, Finland
| | - Teemu Hakkarainen
- Optoelectronics Research Centre, Tampere University, Tampere, Finland
| | - Jukka Viheriälä
- Optoelectronics Research Centre, Tampere University, Tampere, Finland
| | - Mircea Guina
- Optoelectronics Research Centre, Tampere University, Tampere, Finland
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Zhang HT, He R, Peng L, Yang YT, Sun XJ, Zhang YS, Zheng YX, Liu BJ, Zhang RJ, Wang SY, Li J, Lee YP, Chen LY. Interpretation of Reflection and Colorimetry Characteristics of Indium-Particle Films by Means of Ellipsometric Modeling. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:383. [PMID: 36770343 PMCID: PMC9920837 DOI: 10.3390/nano13030383] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 12/30/2022] [Revised: 01/13/2023] [Accepted: 01/16/2023] [Indexed: 06/18/2023]
Abstract
It is of great technological importance in the field of plasmonic color generation to establish and understand the relationship between optical responses and the reflectance of metallic nanoparticles. Previously, a series of indium nanoparticle ensembles were fabricated using electron beam evaporation and inspected using spectroscopic ellipsometry (SE). The multi-oscillator Lorentz-Drude model demonstrated the optical responses of indium nanoparticles with different sizes and size distributions. The reflectance spectra and colorimetry characteristics of indium nanoparticles with unimodal and bimodal size distributions were interpreted based on the SE analysis. The trends of reflectance spectra were explained by the transfer matrix method. The effects of optical constants n and k of indium on the reflectance were demonstrated by mapping the reflectance contour lines on the n-k plane. Using oscillator decomposition, the influence of different electron behaviors in various indium structures on the reflectance spectra was revealed intuitively. The contribution of each oscillator on the colorimetry characteristics, including hue, lightness and saturation, were determined and discussed from the reflectance spectral analysis.
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Affiliation(s)
- Hao-Tian Zhang
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Rong He
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Lei Peng
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Yu-Ting Yang
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Xiao-Jie Sun
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Yu-Shan Zhang
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Yu-Xiang Zheng
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
- High Tech Center for New Materials, Novel Devices and Cutting-Edge Manufacturing, Yiwu Research Institute, Fudan University, Yiwu 322000, China
| | - Bao-Jian Liu
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
- Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
| | - Rong-Jun Zhang
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Song-You Wang
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Jing Li
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
| | - Young-Pak Lee
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
- Department of Physics, Quantum Photonic Science Research Center and RINS, Hanyang University, Seoul 04763, Republic of Korea
| | - Liang-Yao Chen
- Department of Optical Science and Engineering, School of Information Science and Technology, Fudan University, Shanghai 200433, China
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Gulomov J, Accouche O, Al Barakeh Z, Aliev R, Gulomova I, Neji B. Atom-to-Device Simulation of MoO 3/Si Heterojunction Solar Cell. NANOMATERIALS (BASEL, SWITZERLAND) 2022; 12:nano12234240. [PMID: 36500863 PMCID: PMC9735858 DOI: 10.3390/nano12234240] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/24/2022] [Revised: 11/14/2022] [Accepted: 11/22/2022] [Indexed: 06/01/2023]
Abstract
Metal oxides are commonly used in optoelectronic devices due to their transparency and excellent electrical conductivity. Based on its physical properties, each metal oxide serves as the foundation for a unique device. In this study, we opt to determine and assess the physical properties of MoO3 metal oxide. Accordingly, the optical and electronic parameters of MoO3 are evaluated using DFT (Density Functional Theory), and PBE and HSE06 functionals were mainly used in the calculation. It was found that the band structure of MoO3 calculated using PBE and HSE06 exhibited indirect semiconductor properties with the same line quality. Its band gap was 3.027 eV in HSE06 and 2.12 eV in PBE. Electrons and holes had effective masses and mobilities of 0.06673, -0.10084, 3811.11 cm2V-1s-1 and 1630.39 cm2V-1s-1, respectively. In addition, the simulation determined the dependence of the real and imaginary components of the complex refractive index and permittivity of MoO3 on the wavelength of light, and a value of 58 corresponds to the relative permittivity. MoO3 has a refractive index of between 1.5 and 3 in the visible spectrum, which can therefore be used as an anti-reflection layer for solar cells made from silicon. In addition, based on the semiconducting properties of MoO3, it was estimated that it could serve as an emitter layer for a solar cell containing silicon. In this work, we calculated the photoelectric parameters of the MoO3/Si heterojunction solar cell using Sentaurus TCAD (Technology Computing Aided Design). According to the obtained results, the efficiency of the MoO3/Si solar cell with a MoO3 layer thickness of 100 nm and a Si layer thickness of 9 nm is 8.8%, which is 1.24% greater than the efficiency of a homojunction silicon-based solar cell of the same size. The greatest short-circuit current for a MoO3/Si heterojunction solar cell was observed at a MoO3 layer thickness of 60 nm, which was determined by studying the dependency of the heterojunction short-circuit current on the thickness of the MoO3 layer.
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Affiliation(s)
- Jasurbek Gulomov
- Renewable Energy Sources Laboratory, Andijan State University, Andijan 170100, Uzbekistan
| | - Oussama Accouche
- College of Engineering and Technology, American University of the Middle East, Egaila 54200, Kuwait
| | - Zaher Al Barakeh
- College of Engineering and Technology, American University of the Middle East, Egaila 54200, Kuwait
| | - Rayimjon Aliev
- Renewable Energy Sources Laboratory, Andijan State University, Andijan 170100, Uzbekistan
| | - Irodakhon Gulomova
- Renewable Energy Sources Laboratory, Andijan State University, Andijan 170100, Uzbekistan
| | - Bilel Neji
- College of Engineering and Technology, American University of the Middle East, Egaila 54200, Kuwait
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Abstract
Solar-to-chemical energy conversion via heterogeneous photocatalysis is one of the sustainable approaches to tackle the growing environmental and energy challenges. Among various promising photocatalytic materials, plasmonic-driven photocatalysts feature prominent solar-driven surface plasmon resonance (SPR). Non-noble plasmonic metals (NNPMs)-based photocatalysts have been identified as a unique alternative to noble metal-based ones due to their advantages like earth-abundance, cost-effectiveness, and large-scale application capability. This review comprehensively summarizes the most recent advances in the synthesis, characterization, and properties of NNPMs-based photocatalysts. After introducing the fundamental principles of SPR, the attributes and functionalities of NNPMs in governing surface/interfacial photocatalytic processes are presented. Next, the utilization of NNPMs-based photocatalytic materials for the removal of pollutants, water splitting, CO2 reduction, and organic transformations is discussed. The review concludes with current challenges and perspectives in advancing the NNPMs-based photocatalysts, which are timely and important to plasmon-based photocatalysis, a truly interdisciplinary field across materials science, chemistry, and physics.
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Affiliation(s)
- Mahmoud Sayed
- Laboratory of Solar Fuel, Faculty of Materials Science and Chemistry, China University of Geosciences, 388 Lumo Road, Wuhan 430074, P.R. China.,Chemistry Department, Faculty of Science, Fayoum University, Fayoum 63514, Egypt.,State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Luoshi Road 122, Wuhan 430070, P.R. China
| | - Jiaguo Yu
- Laboratory of Solar Fuel, Faculty of Materials Science and Chemistry, China University of Geosciences, 388 Lumo Road, Wuhan 430074, P.R. China.,State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Luoshi Road 122, Wuhan 430070, P.R. China.,College of Chemistry and Chemical Engineering, Jishou University, Jishou 416000, Hunan, P.R. China
| | - Gang Liu
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
| | - Mietek Jaroniec
- Department of Chemistry and Biochemistry, Kent State University, Kent, Ohio 44242, United States
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Stylianakis MM. Optoelectronic Nanodevices. NANOMATERIALS 2020; 10:nano10030520. [PMID: 32183135 PMCID: PMC7153245 DOI: 10.3390/nano10030520] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/24/2020] [Revised: 02/27/2020] [Accepted: 03/11/2020] [Indexed: 11/30/2022]
Affiliation(s)
- Minas M Stylianakis
- Department of Electrical & Computer Engineering, Hellenic Mediterranean University (HMU), Estavromenos, 71410 Heraklion, Greece
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Enhancing the Performance of Textured Silicon Solar Cells by Combining Up-Conversion with Plasmonic Scattering. ENERGIES 2019. [DOI: 10.3390/en12214119] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
Abstract
This paper experimentally demonstrates the benefits of combining an up-conversion (UC) layer containing Yb/Er-doped yttrium oxide-based phosphors with a plasmonic scattering layer containing indium nanoparticles (In-NPs) in enhancing the photovoltaic performance of textured silicon solar cells. The optical emissions of the Yb/Er-doped phosphors were characterized using photoluminescence measurements obtained at room temperature. Optical microscope images and photo current-voltage curves were used to characterize the UC emissions of Yb/Er-doped phosphors under illumination from a laser diode with a wavelength of 1550 nm. The plasmonic effects of In NPs were assessed in terms of absorbance and Raman scattering. The performance of the textured solar cells was evaluated in terms of optical reflectance, external quantum efficiency, and photovoltaic performance. The analysis was performed on cells with and without a UC layer containing Yb/Er-doped yttrium oxide-based phosphors of various concentrations. The analysis was also performed on cells with a UC layer in conjunction with a plasmonic scattering layer. The absolute conversion efficiency of the textured silicon solar cell with a combination of up-conversion and plasmonic-scattering layers (15.43%) exceeded that of the cell with an up-conversion layer only (14.94%) and that of the reference cell (14.45%).
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