A 0.18 μm CMOS LDO Regulator for an On-Chip Sensor Array Impedance Measurement System

A Low-Power, Fast-Transient Output-Capacitorless LDO with Transient Enhancement Unit and Current Booster

With the wide application of advanced portable devices, output-capacitorless low dropout regulators (OCL-LDO) are receiving increasing attention. This paper presents a low quiescent current OCL-LDO with fast transient response. A transient enhancement unit (TEU) is proposed as the output voltage-spike detection circuit. It enhances the transient response by improving the slew-rate at the gate of the power transistor. In addition, a current booster (CB), which consists of a current subtractor and a non-linear current mirror, is designed to improve the slew-rate further. The current subtractor increases the transconductances of the differential-input transistors to obtain a large slewing current, while the non-linear current mirror further boosts the current with no extra quiescent current consumption. The simulated results show that the proposed OCL-LDO is capable of supplying 100 mA load current while consuming 10.3 μA quiescent current. It regulates the output at 1 V from a supply voltage ranging from 1.2 to 1.8 V. When the load current is stepped from 1 mA to 100 mA in 100 ns, the OCL-LDO has attained a settling time of 190 ns, and the output voltage undershoot and overshoot are controlled under 110 mV.

High-Precision Low-Temperature Drift LDO Regulator Tailored for Time-Domain Temperature Sensors

This paper proposes a high-precision LDO with low-temperature drift suitable for sensitive time-domain temperature sensors. Its topology is based on multiple feedback loops and a novel approach to frequency compensation, that allows the LDO to maintain a large DC gain while handling capacitive loads that vary over a wide range. The key design constraints are derived by using a simplified, yet intuitive and effective, small-signal analysis devised for LDOs with multiple feedback loops. Simulation and measurement results are presented for implementation in a standard 130 nm CMOS process: the LDO outputs a stable 1 V voltage, when the input voltage varies between 1.25 V to 1.5 V, the load current between 0 and 100 mA, and the load capacitor between zero and 400 pF. It exhibits a DC load regulation of 1 µV/mA, a 288 µV output offset with a standard deviation of 9.5 mV. A key feature for the envisaged application is the very low thermal drift of the output offset: only 14.4 mV across the temperature range of −40 °C to +150 °C. Overall, the LDO output voltage stays within +/−3.5% of the nominal DC value over the entire line voltage, load, and temperature ranges, without trimming. The LDO requires only 1.4µA quiescent current, yet it provides excellent responses to load transients. The output voltage undershoot and overshoot caused by the load current jumping between 0 and 100 mA in 1 µs are: 10%/22% for CL = 0 and 12%/16% for CL = 400 pF, respectively. A comparative analysis against seven LDOs published in the last decade, designed for similar levels of supply voltage and output voltage and current, shows that the LDO presented here is the best option for supplying sensitive time-domain temperature sensors. The smallest thermal drift of the output offset, smaller than +/−15 mV, that is, 6.7 times smaller than its closest competitor, and the best overall performance when PSR up to 1 kHz, was considered.

A Fully-Integrated 180 nm CMOS 1.2 V Low-Dropout Regulator for Low-Power Portable Applications

This paper presents the design and postlayout simulation results of a capacitor-less low dropout (LDO) regulator fully integrated in a low-cost standard 180 nm Complementary Metal-Oxide-Semiconductor (CMOS) technology which regulates the output voltage at 1.2 V from a 3.3 to 1.3 V battery over a −40 to 120 °C temperature range. To meet with the constraints of system-on-chip (SoC) battery-operated devices, ultralow power (Iq = 8.6 µA) and minimum area consumption (0.109 mm2) are maintained, including a reference voltage Vref = 0.4 V. It uses a high-gain dynamically biased folded-based error amplifier topology optimized for low-voltage operation that achieves an enhanced regulation-fast transient performance trade-off.

Categorization and Characterization of Time Domain CMOS Temperature Sensors

Time domain complementary metal-oxide-semiconductor (CMOS) temperature sensors estimate the temperature of a sensory device by measuring the frequency, period and/or delay time instead of the voltage and/or current signals that have been traditionally measured for a long time. In this paper, the time domain CMOS temperature sensors are categorized into twelve types by using the temperature estimation function which is newly defined as the ratio of two measured time domain signals. The categorized time domain CMOS temperature sensors, which have been published in literature, show different characteristics respectively in terms of temperature conversion rate, die area, process variation compensation, temperature error, power supply voltage sensitivity and so on. Based on their characteristics, we can choose the most appropriate one from twelve types to satisfy a given specification.

A CMOS Low Pass Filter for SoC Lock-in-Based Measurement Devices

This paper presents a fully integrated G_m–C low pass filter (LPF) based on a current steering G_m reduction-tuning technique, specifically designed to operate as the output stage of a SoC lock-in amplifier. To validate this proposal, a first-order and a second-order single-ended topology were integrated into a 1.8 V to 0.18 µm CMOS (Complementary Metal-Oxide-Semiconductor) process, showing experimentally a tuneable cutoff frequency that spanned five orders of magnitude, from tens of mHz to kHz, with a constant current consumption (below 3 µA/pole), compact size (<0.0140 mm²/pole), and a dynamic range better than 70 dB. Compared to state-of-the-art solutions, the proposed approach exhibited very competitive performances while simultaneously fully satisfying the demanding requirements of on-chip portable measurement systems in terms of highly efficient area and power. This is of special relevance, taking into account the current trend towards multichannel instruments to process sensor arrays, as the total area and power consumption will be proportional to the number of channels.