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For: Blanco D, Fernandez P, Noriega A, Alvarez BJ, Valiño G. Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors (Basel) 2019;20:E1. [PMID: 31861251 DOI: 10.3390/s20010001] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/22/2019] [Revised: 12/12/2019] [Accepted: 12/16/2019] [Indexed: 01/22/2023]
Number Cited by Other Article(s)
1
Chen L, Sefat SM, Kim KI. An optimal algorithm for mmWave 5G wireless networks based on neural network. Heliyon 2023;9:e17580. [PMID: 37416690 PMCID: PMC10320281 DOI: 10.1016/j.heliyon.2023.e17580] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/11/2023] [Revised: 06/14/2023] [Accepted: 06/21/2023] [Indexed: 07/08/2023]  Open
2
Anurag A, Al‐Hamry A, Attuluri Y, Palaniyappan S, Wagner G, Dentel D, Tegenkamp C, Kanoun O. Optimized Reduction of a Graphene Oxide‐MWCNT Composite with Electrochemically Deposited Copper Nanoparticles on Screen Printed Electrodes for a Wide Range of Detection of Nitrate. ChemElectroChem 2022. [DOI: 10.1002/celc.202200945] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/31/2022]
3
Bertocco A, Bruno M, Armentani E, Esposito L, Perrella M. Stress Relaxation Behavior of Additively Manufactured Polylactic Acid (PLA). MATERIALS 2022;15:ma15103509. [PMID: 35629535 PMCID: PMC9147248 DOI: 10.3390/ma15103509] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 04/12/2022] [Revised: 05/06/2022] [Accepted: 05/10/2022] [Indexed: 12/10/2022]
4
The Influence of Image Processing and Layer-to-Background Contrast on the Reliability of Flatbed Scanner-Based Characterisation of Additively Manufactured Layer Contours. APPLIED SCIENCES-BASEL 2020. [DOI: 10.3390/app11010178] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/01/2023]
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