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For: Shah SK, Tariq Z, Lee J, Lee Y. Event-Driven Deep Learning for Edge Intelligence (EDL-EI). Sensors (Basel) 2021;21:6023. [PMID: 34577228 PMCID: PMC8468758 DOI: 10.3390/s21186023] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/12/2021] [Revised: 08/26/2021] [Accepted: 08/27/2021] [Indexed: 12/03/2022]
Number Cited by Other Article(s)
1
Gültekin Ö, Cinar E, Özkan K, Yazıcı A. Real-Time Fault Detection and Condition Monitoring for Industrial Autonomous Transfer Vehicles Utilizing Edge Artificial Intelligence. SENSORS 2022;22:s22093208. [PMID: 35590898 PMCID: PMC9105012 DOI: 10.3390/s22093208] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/15/2022] [Revised: 04/14/2022] [Accepted: 04/17/2022] [Indexed: 02/05/2023]
2
Gupta C, Johri I, Srinivasan K, Hu YC, Qaisar SM, Huang KY. A Systematic Review on Machine Learning and Deep Learning Models for Electronic Information Security in Mobile Networks. SENSORS 2022;22:s22052017. [PMID: 35271163 PMCID: PMC8915055 DOI: 10.3390/s22052017] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/05/2022] [Revised: 02/28/2022] [Accepted: 02/28/2022] [Indexed: 02/04/2023]
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