Ostrowski M, Blachowski B, Mikułowski G, Jankowski Ł. Influence of Noise in Computer-Vision-Based Measurements on Parameter Identification in Structural Dynamics.
SENSORS (BASEL, SWITZERLAND) 2022;
23:291. [PMID:
36616888 PMCID:
PMC9824230 DOI:
10.3390/s23010291]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/30/2022] [Revised: 12/19/2022] [Accepted: 12/22/2022] [Indexed: 06/17/2023]
Abstract
Nowadays, consumer electronics offer computer-vision-based (CV) measurements of dynamic displacements with some trade-offs between sampling frequency, resolution and low cost of the device. This study considers a consumer-grade smartphone camera based on complementary metal-oxide semiconductor (CMOS) technology and investigates the influence of its hardware limitations on the estimation of dynamic displacements, modal parameters and stiffness parameters of bolted connections in a laboratory structure. An algorithm that maximizes the zero-normalized cross-correlation function is employed to extract the dynamic displacements. The modal parameters are identified with the stochastic subspace identification method. The stiffness parameters are identified using a model-updating technique based on modal sensitivities. The results are compared with the corresponding data obtained with accelerometers and a laser distance sensor. The CV measurement allows lower-order vibration modes to be identified with a systematic (bias) error that is nearly proportional to the vibration frequency: from 2% for the first mode (9.4 Hz) to 10% for the third mode (71.4 Hz). However, the measurement errors introduced by the smartphone camera have a significantly lower influence on the values of the identified stiffness parameters than the numbers of modes and parameters taken into account. This is due to the bias-variance trade-off. The results show that consumer-grade electronics can be used as a low-cost and easy-to-use measurement tool if lower-order modes are required.
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