Semi-Supervised Defect Detection Method with Data-Expanding Strategy for PCB Quality Inspection

Local and Global Context-Enhanced Lightweight CenterNet for PCB Surface Defect Detection

Printed circuit board (PCB) surface defect detection is an essential part of the PCB manufacturing process. Currently, advanced CCD or CMOS sensors can capture high-resolution PCB images. However, the existing computer vision approaches for PCB surface defect detection require high computing effort, leading to insufficient efficiency. To this end, this article proposes a local and global context-enhanced lightweight CenterNet (LGCL-CenterNet) to detect PCB surface defects in real time. Specifically, we propose a two-branch lightweight vision transformer module with local and global attention, named LGT, as a complement to extract high-dimension features and leverage context-aware local enhancement after the backbone network. In the local branch, we utilize coordinate attention to aggregate more powerful features of PCB defects with different shapes. In the global branch, Bi-Level Routing Attention with pooling is used to capture long-distance pixel interactions with limited computational cost. Furthermore, a Path Aggregation Network (PANet) feature fusion structure is incorporated to mitigate the loss of shallow features caused by the increase in model depth. Then, we design a lightweight prediction head by using depthwise separable convolutions, which further compresses the computational complexity and parameters while maintaining the detection capability of the model. In the experiment, the LGCL-CenterNet increased the mAP@0.5 by 2% and 1.4%, respectively, in comparison to CenterNet-ResNet18 and YOLOv8s. Meanwhile, our approach requires fewer model parameters (0.542M) than existing techniques. The results show that the proposed method improves both detection accuracy and inference speed and indicate that the LGCL-CenterNet has better real-time performance and robustness.

Detection of surface defect on flexible printed circuit via guided box improvement in GA-Faster-RCNN network

Industrial defect detection is a critical aspect of production. Traditional industrial inspection algorithms often face challenges with low detection accuracy. In recent years, the adoption of deep learning algorithms, particularly Convolutional Neural Networks (CNNs), has shown remarkable success in the field of computer vision. Our research primarily focused on developing a defect detection algorithm for the surface of Flexible Printed Circuit (FPC) boards. To address the challenges of detecting small objects and objects with extreme aspect ratios in FPC defect detection for surface, we proposed a guided box improvement approach based on the GA-Faster-RCNN network. This approach involves refining bounding box predictions to enhance the precision and efficiency of defect detection in Faster-RCNN network. Through experiments, we verified that our designed GA-Faster-RCNN network achieved an impressive accuracy rate of 91.1%, representing an 8.5% improvement in detection accuracy compared to the baseline model.