|
1
|
Zhuang S, Yang W, Cheng X, Kevin JS, Liu C, Zhang G, Zhu W, Tian C. Analysis of Return-to-Zero Error after the First Load of Load Cell. SENSORS (BASEL, SWITZERLAND) 2023; 23:8712. [PMID: 37960412 PMCID: PMC10649393 DOI: 10.3390/s23218712] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/13/2023] [Revised: 10/20/2023] [Accepted: 10/23/2023] [Indexed: 11/15/2023]
Abstract
The return-to-zero error of the resistance strain load cell is most obvious in the first zero-return process during loading and unloading. To improve the accuracy of the load cell, it is necessary to figure out the cause of the error. The influence of the temperature, material, and weld cup were analyzed in this paper. It was concluded that the hysteresis is the main factor affecting the return-to-zero error after the first load. The relationship between hysteresis and zero-return error after first load was obtained by a data fitting algorithm. A method to improve the return-to-zero error after the first load was proposed.
Collapse
Affiliation(s)
- Shudong Zhuang
- College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China; (S.Z.); (X.C.); (G.Z.); (W.Z.); (C.T.)
| | - Wen Yang
- College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China; (S.Z.); (X.C.); (G.Z.); (W.Z.); (C.T.)
| | - Xianming Cheng
- College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China; (S.Z.); (X.C.); (G.Z.); (W.Z.); (C.T.)
- College of Materials Science and Engineering, Hohai University, Changzhou 213022, China
| | - Jenny Sama Kevin
- College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China; (S.Z.); (X.C.); (G.Z.); (W.Z.); (C.T.)
| | - Chang Liu
- Department of Physics, California San Diego University, San Diego, CA 92127, USA;
| | - Guangjie Zhang
- College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China; (S.Z.); (X.C.); (G.Z.); (W.Z.); (C.T.)
| | - Wenbin Zhu
- College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China; (S.Z.); (X.C.); (G.Z.); (W.Z.); (C.T.)
| | - Chengdong Tian
- College of Mechanical and Electrical Engineering, Hohai University, Changzhou 213022, China; (S.Z.); (X.C.); (G.Z.); (W.Z.); (C.T.)
| |
Collapse
|
|
2
|
Wang X, Zheng N, Wei F, Zhou Y, Yang H. Stability Compensation Design and Analysis of a Piezoelectric Ceramic Driver with an Emitter Follower Stage. MICROMACHINES 2023; 14:mi14050914. [PMID: 37241538 DOI: 10.3390/mi14050914] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/25/2023] [Revised: 04/17/2023] [Accepted: 04/21/2023] [Indexed: 05/28/2023]
Abstract
Piezoelectric ceramic has been widely applied in many fields because of its characteristics, and the performance of piezoelectric ceramic is determined strongly by its driver. In this study, an approach to analyzing the stability of a piezoelectric ceramic driver with an emitter follower stage was presented, and a compensation was proposed. First of all, using the method of modified nodal analysis and loop gain analysis, the transfer function for the feedback network was analytically deduced, and the cause of the instability of the driver was found to be the pole composed of the effective capacitance from the piezoelectric ceramic and the transconductance from the emitter follower. Then, a compensation involving a novel delta topology composed of an isolation resistor and a second feedback path was proposed, and its function principle was discussed. Simulations showed a correspondence between the analysis and the effectiveness of the compensation. Finally, an experiment was set up with two prototypes, one with compensation, and the other without compensation. Measurements showed the elimination of oscillation in the compensated driver.
Collapse
Affiliation(s)
- Xueliang Wang
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
- University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Gopptix Technology Co., Ltd., Beijing 100176, China
| | - Nan Zheng
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
- University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Gopptix Technology Co., Ltd., Beijing 100176, China
| | - Fenglong Wei
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
- University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Gopptix Technology Co., Ltd., Beijing 100176, China
| | - Yue Zhou
- Beijing Gopptix Technology Co., Ltd., Beijing 100176, China
| | - Huaijiang Yang
- Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
- University of Chinese Academy of Sciences, Beijing 100049, China
- Beijing Gopptix Technology Co., Ltd., Beijing 100176, China
| |
Collapse
|