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For: Shu Y, Mukherjee S, Chang T, Gilmore A, Tringe JW, Stobbe DM, Loh KJ. Multi-Defect Detection in Additively Manufactured Lattice Structures Using 3D Electrical Resistance Tomography. Sensors (Basel) 2022;22:9167. [PMID: 36501867 PMCID: PMC9736320 DOI: 10.3390/s22239167] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/10/2022] [Revised: 11/19/2022] [Accepted: 11/22/2022] [Indexed: 06/17/2023]
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1
Mukherjee S, Benavidez E, Crumb M, Calta NP. An Electrical Resistance Diagnostic for Conductivity Monitoring in Laser Powder Bed Fusion. SENSORS (BASEL, SWITZERLAND) 2024;24:523. [PMID: 38257616 PMCID: PMC10819052 DOI: 10.3390/s24020523] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/18/2023] [Revised: 01/10/2024] [Accepted: 01/10/2024] [Indexed: 01/24/2024]
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