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For: Park S, Lee K, Park J, Shin Y. Deep Learning-Based Defect Detection for Sustainable Smart Manufacturing. Sustainability 2022;14:2697. [DOI: 10.3390/su14052697] [Citation(s) in RCA: 2] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/06/2023]
Number Cited by Other Article(s)
1
Sundaram S, Zeid A. Artificial Intelligence-Based Smart Quality Inspection for Manufacturing. MICROMACHINES 2023;14:570. [PMID: 36984977 PMCID: PMC10058274 DOI: 10.3390/mi14030570] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/20/2023] [Revised: 02/18/2023] [Accepted: 02/24/2023] [Indexed: 06/18/2023]
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