Synthesis of embedded Au nanostructures by ion irradiation: influence of ion induced viscous flow and sputtering

Unusual ferromagnetic behaviour of embedded non-functionalized Au nanoparticles in Bi/Au bilayer films

Observation of ferromagnetic behavior of non-functionalized gold nanoparticles in contrast to the diamagnetic nature of bulk gold synthesized by single step Au ion irradiation.

Noble metal nanoparticles embedding into polymeric materials: From fundamentals to applications

This review covers some key concepts related to embedding of the noble metal nanoparticles in polymer surfaces. The metal nanoparticles embedded into the polymer matrix can provide high-performance novel materials that find applications in modern nanotechnology. In particular, the origin of various processes that drive the embedding phenomenon, growth of the nanostructure at the surface, factors affecting the embedding including role of surface, interface energies and thermodynamic driving forces with emphasis on the fundamental and technological applications, under different conditions (annealing and ion beams) have been discussed. In addition to the conventional thermal process for embedding which includes the measure of fundamental polymer surface properties with relevant probing techniques, this review discusses the recent advances carried out in the understanding of embedding phenomenon starting from thin metal films to growth of the nanoparticles and embedded nanostructures using novel ion beam techniques.

Synthesis of Pt nanoparticles and their burrowing into Si due to synergistic effects of ion beam energy losses

We report the synthesis of Pt nanoparticles and their burrowing into silicon upon irradiation of a Pt-Si thin film with medium-energy neon ions at constant fluence (1.0 × 10(17) ions/cm(2)). Several values of medium-energy neon ions were chosen in order to vary the ratio of the electronic energy loss to the nuclear energy loss (S e/S n) from 1 to 10. The irradiated films were characterized using Rutherford backscattering spectroscopy (RBS), atomic force microscopy (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD) and high resolution transmission electron microscopy (HRTEM). A TEM image of a cross section of the film irradiated with S e/S n = 1 shows ≈5 nm Pt NPs were buried up to ≈240 nm into the silicon. No silicide phase was detected in the XRD pattern of the film irradiated at the highest value of S e/S n. The synergistic effect of the energy losses of the ion beam (molten zones are produced by S e, and sputtering and local defects are produced by S n) leading to the synthesis and burrowing of Pt NPs is evidenced. The Pt NP synthesis mechanism and their burrowing into the silicon is discussed in detail.