Invariance of molecular charge transport upon changes of extended molecule size and several related issues

Finite-Time Dynamics of an Entanglement Engine: Current, Fluctuations and Kinetic Uncertainty Relations

Entanglement engines are autonomous quantum thermal machines designed to generate entanglement from the presence of a particle current flowing through the device. In this work, we investigate the functioning of a two-qubit entanglement engine beyond the steady-state regime. Within a master equation approach, we derive the time-dependent state, the particle current, as well as the associated current correlation functions. Our findings establish a direct connection between coherence and internal current, elucidating the existence of a critical current that serves as an indicator for entanglement in the steady state. We then apply our results to investigate kinetic uncertainty relations (KURs) at finite times. We demonstrate that there is more than one possible definition for KURs at finite times. Although the two definitions agree in the steady-state regime, they lead to different parameter ranges for violating KUR at finite times.

A Green's Function Approach for Determining Surface Induced Broadening and Shifting of Molecular Energy Levels

Upon adsorption of a molecule onto a surface, the molecular energy levels (MELs) broaden and change their alignment. This phenomenon directly affects electron transfer across the interface and is, therefore, a fundamental observable that influences electrochemical device performance. Here, we propose a rigorous parameter-free framework, built upon the theoretical construct of Green's functions, for studying the interface between a molecule and a bulk surface and its effect on MELs. The method extends beyond the usual wide-band limit approximation, and its generality allows its use with any level of electronic structure theory. We demonstrate its ability to predict the broadening and shifting of MELs as a function of intramolecular coupling, molecule/surface coupling, and the surface density of states for a molecule with two MELs adsorbed on a one-dimensional model metal surface. The new approach could help provide guidelines for the design and experimental characterization of electrochemical devices with optimal electron transport.

Nonadiabatic Electron Dynamics in Tunneling Junctions: Lattice Exchange-Correlation Potential

The search for exchange-correlation functionals going beyond the adiabatic approximation has always been a challenging task for time-dependent density-functional theory. Starting from known results and using symmetry properties, we put forward a nonadiabatic exchange-correlation functional for lattice models describing a generic transport setup. We show that this functional reduces to known results for a single quantum dot connected to one or two reservoirs and furthermore yields the adiabatic local-density approximation in the static limit. Finally, we analyze the features of the exchange-correlation potential and the physics it describes in a linear chain connected to two reservoirs where the transport is induced by a bias voltage applied to the reservoirs. We find that the Coulomb blockade is correctly described for a half-filled chain, while additional effects arise as the doping of the chain changes.

Transient Charge and Energy Flow in the Wide-Band Limit

The wide-band limit is a commonly used approximation to analyze transport through nanoscale devices. In this work we investigate its applicability to the study of charge and heat transport through molecular break junctions exposed to voltage biases and temperature gradients. We find by comparative simulations that while the wide-band-limit approximation faithfully describes the long-time charge and heat transport, it fails to characterize the short-time behavior of the junction. In particular, we show that the charge current flowing through the device shows a discontinuity when a temperature gradient is applied, while the energy flow is discontinuous when a voltage bias is switched on and even diverges when the junction is exposed to both a temperature gradient and a voltage bias. We provide an explanation for this pathological behavior and propose two possible solutions to this problem.