Cao S, Achlan M, Bryche JF, Gogol P, Dujardin G, Raşeev G, Le Moal E, Boer-Duchemin E. An electrically induced probe of the modes of a plasmonic multilayer stack.
OPTICS EXPRESS 2019;
27:33011-33026. [PMID:
31878376 DOI:
10.1364/oe.27.033011]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/27/2019] [Accepted: 10/22/2019] [Indexed: 06/10/2023]
Abstract
A new single-image acquisition technique for the determination of the dispersion relation of the propagating modes of a plasmonic multilayer stack is introduced. This technique is based on an electrically-driven, spectrally broad excitation source which is nanoscale in size: the inelastic electron tunnel current between the tip of a scanning tunneling microscope (STM) and the sample. The resulting light from the excited modes of the system is collected in transmission using a microscope objective. The energy-momentum dispersion relation of the excited optical modes is then determined from the angle-resolved optical spectrum of the collected light. Experimental and theoretical results are obtained for metal-insulator-metal (MIM) stacks consisting of a silicon oxide layer (70, 190 or 310 nm thick) between two gold films (each with a thickness of 30 nm). The broadband characterization of hybrid plasmonic-photonic transverse magnetic (TM) modes involved in an avoided crossing is demonstrated and the advantages of this new technique over optical reflectivity measurements are evaluated.
Collapse