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For: Ballard JB, Dick DD, McDonnell SJ, Bischof M, Fu J, Owen JHG, Owen WR, Alexander JD, Jaeger DL, Namboodiri P, Fuchs E, Chabal YJ, Wallace RM, Reidy R, Silver RM, Randall JN, Von Ehr J. Atomically Traceable Nanostructure Fabrication. J Vis Exp 2015:e52900. [PMID: 26274555 DOI: 10.3791/52900] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/31/2022] Open

For:	Ballard JB, Dick DD, McDonnell SJ, Bischof M, Fu J, Owen JHG, Owen WR, Alexander JD, Jaeger DL, Namboodiri P, Fuchs E, Chabal YJ, Wallace RM, Reidy R, Silver RM, Randall JN, Von Ehr J. Atomically Traceable Nanostructure Fabrication. J Vis Exp 2015:e52900. [PMID: 26274555 DOI: 10.3791/52900] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/31/2022] Open

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(The first 100,000 artilces are displayed in RCA.)