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For: Bennett HS. Will Future Measurement Needs of the Semiconductor Industry Be Met? J Res Natl Inst Stand Technol 2007;112:25-38. [PMID: 27110452 PMCID: PMC4654602 DOI: 10.6028/jres.112.002] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Accepted: 12/22/2006] [Indexed: 06/01/2023]
Number Cited by Other Article(s)
1
Ochoa MA, Maslar JE, Bennett HS. Extracting electron densities in n-type GaAs from Raman spectra: Comparisons with Hall measurements. JOURNAL OF APPLIED PHYSICS 2020;128:10.1063/5.0011247. [PMID: 34131350 PMCID: PMC8201599 DOI: 10.1063/5.0011247] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/20/2020] [Accepted: 08/04/2020] [Indexed: 05/29/2023]
2
Garlapati SK, Divya M, Breitung B, Kruk R, Hahn H, Dasgupta S. Printed Electronics Based on Inorganic Semiconductors: From Processes and Materials to Devices. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018;30:e1707600. [PMID: 29952112 DOI: 10.1002/adma.201707600] [Citation(s) in RCA: 28] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/29/2017] [Revised: 03/20/2018] [Indexed: 06/08/2023]
3
Environmental challenges in nanoelectronics manufacturing. Curr Opin Chem Eng 2012. [DOI: 10.1016/j.coche.2012.03.004] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
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