1
|
Xin Y, Xing CK, Zhou HD, Liu J. Defects in Pyrochlore Dy2Ti2O7 Thin Film. Microsc Microanal 2023; 29:1665-1666. [PMID: 37613911 DOI: 10.1093/micmic/ozad067.857] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
Affiliation(s)
- Yan Xin
- National High magnetic Field Laboratory, Florida State University, Tallahassee, Florida, USA
| | - C K Xing
- Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee, USA
| | - H D Zhou
- Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee, USA
| | - J Liu
- Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee, USA
| |
Collapse
|