Iridium thin-film coatings for the BabyIAXO hybrid X-ray optic

Reflective coatings are an essential feature of X-ray telescopes. Their overall performance relies heavily on substrate compatibility and how well they conform to the optics assembly processes. We use X-ray reflectometry (XRR) to demonstrate the compatibility of shaping flat substrates coated with iridium, and show that specular and nonspecular reflectance before and after shaping is on par with traditional hot-slumped coated substrates. From 1.487 and 8.048keV measurements, we find that the substrates have rms roughness of 0.38nm and magnetron sputtered iridium deposits with rms surface roughness of 0.27-0.35nm. A hydrocarbon overlayer from atmospheric contamination is present with a thickness of 1.4-1.6nm and a density of 1.2-1.6g/cm³. Both the traditional hot slumped and the flat substrates undergoing post-coating shaping have a similar characteristic surface morphology and are equally well-suited for use with X-ray optics. Finally, we demonstrate by simulation the improved effective area achieved by using a low-Z overlayer, and illustrate the performance of a hybrid optic coated with optimized bilayers for a Primakoff axion spectrum emitted by the sun.

Investigation of boron carbide and iridium thin films, an enabling technology for future x-ray telescopes

We present an experimental examination of iridium and boron carbide thin-film coatings for the purpose of fabricating x-ray optics. We use a combination of x-ray reflectometry and x-ray photoelectron spectroscopy to model the structure, composition, density, thickness, and micro-roughness of the thin films. We demonstrate in our analyses how the two characterization techniques are complementary, and from this we derive that an overlayer originating from atmospheric contamination with a thickness between 1.0-1.6 nm is present on the surface. The magnetron sputtered iridium films are measured to have a density of 22.4g/cm³. The boron carbide film exhibits a change in chemical composition in the top ∼2nm of the film surface when exposed to the ambient atmosphere. The chemical reaction occurring on the surface is due to an incorporation of oxygen and hydrogen present in the ambient atmosphere. Lastly, we present a correlation between the absorption edges and the emission lines exhibited by the thin films in an energy range from 50-800 eV and the impact on the reflectivity performance due to contamination in thin films.

Extended hard-X-ray emission in the inner few parsecs of the Galaxy

The Galactic Centre hosts a puzzling stellar population in its inner few parsecs, with a high abundance of surprisingly young, relatively massive stars bound within the deep potential well of the central supermassive black hole, Sagittarius A* (ref. 1). Previous studies suggest that the population of objects emitting soft X-rays (less than 10 kiloelectronvolts) within the surrounding hundreds of parsecs, as well as the population responsible for unresolved X-ray emission extending along the Galactic plane, is dominated by accreting white dwarf systems. Observations of diffuse hard-X-ray (more than 10 kiloelectronvolts) emission in the inner 10 parsecs, however, have been hampered by the limited spatial resolution of previous instruments. Here we report the presence of a distinct hard-X-ray component within the central 4 × 8 parsecs, as revealed by subarcminute-resolution images in the 20-40 kiloelectronvolt range. This emission is more sharply peaked towards the Galactic Centre than is the surface brightness of the soft-X-ray population. This could indicate a significantly more massive population of accreting white dwarfs, large populations of low-mass X-ray binaries or millisecond pulsars, or particle outflows interacting with the surrounding radiation field, dense molecular material or magnetic fields. However, all these interpretations pose significant challenges to our understanding of stellar evolution, binary formation, and cosmic-ray production in the Galactic Centre.

Galaxy evolution. Black hole feedback in the luminous quasar PDS 456

The evolution of galaxies is connected to the growth of supermassive black holes in their centers. During the quasar phase, a huge luminosity is released as matter falls onto the black hole, and radiation-driven winds can transfer most of this energy back to the host galaxy. Over five different epochs, we detected the signatures of a nearly spherical stream of highly ionized gas in the broadband x-ray spectra of the luminous quasar PDS 456. This persistent wind is expelled at relativistic speeds from the inner accretion disk, and its wide aperture suggests an effective coupling with the ambient gas. The outflow's kinetic power larger than 10(46) ergs per second is enough to provide the feedback required by models of black hole and host galaxy coevolution.

Demonstration of multilayer reflective optics at photon energies above 0.6 MeV

Focusing optics operating in the soft gamma-ray photon energy range can advance a range of scientific and technological applications that benefit from the large improvements in sensitivity and resolution that true imaging provides. An enabling technology to this end is multilayer coatings. We show that very short period multilayer coatings deposited on super-polished substrates operate efficiently above 0.6 MeV. These experiments demonstrate that Bragg scattering theory established for multilayer applications as low as 1 eV continues to work well into the gamma-ray band.

Asymmetries in core-collapse supernovae from maps of radioactive 44Ti in Cassiopeia A

Asymmetry is required by most numerical simulations of stellar core-collapse explosions, but the form it takes differs significantly among models. The spatial distribution of radioactive (44)Ti, synthesized in an exploding star near the boundary between material falling back onto the collapsing core and that ejected into the surrounding medium, directly probes the explosion asymmetries. Cassiopeia A is a young, nearby, core-collapse remnant from which (44)Ti emission has previously been detected but not imaged. Asymmetries in the explosion have been indirectly inferred from a high ratio of observed (44)Ti emission to estimated (56)Ni emission, from optical light echoes, and from jet-like features seen in the X-ray and optical ejecta. Here we report spatial maps and spectral properties of the (44)Ti in Cassiopeia A. This may explain the unexpected lack of correlation between the (44)Ti and iron X-ray emission, the latter being visible only in shock-heated material. The observed spatial distribution rules out symmetric explosions even with a high level of convective mixing, as well as highly asymmetric bipolar explosions resulting from a fast-rotating progenitor. Instead, these observations provide strong evidence for the development of low-mode convective instabilities in core-collapse supernovae.

Physics of reflective optics for the soft gamma-ray photon energy range

Traditional multilayer reflective optics that have been used in the past for imaging at x-ray photon energies as high as 200 keV are governed by classical wave phenomena. However, their behavior at higher energies is unknown, because of the increasing effect of incoherent scattering and the disagreement between experimental and theoretical optical properties of materials in the hard x-ray and gamma-ray regimes. Here, we demonstrate that multilayer reflective optics can operate efficiently and according to classical wave physics up to photon energies of at least 384 keV. We also use particle transport simulations to quantitatively determine that incoherent scattering takes place in the mirrors but it does not affect the performance at the Bragg angles of operation. Our results open up new possibilities of reflective optical designs in a spectral range where only diffractive optics (crystals and lenses) and crystal monochromators have been available until now.

A rapidly spinning supermassive black hole at the centre of NGC 1365

Broad X-ray emission lines from neutral and partially ionized iron observed in active galaxies have been interpreted as fluorescence produced by the reflection of hard X-rays off the inner edge of an accretion disk. In this model, line broadening and distortion result from rapid rotation and relativistic effects near the black hole, the line shape being sensitive to its spin. Alternative models in which the distortions result from absorption by intervening structures provide an equally good description of the data, and there has been no general agreement on which is correct. Recent claims that the black hole (2 × 10(6) solar masses) at the centre of the galaxy NGC 1365 is rotating at close to its maximum possible speed rest on the assumption of relativistic reflection. Here we report X-ray observations of NGC 1365 that reveal the relativistic disk features through broadened Fe-line emission and an associated Compton scattering excess of 10-30 kiloelectronvolts. Using temporal and spectral analyses, we disentangle continuum changes due to time-variable absorption from reflection, which we find arises from a region within 2.5 gravitational radii of the rapidly spinning black hole. Absorption-dominated models that do not include relativistic disk reflection can be ruled out both statistically and on physical grounds.

W/SiC x-ray multilayers optimized for use above 100 keV

We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard x-ray reflective coatings operating in the energy range 100-200 keV. Grazing-incidence x-ray reflectance at E = 8 keV was used to characterize the interface widths, as well as the temporal and thermal stability in both periodic and depth-graded W/SiC structures, whereas synchrotron radiation was used to measure the hard x-ray reflectance of a depth-graded multilayer designed specifically for use in the range E approximately 150-170 keV. We have modeled the hard x-ray reflectance using newly derived optical constants, which we determined from reflectance versus incidence angle measurements also made using synchrotron radiation, in the range E = 120-180 keV. We describe our experimental investigation in detail compare the new W/SiC multilayers with both W/Si and W/B4C films that have been studied previously, and discuss the significance of these results with regard to the eventual development of a hard x-ray nuclear line telescope.

Thermal forming of glass microsheets for x-ray telescope mirror segments

We describe a technology to mass-produce ultrathin mirror substrates for x-ray telescopes of near Wolter-I geometry. Thermal glass forming is a low-cost method to produce high-throughput, spaceborne x-ray mirrors for the 0.1-200-keV energy band. These substrates can provide the collecting area envisioned for future x-ray observatories. The glass microsheets are shaped into mirror segments at high temperature by use of a guiding mandrel, without polishing. We determine the physical properties and mechanisms that elucidate the formation process and that are crucial to improve surface quality. We develop a viscodynamic model for the glass strain as the forming proceeds to find the conditions for repeatability. Thermal forming preserves the x-ray reflectance and scattering properties of the raw glass. The imaging resolution is driven by a large wavelength figure. We discuss the sources of figure errors, and we calculate the relaxation time of surface ripples.

Optimization of graded multilayer designs for astronomical X-ray telescopes

We developed a systematic method for optimizing the design of depth-graded multilayers for astronomical hard-x-ray and soft-gamma-ray telescopes based on the instrument's bandpass and the field of view. We apply these methods to the design of the conical-approximation Wolter I optics employed by the balloon-borne High Energy Focusing Telescope, using W/Si as the multilayer materials. In addition, we present optimized performance calculations of mirrors, using other material pairs that are capable of extending performance to photon energies above the W K-absorption edge (69.5 keV), including Pt/C, Ni/C, Cu/Si, and Mo/Si.

Design of grazing-incidence multilayer supermirrors for hard-x-ray reflectors

Extremely broadband grazing-incidence multilayers for hard-x-ray reflection can be obtained by a gradual change of the layer thicknesses down through the structure. Existing approaches for designing similar neutron optics, called supermirrors, are shown to provide respectable performance when applied to x-ray multilayers. However, none of these approaches consider the effects of imperfect layer interfaces and absorption in the overlying layers. Adaptations of neutron designs that take these effects into account are presented, and a thorough analysis of two specific applications (a single hard-x-ray reflector and a hard-x-ray telescope) shows that an improved performance can be obtained. A multilayer whose bilayer thicknesses are given by a power law expression is found to provide the best solution; however, it is only slightly better than some of the adapted neutron designs.

Electron micrography and x-ray study of dip-lacquered LiF (220)

It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured approximately 10-A rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to approximately 60 A measured on the bare LiF(220) crystal surface.

Characterization of a Multilayer Coated Laminar Reflection Grating at λ = 0.154 nm

A laminar grating of 1200 1/mm was coated with an x-ray reflecting multilayer coating. The multilayer coating consisted of 41 alternating layers of ReW and C having a period of 2.3 nm. In this paper we report on diffraction measurements of the coated grating at the CuKα emission line. We describe its reflection behavior using a simple theoretical model and derive two diffraction conditions, corresponding to the grating relation and the Bragg law, for which peak intensities are to be observed. We find that grating order efficiencies are modulated by the multilayer reflection.

X-Ray Study of State-of-the-Art Small (d-Spacing W/B4C Multilayers

Two small d-spacing W/B4C multilayers have been studied at three different x-ray energies CuKα1, AlKα, and FeLα. Measurements of total reflection, specular and mosaic Bragg reflection, and high resolution studies were made at Cu Kα1. Multilayer parameters are deduced from the data and the perfection of the multilayer structure is evaluated by Comparison with model Calculations.

Studies of multilayers and thin-foil x-ray mirrors using a soft x-ray diffractometer

A versatile x-ray diffractometer is described in detail. Two applications to the study of x-ray optical elements are presented. The first is a Bragg reflection study of state-of-the-art multilayers deposited both on conventional Si-wafer substrates and on superpolished substrates such as fused quartz and electroless nickel. These data are compared to data previously obtained at FeKα. The second study is a reflectivity and scattering study of various thin-foil x-ray reflectors proposed for up-coming x-ray satellite missions. All the data have been obtained at MgKα = 1.2536 keV.

Extreme UV and x-ray scattering measurements from a rough LiF crystal surface characterized by electron micrography

XUV and x-ray scattering by a LiF crystal is measured. The angular distribution of the scattered radiation (ADSR) reveals characteristic features, side peaks or asymmetry. The surface of the sample is statistically characterized by a microdensitometer analysis of electron micrographs resolving the short spatial wavelengths of the surface roughness. This analysis shows that the surface has a large microroughness with an autocovariance function which is Gaussian in its initial portion. The first-order perturbation vector theory of the roughness-induced scattering leads to an interpretation of the ADSR features in terms of the modulation of the surface power spectral density function associated with the microroughness by an optical factor. The possibility of obtaining short scale roughness characterization from XUV or x-ray measurements is discussed.

Surface correlation function analysis of high resolution scattering data from mirrored surfaces obtained using a triple-axis x-ray diffractometer

Within various x-ray programs there exists a need for a detailed investigation of the surface roughness of mirrored surfaces over a wide spatial wavelength bandwidth, ranging from large scale figure error to micro roughness. A number of methods exist to measure the surface roughness. Common to all methods is that they are bandwidth-limited. A crucial point in the analysis of data is, therefore, to specify accurately the wavelength bandwidth limitation and to determine the surface autocorrelation function within this bandwidth. We present a number of scattering measurements obtained using a triple-axis perfect-crystal x-ray diffractometer and the results of an autocorrelation function analysis. Furthermore, we present some measurements of integrated reflectivity, which we believe provide evidence for microroughness in the range from a few angstroms to tens of microns.

Measurements of mosaicity and perfection of crystallites in commercially available crystals using a 4-axis perfect-crystal x-ray diffractometer

Measurements of mosaicity and the intrinsic scattering from individual crystallites of commercially available crystals are presented. The set of crystals investigated has been proposed to be used as the energy dispersive element in a high resolution Bragg spectrometer for x-ray astronomy. The measurements reveal a high degree of perfection of the crystallites, even in the presence of considerable mosaicity. This is encouraging with relation to an eventual use of the crystals in a high resolution Bragg spectrometer for x-ray astronomy. The measurements were performed using a novel four-crystal x-ray diffractometer. The resolution properties of this diffractometer are discussed in detail and compared with more conventional three-crystal and twocrystal x-ray diffractometers.