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1
Experimental evidence of the photonic bandgap and defect effect in Si-SiO2multilayer structures. CRYSTAL RESEARCH AND TECHNOLOGY 2014. [DOI: 10.1002/crat.201400171] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
2
Observation by infrared transmission spectroscopy and infrared ellipsometry of a new hydrogen bond during light-soaking of a-Si:H. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/13642819508239090] [Citation(s) in RCA: 25] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
3
Studies by photothermal deflection spectroscopy of defect formation in a-Si:H. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/01418639108224435] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
4
Hydrogen-effusion-induced structural changes and defects in a-Si:H films: Dependence upon the film microstructure. PHYSICAL REVIEW. B, CONDENSED MATTER 1996;53:3804-3812. [PMID: 9983930 DOI: 10.1103/physrevb.53.3804] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
5
Systematic study of light-induced effects in hydrogenated amorphous silicon. PHYSICAL REVIEW. B, CONDENSED MATTER 1992;45:13314-13322. [PMID: 10001413 DOI: 10.1103/physrevb.45.13314] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
6
Transient solid-phase crystallization study of chemically vapor-deposited amorphous silicon films by in situ x-ray diffraction. PHYSICAL REVIEW. B, CONDENSED MATTER 1989;40:7655-7662. [PMID: 9991191 DOI: 10.1103/physrevb.40.7655] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
7
Light-induced defect creation in hydrogenated amorphous silicon: A detailed examination using junction-capacitance methods. PHYSICAL REVIEW. B, CONDENSED MATTER 1987;35:7776-7779. [PMID: 9941103 DOI: 10.1103/physrevb.35.7776] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
8
Solid-phase crystallization kinetics in doped a-Si chemical-vapor-deposition films. PHYSICAL REVIEW. B, CONDENSED MATTER 1985;31:3568-3575. [PMID: 9936248 DOI: 10.1103/physrevb.31.3568] [Citation(s) in RCA: 25] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
9
STRUCTURAL AND ELECTRONIC PROPERTIES OF CVD SILICON FILMS NEAR THE CRYSTALLIZATION TEMPERATURE. ACTA ACUST UNITED AC 1982. [DOI: 10.1051/jphyscol:1982137] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]
10
Détermination de la taille et de la concentration de cristallites dans une couche amorphe par mesure de conductivité. ACTA ACUST UNITED AC 1977. [DOI: 10.1051/rphysap:01977001205072100] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]
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