Venkatesan R, Velumani S, Ordon K, Makowska-Janusik M, Corbel G, Kassiba A. Structural and morphological data of RF-Sputtered BiVO
4 thin films.
Data Brief 2018;
17:526-528. [PMID:
29876424 PMCID:
PMC5988375 DOI:
10.1016/j.dib.2018.01.070]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/06/2017] [Revised: 12/27/2017] [Accepted: 01/22/2018] [Indexed: 11/16/2022] Open
Abstract
Structural and morphological modulation of rf-sputtered BiVO4 thin films deposited using mechanochemical synthesis prepared BiVO4 nano-powders as sintered target are included in this data article. The crystalline nature of as-prepared films, namely amorphous and crystalline was acquired with time and temperature dependent in-situ high temperature X-ray diffraction (HT-XRD), at a time interval of 1 h. Typical Fourier transform infrared (FT-IR) spectra of annealed thin film of monoclinic BiVO4 structure is given. Furthermore, correlation between morphologies of various substrate temperature fabricated BiVO4 thin films are presented.
Collapse