Model-based deconvolution for particle analysis applied to a through-focus series of HAADF-STEM images

This paper presents an approach for determining the sizes and three-dimensional (3D) positions of nanoparticles from a through-focus series of high-angle annular dark-field scanning transmission electron microscopy images. By assuming spherical particles with uniform density, the sizes and 3D positions can be derived via Wiener deconvolution using a series of kernels prepared by the convolution of the 3D point spread function of the electron beam and the 3D density distribution of spheres with different radii. This process is referred to as a model-based deconvolution. Four 3D datasets with a volume size of 148 × 148 × 560 nm3 were obtained from the four sets of 256 high-angle annular dark-field scanning transmission electron microscopy images of 256 × 256 pixels taken from the same field of view under the through-focus condition. The 3D positions and radii of 14 particles in each 3D dataset were derived using the model-based deconvolution for ∼8 min. The observation errors of the 3D position were estimated as σx ≅ σy ≅ 0.3 nm and σz < 1.6 nm.

A practical method for determining film thickness using X-ray absorption spectroscopy in total electron yield mode

Thin films formed on surfaces have a large impact on the properties of materials and devices. In this study, a method is proposed using X-ray absorption spectroscopy to derive the film thickness of a thin film formed on a substrate using the spectral separation and logarithmic equation, which is a modified version of the formula used in electron spectroscopy. In the equation, the decay length in X-ray absorption spectroscopy is longer than in electron spectroscopy due to a cascade of inelastic scattering of electrons generated in a solid. The modification factor, representing a multiple of the decay length, was experimentally determined using oxidized Si and Cu with films of thickness 19 nm and 39 nm, respectively. The validity of the proposed method was verified, and the results indicated that the method can be used in the analysis of various materials with thin films.

Electrochemical CO2 reduction over nanoparticles derived from an oxidized Cu-Ni intermetallic alloy

Oxide-derived Cu-Ni (3-32 at%-Ni) alloy nanoparticles with a size of 10 nm enhance selectivity for ethylene and ethanol formation over oxide-derived Cu nanoparticles by electrochemical CO2 reduction. X-ray absorption spectroscopy measurements suggest that Ni (generally recognized as an element to avoid) is in a mixed phase of oxidized and metallic states.

Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimen

Inelastic mean free path (IMFP) was determined by electron energy loss spectroscopy (EELS) to estimate the accurate thickness of TEM thin foil using needle-shaped specimen. From EELS measurements performed for 99.99% Al, Si wafer and 99.99% Fe, linear relationships were confirmed between the thickness of the TEM thin foil and the ratio of the total intensity of EELS spectrum to the total intensity of zero-loss spectrum for all samples. By weighted least-square fitting, the IMFP was estimated to be 143-150 nm for Al, 159-165 nm for Si with amorphous layer, and 92-94 nm for Fe with the collection semi-angle β = 11.9 - 35.7 mrad, and accelerated voltage of 200 kV. Thus, the dependence of IMFP on β is not dominant. The accuracy depends on the roundness of the cross-section of the needle-shaped specimen, and is observed to be low in terms of percentage in this work.

Solute clustering and supersaturated solid solution of AlSi10Mg alloy fabricated by selective laser melting

α-Al grains surrounded by Al-Si eutectic as the substructures in AlSi10Mg alloy fabricated by selective laser melting (SLM) were investigated in detail using three-dimensional atom-probe and transmission electron microscopy. Quantitative analysis of α-Al revealed (1) the formation of Mg clusters and Mg-Si co-clusters with a density in the order of 10²³ /m³ in α-Al of the as-built state caused by the complicated thermal history, and (2) a supersaturated Si content that significantly exceeded the maximum solubility due to rapid solidification, during the SLM process.