Fluorocarbon Plasma-Polymerized Layer Increases the Release Time of Silver Ions and the Antibacterial Activity of Silver-Based Coatings

Silver-based antibacterial coatings limit the spread of hospital-acquired infections. Indeed, the use of silver and silver oxide nanoparticles (Ag and AgO NPs) incorporated in amorphous hydrogenated carbon (a-C:H) as a matrix demonstrates a promising approach to reduce microbial contamination on environmental surfaces. However, its success as an antibacterial coating hinges on the control of Ag+ release. In this sense, if a continuous release is required, an additional barrier is needed to extend the release time of Ag+. Thus, this research investigated the use of a plasma fluoropolymer (CFx) as an additional top layer to elongate Ag+ release and increase the antibacterial activity due to its high hydrophobic nature. Herein, a porous CFx film was deposited on a-C:H containing Ag and AgO NPs using pulsed afterglow low pressure plasma polymerization. The chemical composition, surface wettability and morphology, release profile, and antibacterial activity were analyzed. Overall, the combination of a-C:H:Ag (12.1 at. % of Ag) and CFx film (120.0°, F/C = 0.8) successfully inactivated 88% of E. coli and delayed biofilm formation after 12 h. Thus, using a hybrid approach composed of Ag NPs and a hydrophobic polymeric layer, it was possible to increase the overall antibacterial activity of the coating.

Secondary ion mass spectrometry, a powerful tool for revealing ink formulations and animal skins in medieval manuscripts

Book production by medieval scriptoria have gained growing interest in recent studies. In this context, identifying ink compositions and parchment animal species from illuminated manuscripts is of great importance. Here, we introduce time-of-flight secondary ion mass spectrometry (ToF-SIMS) as a non-invasive tool to identify both inks and animal skins in manuscripts, at the same time. For this purpose, both positive and negative ion spectra in inked and non-inked areas were recorded. Chemical compositions of pigments (decoration) or black inks (text) were determined by searching for characteristic ion mass peaks. Animal skins were identified by data processing of raw ToF-SIMS spectra using principal component analysis (PCA). In illuminated manuscripts from the fifteenth to sixteenth century, malachite (green), azurite (blue), cinnabar (red) inorganic pigments, as well as iron-gall black ink, were identified. Carbon black and indigo (blue) organic pigments were also identified. Animal skins were identified in modern parchments of known animal species by a two-step PCA procedure. We believe the proposed method will find extensive application in material studies of medieval manuscripts, as it is non-invasive, highly sensitive and able to identify both inks and animal skins at the same time, even from traces of pigments and tiny scanned areas.

Probing the reaction mechanism between a laser welded polyamide thin film and titanium with XPS and ToF-SIMS

The biomedical industry uses more and more polymer/metal hybrid assemblies because of the ability to combine the advantages and lower the inconveniences of both materials. The key is to assemble them. Among the high variety of existing assembling techniques, laser welding appears as an excellent option. It is a quick process allowing a great design flexibility, high reproducibility without intermediate material needed to create the adhesion, which is advantageous for biomedical applications. The laser welding process creates strong adhesion between dissimilar materials, but the root cause for adhesion is still unclear. The analytical challenge is to gain an information at the molecular level from an interface that is deeply buried between the two materials. Such a study requires extremely surface sensitive analytical methods, such as ToF-SIMS or XPS in order to detect chemical bonds, but also a method to expose the interface to the X-ray or ion beam. In order to investigate the chemical bonding at the interface between polyamide-6.6 and titanium, mirror polished titanium surfaces were prepared, on which a thin polyamide-6.6 film was spin-coated. The samples were laser welded, and after dissolving the polymer thin film, XPS and ToF-SIMS measurement were performed. The ToF-SIMS data interpretation was assisted by a principal component analysis. This multivariate analysis is rather common for ToF-SIMS data but is more rarely used to solve adhesion problems. This allowed to show the nature of the chemical bond at the interface and to propose a reaction mechanism.

Binding Mechanisms Between Laser-Welded Polyamide-6.6 and Native Aluminum Oxide

Nowadays, hybrid polymer/metal assemblies experience a growing demand in the industry, especially for transports and biomedical purposes. Those assemblies offer many advantages, such as lightweight structures and corrosion resistance. The main difficulty to assemble them remains. In this sense, laser welding is more than a promising technique because of its rapidity, the absence of intermediate materials, and its high design freedom. Unfortunately, several fundamental aspects are not well understood yet, as the chemical bonding at the interface. For this work, common materials are studied: polyamide-6.6 and aluminum. A previous published work strongly suggests the formation of a C-O-Al bond at the interface, but this information needs to be confirmed and the reaction mechanism is still uncertain. To achieve this goal, two different model samples were prepared. The first ones are spin-coated layers of polyamide-6.6 on mirror polished aluminum; the other samples are made of a layer of N-methylformamide mimicking the reactive part of the polymer, dip-coated on aluminum. Both sample types were analyzed with XPS and ToF-SIMS and display similar results: C-O-Al bond formation at the interface is confirmed and a reaction mechanism is proposed.

Ion Implantation as an Approach for Structural Modifications and Functionalization of Ti3C2Tx MXenes

MXenes are a young family of two-dimensional transition metal carbides, nitrides, and carbonitrides with highly controllable structure, composition, and surface chemistry to adjust for target applications. Here, we demonstrate the modifications of two-dimensional MXenes by low-energy ion implantation, leading to the incorporation of Mn ions in Ti₃C₂T_x (where T_x is a surface termination) thin films. Damage and structural defects caused by the implantation process are characterized at different depths by XPS on Ti 2p core-level spectra, by ToF-SIMS, and with electron energy loss spectroscopy analyses. Results show that the ion-induced alteration of the damage tolerant Ti₃C₂T_x layer is due to defect formation at both Ti and C sites, thereby promoting the functionalization of these sites with oxygen groups. This work contributes to the inspiring approach of tailoring 2D MXene structure and properties through doping and defect formation by low-energy ion implantation to expand their practical applications.

ZnO/Carbon xerogel photocatalysts by low-pressure plasma treatment, the role of the carbon substrate and its plasma functionalization

ZnO is known to be photocatalytic, but with limited performances due to the strong electron-hole recombination after irradiation. The integration of ZnO nanomaterials on a conductive and high surface area carbon substrate is thus a potential alternative to obtain a significant improvement of the photocatalytic performance. Moreover, the carbon functionalization is expected to have a significant role in the adsorption/degradation mechanisms of dye, due to the difference in wettability or surface charge. In this view, ZnO photocatalytic nanoparticles have been deposited on high surface area carbon xerogel substrate (C_XG), using a new and original plasma process, consisting in the degradation of a solid organometallic directly on the carbon substrate (no gaseous precursor). In addition to the ZnO nanoparticle formation, the plasma treatment allows the carbon functionalization. The ZnO/C_XG composite has been tested for the degradation of Rhodamine B (RhB) in aqueous media and compared with and O₂ or NH₃ plasma-treated xerogels (without nanoparticles) to identify the significant role of the substrate and its modification in the RhB adsorption and degradation mechanism. The high photocatalytic activity of ZnO/C_XG composite is attributed to (i) the formation of small (8-10 nm) and well-crystallized ZnO nanoparticles anchored to the carbon substrate and (ii) to the modification of the xerogel surface chemistry. Indeed, O₂ plasma treatment of the C_XG promotes the generation of hydroxyl, carbonyl and carboxyl surface functional groups, which are polar and acidic, while the NH₃ plasma treatment mainly leads to the formation of polar and basic amino groups. While both plasma treatments promote the formation of polar functional groups, which enhance the C_XG wettability, the formation of acidic groups is identified as beneficial for the adsorption of the RhB dye, while basic groups are detrimental.

ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment

The advent of cluster ion beams has paved the way to the routine 3D analysis of organic heterojunctions. Alternatively, organic thin layers have also been successfully depth profiled with a low-energy cesium ion beam (Cs⁺), to exploit the high chemical reactivity of cesium atoms, acting as free-radical scavengers. Despite of this, little is known about the depth resolution associated with low-energy Cs⁺ sputtering on organic multilayers. In this work, amino acids multilayers, consisting of phenylalanine delta layers alternated with tyrosine spacers, were used as model systems to assess the depth resolution associated with 500 eV Cs⁺ depth profiles. High yields were obtained for quasi-molecular ions from both amino acids, and no significant chemical alteration was noticed under the monoatomic bombardment. A depth resolution as low as 4 nm is demonstrated without sensible degradation on a rather long profile depth (300 nm). Limited depth resolution (> 10 nm) along with high molecular degradation was previously reported on similar systems by combining low-energy Cs⁺ with Ga⁺ analysis beam. The use of the Bi₃⁺ analysis beam results in a dramatic improvement of both the characteristic molecular signal intensities and the depth resolution. Even though the analysis beam fluence is very low compared to the sputtering beam fluence, data suggest that further reducing the analysis Bi₃⁺ fluence could improve the depth resolution by ~ 1 nm.

Hybrid Perovskites Depth Profiling with Variable-Size Argon Clusters and Monatomic Ions Beams

Ion beam depth profiling is increasingly used to investigate layers and interfaces in complex multilayered devices, including solar cells. This approach is particularly challenging on hybrid perovskite layers and perovskite solar cells because of the presence of organic/inorganic interfaces requiring the fine optimization of the sputtering beam conditions. The ion beam sputtering must ensure a viable sputtering rate on hard inorganic materials while limiting the chemical (fragmentation), compositional (preferential sputtering) or topographical (roughening and intermixing) modifications on soft organic layers. In this work, model (Cs_x(MA_0.17FA_0.83)_100−xPb(I_0.83Br_0.17)₃/cTiO₂/Glass) samples and full mesoscopic perovskite solar cells are profiled using low-energy (500 and 1000 eV) monatomic beams (Ar⁺ and Cs⁺) and variable-size argon clusters (Ar_n⁺, 75 < n < 4000) with energy up to 20 keV. The ion beam conditions are optimized by systematically comparing the sputtering rates and the surface modifications associated with each sputtering beam. X-ray photoelectron spectroscopy, time-of-flight secondary ion mass spectrometry, and in-situ scanning probe microscopy are combined to characterize the interfaces and evidence sputtering-related artifacts. Within monatomic beams, 500 eV Cs⁺ results in the most intense and stable ToF-SIMS molecular profiles, almost material-independent sputtering rates and sharp interfaces. Large argon clusters (n > 500) with insufficient energy (E < 10 keV) result in the preferential sputtering of organic molecules and are highly ineffective to sputter small metal clusters (Pb and Au), which tend to artificially accumulate during the depth profile. This is not the case for the optimized cluster ions having a few hundred argon atoms (300 < n < 500) and an energy-per-atom value of at least 20 eV. In these conditions, we obtain (i) the low fragmentation of organic molecules, (ii) convenient erosion rates on soft and hard layers (but still different), and (iii) constant molecular profiles in the perovskite layer, i.e., no accumulation of damages.

Surface modification and direct plasma amination of L605 CoCr alloys: on the optimization of the oxide layer for application in cardiovascular implants

Stents are cardiovascular devices used to treat atherosclerosis, and are deployed into narrowed arteries and implanted by expansion to reopen the biological lumen. Nevertheless, complications after implantation are still observed in 10-14% of the implantations. Therefore, functionalizing these devices with active molecules to improve the interfacial effects with the surrounding tissue strongly impacts their success. A plasma-based procedure to directly graft biomolecules to the surface of cobalt chromium alloys, without any polymeric coating, has been recently reported. Assuring the stability of the coating during plastic deformation generated during the implantation whilst avoiding the corrosion of the surface is crucial. This study explores different surface treatments to be used as a pre-treatment for this novel procedure. The effects of (i) electropolishing, (ii) thermal treatments, and (iii) the plasma immersion ion implantation of oxygen on the chemical composition, roughness, wettability and efficiency during the plasma-amination procedure whilst avoiding cracks after deformation, thus maintaining corrosion resistant behaviour, were investigated by XPS, AFM, ToF-SIMS imaging and depth profile, and WCA. Furthermore, the hemocompatibility of the surface and cell viability assays were also performed. Results showed that all of the treatments created a different surface chemical composition: EP mainly of chromium oxide, PIII with a layer of cobalt oxide and TT with a mixture of oxides, as observed by XPS and ToF-SIMS. Moreover, EP was the process that generated a surface with the highest efficiency to amination and the most corrosion resistance among the treatments, and it appeared as the most suitable pre-treatment for stent functionalization.

Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions

The structures developed in organic electronics, such as organic light emitting diodes (OLEDs) or organic photovoltaics (OPVs) devices always involve hybrid interfaces, joining metal or oxide layers with organic layers. No satisfactory method to probe these hybrid interfaces physical chemistry currently exists. One promising way to analyze such interfaces is to use in situ ion beam etching, but this requires ion beams able to depth profile both inorganic and organic layers. Mono- or diatomic ion beams commonly used to depth profile inorganic materials usually perform badly on organics, while cluster ion beams perform excellently on organics but yield poor results when organics and inorganics are mixed. Conversely, low energy Cs(+) beams (<500 eV) allow organic and inorganic materials depth profiling with comparable erosion rates. This paper shows a successful depth profiling of a model hybrid system made of metallic (Au, Cr) and organic (tyrosine) layers, sputtered with 500 eV Cs(+) ions. Tyrosine layers capped with metallic overlayers are depth profiled easily, with high intensities for the characteristic molecular ions and other specific fragments. Metallic Au or Cr atoms are recoiled into the organic layer where they cause some damage near the hybrid interface as well as changes in the erosion rate. However, these recoil implanted metallic atoms do not appear to severely degrade the depth profile overall quality. This first successful hybrid depth profiling report opens new possibilities for the study of OLEDs, organic solar cells, or other hybrid devices.

Metal-assisted secondary ion mass spectrometry using atomic (Ga+, In+) and fullerene projectiles

The advantages and drawbacks of using either monatomic or buckminsterfullerene primary ions for metal-assisted secondary ion mass spectrometry (MetA-SIMS) are investigated using a series of organic samples including additive molecules, polyolefins, and small peptides. Gold deposition is mostly performed by sputter-coating, and in some cases, the results are compared to those of thermal evaporation (already used in a previous article: Delcorte, A.; Médard, N.; Bertrand, P. Anal. Chem. 2002, 74, 4955). The microstructure of the gold-covered sample surfaces is assessed by scanning and transmission electron microscopies. The merits of the different sets of experimental conditions are established via the analysis of fragment and parent-like ion yields. For most of the analyzed samples, the highest yields of fragment and parent-like ions are already reached with the sole use of C60+ projectiles. Metallization of the sample does not lead to a significant additional enhancement. For polyethylene and polypropylene, however, gold metallization associated with Ga+/In+ projectiles appears to be the only way to observe large cationized, sample-specific chain segments (m/z approximately 1000-2000). A detailed study of the polypropylene mass spectra as a function of gold coverage shows that the dynamics of yield enhancement by metal nanoparticles is strongly dependent on the choice of the projectile, e.g., a pronounced increase with Ga+ and a slow decay with C60+. The cases of Irganox 1010, a polymer antioxidant, and leucine enkephalin, a small peptide, allow us to investigate the specific influence of the experimental conditions on the emission of parent(like) ions such as M+, (M + Na)+, and (M + Au)+. The results show a dependence on both the type of sample and the considered secondary ion. Using theoretical and experimental arguments, the discussion identifies some of the mechanisms underlying the general trends observed in the results. Guidelines concerning the choice of the experimental conditions for MetA-SIMS are provided.

Molecular depth-profiling of polycarbonate with low-energy Cs+ ions

In this work, we explored the possibility of performing molecular depth-profiling by using very low-energy (about 200 eV) monoatomic Cs(+) ions. We show, for the first time, that this simple approach is successful on polymer layers of polycarbonate (PC). Under 200 eV Cs(+) irradiation of PC, a fast decrease of all characteristic negatively charged molecular ion signals is first observed but, rather surprisingly, these signals reach a minimum before rising again. A steady state is reached at which time most specific PC fragments are detected, some with even higher signal intensity (e.g. C(6)H(5)O(-)) than before irradiation. It is believed that the implanted Cs plays a major role in enhancing the negative ionisation of molecular fragments, leading to their easy detection for all the profile, although some material degradation obviously occurs. In the positive ion mode, all molecular fragments of the polymer disappear very rapidly, but clusters combining two Cs atoms and one molecular fragment (e.g. Cs(2)C(6)H(5)O(+)) are detected during the profile, proving that some molecular identification remains possible. In conclusion, this work presents a simple approach to molecular depth-profiling, complementary to cluster ion beam sputtering.

ToF-SIMS characterization of thermal modifications of bixin from Bixa orellana fruit

Bixa orellana fruit extracts were studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS). The intensity of the peak at m/z 396, assigned to the bixin molecular ion plus two hydrogen atoms (C25H(32)O(4+), decreased as the extract was heated and nearly disappeared with heating above 150 degrees C. Simultaneously, the formation of dimers at m/z 790, 804, and 818 was observed. The ToF-SIMS spectrum is characterized by a large amount of peaks generated by the principal ions and their multiple fragmentation patterns. To extract maximum information from the data set, multivariate statistical analysis was applied. Principal component analysis revealed important structural changes of the bixin molecule upon heating at different temperatures. This information can be used by the food industry as by controlling the temperature of the heating process the red/yellow balance of this colorant can be tuned.

Time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy analyses of Bixa orellana seeds

Three different experiments were performed in order to obtain the major carotenoid composition of the natural colorant annatto (E160b) through ToF-SIMS (time-of-flight secondary ion mass spectrometry) and XPS (X-ray photoelectron spectroscopy) analyses. In the first experiment, Bixa orellana seeds aril as well as its interior part were analyzed. The analysis of the seeds aril by ToF-SIMS gives the colorant fingerprint without any sample treatment, showing the presence of bixin and its characteristic fragments. The analysis performed in the interior part of the seeds indicates the presence of Fe. The second set of measurements was conducted on the seeds organic extract right after extraction revealing the same components observed by in situ measurement. A third set of measurements was performed aiming to determine the reason for the organic extract color shift observed after 3 months of exposure to ambient light at room temperature. In this case, it was possible to evidence the degradation of bixin by the loss of xylene molecules through ToF-SIMS and the probable carotenoid oxidation based on the C1s XPS spectrum of the degraded extract.