Fluctuating potentials in GaAs:Si nanowires: critical reduction of the influence of polytypism on the electronic structure

In this work, the effects of Si doping in GaAs nanowires (NWs) grown on GaAs (111)B by molecular beam epitaxy with different Si doping levels (nominal free carrier concentrations of 1 × 10¹⁶, 8 × 10¹⁶, 1 × 10¹⁸ and 5 × 10¹⁸ cm^-3) are deeply investigated using scanning electron microscopy (SEM), transmission electron microscopy (TEM), grazing incidence X-ray diffraction (GID), photoluminescence (PL) and cathadoluminescence (CL). TEM results reveal a mixture of wurtzite (WZ) and zinc-blende (ZB) segments along the NW axis independently of the Si doping levels. GID measurements suggest a slight increase of the ZB fraction with the Si doping. Low temperature PL and CL spectra exhibit sharp lines in the energy range 1.41-1.48 eV, for the samples with lower Si doping levels. However, the emission intensity increases and is accompanied by a clear broadening of the observed lines for the samples with higher Si doping levels. The staggered type-II band alignment only determines the optical properties of the lower doping levels in GaAs:Si NWs. For the higher Si doping levels, the electronic energy level structure of the NWs is determined by electrostatic fluctuating potentials intimately related to the amphoteric behavior of the Si dopant in GaAs. For the heavily doped NWs, the estimated depth of the potential wells is ∼96-117 meV. Our results reveal that the occurrence of the fluctuating potentials is not dependent on the crystalline phase and shows that the limitation imposed by the polytypism can be overcome.

Direct evidences of enhanced Ga interdiffusion in InAs vertically aligned free-standing nanowires

Direct evidences of enhanced Ga interdiffusion in InAs free-standing nanowires grown at moderate temperatures by molecular beam epitaxy on GaAs (111)B are presented in this work. Scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray diffraction measurements in coplanar and grazing incidence geometries show that nominally grown InAs NWs are actually made of an In0.86Ga0.14As alloy. Unlike typical vapor-liquid-solid growth, these nanowires are formed by diffusion-induced growth combined with strong interdiffusion from substrate material. Based on the experimental results, a simple nanowire growth model accounting for the Ga interdiffusion is also presented. This growth model could be generally applicable to the molecular beam heteroepitaxy of III-V nanowires.

Low frequency oscillations in semi-insulating GaAs: a nonlinear analysis

We have observed low frequency current oscillations in a semi-insulating GaAs sample grown by low temperature molecular beam epitaxy. For this, an experimental setup proper to measure high impedance samples with small external noise was developed. Spontaneous oscillations in the current were observed for some bias conditions. Although measurements were carried out from room temperature down to liquid helium, the dynamical analysis was carried out around 200 K where the signal to noise ratio was fairly favorable. To increase the data quality we have also used a noise reduction algorithm suitably developed for nonlinear systems. We observed attractors having low embedding dimension, limit cycle bifurcations, and chaotic behavior characteristic of nonlinear dynamical processes in route to chaos. Attractor reconstruction, Poincare sections, Lyapunov exponents, and correlation dimension were also analyzed.