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1
Alloy multilayers and ternary nanostructures by direct-write approach. NANOTECHNOLOGY 2017;28:415302. [PMID: 28805652 DOI: 10.1088/1361-6528/aa8619] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
2
Controlled co-deposition of FePt nanoparticles embedded in MgO: a detailed investigation of structure and electronic and magnetic properties. NANOTECHNOLOGY 2013;24:495703. [PMID: 24231177 DOI: 10.1088/0957-4484/24/49/495703] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
3
Using evidence from nanocavities to assess the vibrational properties of external surfaces. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2012;24:104005. [PMID: 22354892 DOI: 10.1088/0953-8984/24/10/104005] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
4
Structure and stability of nickel/nickel oxide core-shell nanoparticles. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2011;23:175003. [PMID: 21493971 DOI: 10.1088/0953-8984/23/17/175003] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
5
A tool for the spectroscopic investigation of hydrogen-silicon interaction. SURF INTERFACE ANAL 2010. [DOI: 10.1002/sia.3242] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
6
Method for determination of the displacement field in patterned nanostructures by TEM/CBED analysis of split high-order Laue zone line profiles. J Microsc 2007;226:140-55. [PMID: 17444943 DOI: 10.1111/j.1365-2818.2007.01760.x] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
7
Determination of bulk mismatch values in trasmission electron microscopy cross-sections of heteostructures by convergent-beam electron diffraction. ACTA ACUST UNITED AC 1998. [DOI: 10.1080/01418619808214231] [Citation(s) in RCA: 27] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
8
Strain Measurements in Thin Film Structures by Convergent Beam Electron Diffraction. ACTA ACUST UNITED AC 1997. [DOI: 10.1051/jp3:1997265] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]
9
Strain determination in semiconductors by convergent-beam electron diffraction. Acta Crystallogr A 1996. [DOI: 10.1107/s010876739608484x] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]  Open
10
Hydrogen precipitation in highly oversaturated single-crystalline silicon. ACTA ACUST UNITED AC 1995. [DOI: 10.1002/pssa.2211500202] [Citation(s) in RCA: 25] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/05/2022]
11
Hydrogen-related complexes as the stressing species in high-fluence, hydrogen-implanted, single-crystal silicon. PHYSICAL REVIEW. B, CONDENSED MATTER 1992;46:2061-2070. [PMID: 10003881 DOI: 10.1103/physrevb.46.2061] [Citation(s) in RCA: 35] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
12
Electron spectroscopic imaging of dopant precipitation and segregation in silicon. Ultramicroscopy 1991. [DOI: 10.1016/0304-3991(91)90078-k] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
13
On the silicon dioxide/polycrystalline silicon interface width measurement. SURF INTERFACE ANAL 1988. [DOI: 10.1002/sia.740130406] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
14
Observation of electrostatic fields by electron holography: The case of reverse-biased p-n junctions. Ultramicroscopy 1987. [DOI: 10.1016/0304-3991(87)90224-5] [Citation(s) in RCA: 70] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/27/2022]
15
Electron holographic observations of the electrostatic field associated with thin reverse-biased p-n junctions. PHYSICAL REVIEW LETTERS 1985;55:2196-2199. [PMID: 10032073 DOI: 10.1103/physrevlett.55.2196] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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