Millimeter wave direct-current transmission and reflection spectral data of some organic photo-responsive materials

Voltage data acquired after probe signal transmitted through the organic film and reflected off the film surface as a function of 0.36 mW millimeter wave signal frequency in the range 110–160 GHz. Five different organic photovoltaic (OPV) materials and one 95:5 blend produced at 2 spin rates are used. These materials are a) fluorinated 2-alkyl-benzol[d] [1–3]triazole (FTAZ), a high hole-mobility polymer used for transistors and photovoltaics, b) diketopyrrolopyrrole (DPP3T), an acceptor polymer used in field-effect transistors (FET), c) Y5(PffBT4T-2OD) film that possesses remarkable temperature controllable morphology, d) a neat conjugated polymer P3HT, Poly(3-(hexylthiophene-2,5diyl) film that is used in optoelectronic devices and as a conductive binder for Li-ion batteries, e) phenyl-C61-butyric acid methyl ester (PCBM) films and its soluble derivatives used as n-type organic semiconductors, and f) excitonic photovoltaic material 95%:5% donor-acceptor blend P3HT:PCBM produced by 2 different spin rates. Measurement of direct-current (dc) transmitted and reflected power (RF voltage signal) are measured using a newly developed continuous wave (CW) D-waveguide band probe (110–160 GHz) apparatus named time-resolved millimeter wave conductivity (TR-mmWC) [1]. Transmission and first surface reflection voltages are captured by a zero-bias Schottky barrier diode (ZBD) and converted to relevant dc voltages. Original voltage signal datasets attached with this can be utilized for photovoltaic, dielectric property estimation, and other semiconductor physics applications. A manually collected dataset of transmission and reflection coefficient at incident probe power level ∼0.9 mW for 95:5 P3HT:PCBM films produced at 2 different spin rates, and one separately only for the neat P3HT film are also presented here in tabular form.

Millimeter-Wave Polarimeters Using Kinetic Inductance Detectors for TolTEC and Beyond

Microwave Kinetic Inductance Detectors (MKIDs) provide a compelling path forward to the large-format polarimeter, imaging, and spectrometer arrays needed for next-generation experiments in millimeter-wave cosmology and astronomy. We describe the development of feedhorn-coupled MKID detectors for the TolTEC millimeter-wave imaging polarimeter being constructed for the 50-meter Large Millimeter Telescope (LMT). Observations with TolTEC are planned to begin in early 2019. TolTEC will comprise ∼7,000 polarization sensitive MKIDs and will represent the first MKID arrays fabricated and deployed on monolithic 150 mm diameter silicon wafers - a critical step towards future large-scale experiments with over 10⁵ detectors. TolTEC will operate in observational bands at 1.1, 1.4, and 2.0 mm and will use dichroic filters to define a physically independent focal plane for each passband, thus allowing the polarimeters to use simple, direct-absorption inductive structures that are impedance matched to incident radiation. This work is part of a larger program at NIST-Boulder to develop MKID-based detector technologies for use over a wide range of photon energies spanning millimeter-waves to X-rays. We present the detailed pixel layout and describe the methods, tools, and flexible design parameters that allow this solution to be optimized for use anywhere in the millimeter and sub-millimeter bands. We also present measurements of prototype devices operating in the 1.1 mm band and compare the observed optical performance to that predicted from models and simulations.