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Fourier transform-based post-processing drift compensation and calibration method for scanning probe microscopy. Ultramicroscopy 2024; 263:113984. [PMID: 38744124 DOI: 10.1016/j.ultramic.2024.113984] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/19/2024] [Revised: 03/26/2024] [Accepted: 05/06/2024] [Indexed: 05/16/2024]
Abstract
Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a physical setpoint is maintained via a control feedback loop, often implies that the image is subject to drift effects, leading to distortion of the resulting image. While there are in-operando methods to compensate for the drift, correcting the residual linear drift in obtained images is often neglected. In this paper, we present a reciprocal space-based technique to compensate the linear drift in atomically-resolved scanning probe microscopy images without distinction of the fast and slow scanning directions; furthermore this method does not require the set of SPM images obtained for the different scanning directions. Instead, the compensation is made possible by the a priori knowledge of the lattice parameters. The method can also be used to characterize and calibrate the SPM instrument.
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2
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Haptic sensation-based scanning probe microscopy: Exploring perceived forces for optimal intuition-driven control. Ultramicroscopy 2024; 255:113856. [PMID: 37783064 DOI: 10.1016/j.ultramic.2023.113856] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/29/2022] [Revised: 07/10/2023] [Accepted: 09/14/2023] [Indexed: 10/04/2023]
Abstract
We demonstrate a cryogenic scanning probe microscope (SPM) that has been modified to be controlled with a haptic device, such that the operator can 'feel' the surface of a sample under investigation. This system allows for direct tactile sensation of the atoms in and on top of a crystal, and allows the operator to perceive, by using different SPM modalities, sensations that are representative of the relevant atomic forces and tunneling processes controlling the SPM. In particular, we operate the microscope in modes of (1) conventional STM feedback, (2) energy-dependent electron density imaging, (3) q-plus AFM frequency shift based force sensing, and (4) atomic manipulation/sliding. We also use software to modify the haptic feedback sensation to mimic different interatomic forces, including covalent bonding, Coulomb repulsion, Van der Waals repulsion and a full Lennard-Jones potential. This manner of SPM control creates new opportunities for human-based intuition scanning, and also acts as a novel educational tool to aid in understanding materials at an atomic level.
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3
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Spin-Stabilization by Coulomb Blockade in a Vanadium Dimer in WSe 2. ACS NANO 2023. [PMID: 37976219 DOI: 10.1021/acsnano.3c04841] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/19/2023]
Abstract
Charged dopants in 2D transition metal dichalcogenides (TMDs) have been associated with the formation of hydrogenic bound states, defect-bound trions, and gate-controlled magnetism. Charge-transfer at the TMD-substrate interface and the proximity to other charged defects can be used to regulate the occupation of the dopant's energy levels. In this study, we examine vanadium-doped WSe2 monolayers on quasi-freestanding epitaxial graphene, by high-resolution scanning probe microscopy and ab initio calculations. Vanadium atoms substitute W atoms and adopt a negative charge state through charge donation from the graphene substrate. VW-1 dopants exhibit a series of occupied p-type defect states, accompanied by an intriguing electronic fine-structure that we attribute to hydrogenic states bound to the charged impurity. We systematically studied the hybridization in V dimers with different separations. For large dimer separations, the 2e- charge state prevails, and the magnetic moment is quenched. However, the Coulomb blockade in the nearest-neighbor dimer configuration stabilizes a 1e- charge state. The nearest-neighbor V-dimer exhibits an open-shell character for the frontier defect orbital, giving rise to a paramagnetic ground state. Our findings provide microscopic insights into the charge stabilization and many-body effects of single dopants and dopant pairs in a TMD host material.
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4
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Scanning Probe Microscopy controller with advanced sampling support. HARDWAREX 2023; 15:e00451. [PMID: 37497345 PMCID: PMC10366577 DOI: 10.1016/j.ohx.2023.e00451] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Indexed: 07/28/2023]
Abstract
A low-cost Digital Signal Processor (DSP) unit for advanced Scanning Probe Microscopy measurements is presented. It is based on Red Pitaya board and custom built electronic boards with additional high bit depth AD and DA converters. By providing all the necessary information (position and time) with each data point collected it can be used for any scan path, using either existing libraries for scan path generation or creating adaptive scan paths using Lua scripting interface. The DSP is also capable of performing statistical calculations, that can be used for decision making during scan or for the scan path optimisation on the DSP level.
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5
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Novel type of whisker-tip cantilever based on GaN microrods for atomic force microscopy. Ultramicroscopy 2023; 248:113713. [PMID: 36933435 DOI: 10.1016/j.ultramic.2023.113713] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/15/2022] [Revised: 12/22/2022] [Accepted: 03/02/2023] [Indexed: 03/08/2023]
Abstract
High-resolution scanning probe microscopy (SPM) is a fundamental and efficient technology for surface characterization of modern materials at the subnanometre scale. The bottleneck of SPM is the probe and scanning tip. Materials with stable electrical, thermal, and mechanical properties for high-aspect-ratio (AR) tips are continuously being developed to improve their accuracy. Among these, GaN is emerging as a significant contender that serves as a replacement for standard Si probes. In this paper, for the first time, we present an approach that demonstrates the application of GaN microrods (MRs) as high-AR SPM probes. GaN MRs were grown using molecular beam epitaxy, transferred and mounted on a cantilever using focused electron beam-induced deposition and milled in a whisker tip using a focused ion beam in a scanning electron/ion microscope. The presence of a native oxide layer covering the GaN MR surface was confirmed by X-ray photoelectron spectroscopy. Current-voltage map measurements are also presented to indicate the elimination of the native oxide layer from the tip surface. The utility of the designed probes was tested using conductive atomic force microscopy and a 24-hour durability test in contact mode atomic force microscopy. Subsequently, the graphene stacks were imaged.
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New probes based on carbon nano-cones for scanning probe microscopies. Ultramicroscopy 2023; 245:113667. [PMID: 36563496 DOI: 10.1016/j.ultramic.2022.113667] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/15/2022] [Revised: 11/03/2022] [Accepted: 12/17/2022] [Indexed: 12/23/2022]
Abstract
All-graphenic carbon morphologies grown on individual carbon nanotubes (CNTs) consisting of short-fiber segments bearing sharp micro-/nano-cones at both ends were mounted as new probes for scanning probe microscopies (SPM). Three mounting procedures were tested, two based on focused ion and/or electron beam processes operated in scanning electron microscopes, and another based on an irradiation-free procedure under an optical microscope. The benefits and drawbacks of all the methods are described in details. The extent to which the structural integrity of the carbon material of the cones was affected by each of the mounting processes was also investigated using Raman spectroscopy and high-resolution transmission electron microscopy. The carbon cones were found to be sensitive to both ion and electron irradiation to an unusual extent with respect to structurally-close nano-objects such as multi-wall CNTs. This was assumed to be due to the occurrence of a large number of free graphene-edges at the cone surface. The suitability of such carbon cones as SPM probes is demonstrated, the characteristics of which make them potentially superior to Si-, diamond-, or CNT-probes.
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7
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Imaging ferroelectric domains with a single-spin scanning quantum sensor. NATURE PHYSICS 2023; 19:644-648. [PMID: 37205126 PMCID: PMC10185469 DOI: 10.1038/s41567-022-01921-4] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 05/31/2022] [Accepted: 12/14/2022] [Indexed: 05/21/2023]
Abstract
The ability to sensitively image electric fields is important for understanding many nanoelectronic phenomena, including charge accumulation at surfaces1 and interfaces2 and field distributions in active electronic devices3. A particularly exciting application is the visualization of domain patterns in ferroelectric and nanoferroic materials4,5, owing to their potential in computing and data storage6-8. Here, we use a scanning nitrogen-vacancy (NV) microscope, well known for its use in magnetometry9, to image domain patterns in piezoelectric (Pb[Zr0.2Ti0.8]O3) and improper ferroelectric (YMnO3) materials through their electric fields. Electric field detection is enabled by measuring the Stark shift of the NV spin10,11 using a gradiometric detection scheme12. Analysis of the electric field maps allows us to discriminate between different types of surface charge distributions, as well as to reconstruct maps of the three-dimensional electric field vector and charge density. The ability to measure both stray electric and magnetic fields9,13 under ambient conditions opens opportunities for the study of multiferroic and multifunctional materials and devices8,14.
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8
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Correlating the Interfacial Polar-Phase Structure to the Local Chemistry in Ferroelectric Polymer Nanocomposites by Combined Scanning Probe Microscopy. NANO-MICRO LETTERS 2022; 15:5. [PMID: 36472752 PMCID: PMC9727024 DOI: 10.1007/s40820-022-00978-3] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/28/2022] [Accepted: 11/06/2022] [Indexed: 06/10/2023]
Abstract
Ferroelectric polymer nanocomposites possess exceptional electric properties with respect to the two otherwise uniform phases, which is commonly attributed to the critical role of the matrix-particle interfacial region. However, the structure-property correlation of the interface remains unestablished, and thus, the design of ferroelectric polymer nanocomposite has largely relied on the trial-and-error method. Here, a strategy that combines multi-mode scanning probe microscopy-based electrical characterization and nano-infrared spectroscopy is developed to unveil the local structure-property correlation of the interface in ferroelectric polymer nanocomposites. The results show that the type of surface modifiers decorated on the nanoparticles can significantly influence the local polar-phase content and the piezoelectric effect of the polymer matrix surrounding the nanoparticles. The strongly coupled polar-phase content and piezoelectric effect measured directly in the interfacial region as well as the computed bonding energy suggest that the property enhancement originates from the formation of hydrogen bond between the surface modifiers and the ferroelectric polymer. It is also directly detected that the local domain size of the ferroelectric polymer can impact the energy level and distribution of charge traps in the interfacial region and eventually influence the local dielectric strength.
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9
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Dissociation of Single O 2 Molecules on Ag(110) by Electrons, Holes, and Localized Surface Plasmons. CHEM REC 2022; 22:e202200011. [PMID: 35332649 DOI: 10.1002/tcr.202200011] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/18/2022] [Revised: 03/11/2022] [Indexed: 11/06/2022]
Abstract
A detailed understanding of the dissociation of O2 molecules on metal surfaces induced by various excitation sources, electrons/holes, light, and localized surface plasmons, is crucial not only for controlling the reactivity of oxidation reactions but also for developing various oxidation catalysts. The necessity of mechanistic studies at the single-molecule level is increasingly important for understanding interfacial interactions between O2 molecules and metal surfaces and to improve the reaction efficiency. We review single-molecule studies of O2 dissociation on Ag(110) induced by various excitation sources using a scanning tunneling microscope (STM). The comprehensive studies based on the STM and density functional theory calculations provide fundamental insights into the excitation pathway for the dissociation reaction.
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10
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Visualizing the Spatial Heterogeneity of Electron Transfer on a Metallic Nanoplate Prism. NANO LETTERS 2021; 21:8901-8909. [PMID: 34647747 DOI: 10.1021/acs.nanolett.1c03529] [Citation(s) in RCA: 7] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
Abstract
The involvement between electron transfer (ET) and catalytic reaction at the electrocatalyst surface makes the electrochemical process challenging to understand and control. Even ET process, a primary step, is still ambiguous because it is unclear how the ET process is related to the nanostructured electrocatalyst. Herein, locally enhanced ET current dominated by mass transport effect at corner and edge sites bounded by {111} facets on single Au triangular nanoplates was clearly imaged. After decoupling mass transport effect, the ET rate constant of corner sites was measured to be about 2-fold that of basal {111} plane. Further, we demonstrated that spatial heterogeneity of local inner potential differences of Au nanoplates/solution interfaces plays a key role in the ET process, supported by the linear correlation between the logarithm of rate constants and the potential differences of different sites. These results provide direct images for heterogeneous ET, which helps to understand and control the nanoscopic electrochemical process and electrode design.
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Hystorian: A processing tool for scanning probe microscopy and other n-dimensional datasets. Ultramicroscopy 2021; 228:113345. [PMID: 34214695 DOI: 10.1016/j.ultramic.2021.113345] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/04/2021] [Accepted: 06/20/2021] [Indexed: 11/16/2022]
Abstract
Research in materials science increasingly depends on the correlation of information from multiple characterisation techniques, acquired in ever larger datasets. Efficient methods of processing and storing these complex datasets are therefore crucial. Reliably keeping track of data processing is also essential to conform with the goals of open science. Here, we introduce Hystorian, a generic materials science data analysis Python package built at its core to improve the traceability, reproducibility, and archival ability of data processing. Proprietary data formats are converted into open hierarchical data format (HDF5) files, with both datasets and subsequent workflows automatically stored into a single location, thus allowing easy management of multiple data types. At present, Hystorian provides a basic scanning probe microscopy and x-ray diffraction analysis toolkit, and is readily extensible to suit user needs. It is also able to wrap over any existing processing functions, making it easy to append in an extant workflow.
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High resolution imaging of viruses: Scanning probe microscopy and related techniques. Methods 2021; 197:30-38. [PMID: 34157416 DOI: 10.1016/j.ymeth.2021.06.011] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/19/2020] [Revised: 05/26/2021] [Accepted: 06/17/2021] [Indexed: 11/19/2022] Open
Abstract
Scanning probe microscopy is a group of measurements that provides 3D visualization of viruses in different environmental conditions including liquids and air. Besides 3D topography it is possible to measure the properties like mechanical rigidity and stability, adhesion, tendency to crystallization, surface charge, etc. Choosing the right substrate and scanning parameters makes it much easier to obtain reliable data. Rational interpretation of experimental results should take into account possible artifacts, proper filtering and data presentation using specially designed software packages. Animal and human virus characterization is in the focus of many intensive studies because of their potential harm to higher organisms. The article focuses on high-resolution visualization of plant viruses. Tobacco mosaic virus, potato viruses X and B and others are not dangerous for the human being and are widely used in different applications such as vaccine preparation, construction of building units in nanotechnology and material science applications, nanoparticle production and delivery, and even metrology. The methods of virus's deposition, visualization, and consequent image processing and interpretation are described in details. Specific examples of viruses imaging are illustrated using the FemtoScan Online software, which has typical and all the necessary built-in functions for constructing three-dimensional images, their processing and analysis. Despite visible progress in visualizing the viruses using probe microscopy, many unresolved problems still remain. At present time the probe microscopy data on viruses is not systemized. There is no descriptive atlas of the images and morphology as revealed by this type of high resolution microscopy. It is worth emphasizing that new virus investigation methods will appear due to the progress of science.
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TrueEBSD: Correcting spatial distortions in electron backscatter diffraction maps. Ultramicroscopy 2020; 221:113130. [PMID: 33290982 DOI: 10.1016/j.ultramic.2020.113130] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/01/2019] [Revised: 08/28/2020] [Accepted: 10/01/2020] [Indexed: 11/19/2022]
Abstract
Electron backscatter diffraction (EBSD) in the scanning electron microscope is routinely used for microstructural characterisation of polycrystalline materials. Maps of EBSD data are typically acquired at high stage tilt and slow scan speed, leading to tilt and drift distortions that obscure or distort features in the final microstructure map. In this paper, we describe TrueEBSD, an automatic postprocessing procedure for distortion correction with pixel-scale precision. Intermediate images are used to separate tilt and drift distortion components and fit each to a physically-informed distortion model. We demonstrate TrueEBSD on three case studies (titanium, zirconium and hydride containing Zr), where distortion removal has enabled characterisation of otherwise inaccessible microstructural features.
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14
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Elasticity spectra as a tool to investigate actin cortex mechanics. J Nanobiotechnology 2020; 18:147. [PMID: 33081777 PMCID: PMC7576730 DOI: 10.1186/s12951-020-00706-2] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/17/2020] [Accepted: 10/09/2020] [Indexed: 12/24/2022] Open
Abstract
Background The mechanical properties of single living cells have proven to be a powerful marker of the cell physiological state. The use of nanoindentation-based single cell force spectroscopy provided a wealth of information on the elasticity of cells, which is still largely to be exploited. The simplest model to describe cell mechanics is to treat them as a homogeneous elastic material and describe it in terms of the Young’s modulus. Beside its simplicity, this approach proved to be extremely informative, allowing to assess the potential of this physical indicator towards high throughput phenotyping in diagnostic and prognostic applications. Results Here we propose an extension of this analysis to explicitly account for the properties of the actin cortex. We present a method, the Elasticity Spectra, to calculate the apparent stiffness of the cell as a function of the indentation depth and we suggest a simple phenomenological approach to measure the thickness and stiffness of the actin cortex, in addition to the standard Young’s modulus. Conclusions The Elasticity Spectra approach is tested and validated on a set of cells treated with cytoskeleton-affecting drugs, showing the potential to extend the current representation of cell mechanics, without introducing a detailed and complex description of the intracellular structure.![]()
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15
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On determining soot maturity: A review of the role of microscopy- and spectroscopy-based techniques. CHEMOSPHERE 2020; 252:126532. [PMID: 32229356 DOI: 10.1016/j.chemosphere.2020.126532] [Citation(s) in RCA: 14] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/06/2019] [Revised: 03/13/2020] [Accepted: 03/16/2020] [Indexed: 05/23/2023]
Abstract
Incomplete combustion is the main source of airborne soot, which has negative impacts on public health and the environment. Understanding the morphological and chemical evolution of soot is important for assessing and mitigating the impact of soot emissions. Morphological and chemical structures of soot are commonly studied using microscopy or spectroscopy, and the best technique depends on the parameter of interest and the stage of soot formation considered (i.e., maturity). For the earliest stages of soot formation, particles exhibit simple morphology yet complex and reactive chemical composition, which is best studied by spectroscopic techniques sensitive to the large number of soot precursor species. The only microscope that can offer some morphological information at this stage is the scanning probe microscopy, which can image single polycyclic aromatic hydrocarbons, the precursors of soot. A broader range of types of spectrometers and microscopes can be used by increasing the soot maturity. Mature soot is primarily carbon, and exhibits complex fractal-like morphology best studied with electron microscopy and techniques sensitive to thin oxide or organic coatings. Each characterization technique can target different morphological and chemical properties of soot, from the early to the late stage of its formation. Thus, a guideline for the selection of the appropriate technique can facilitates studies on environmental samples involving the presence of soot.
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Volcano-Shaped Scanning Probe Microscopy Probe for Combined Force-Electrogram Recordings from Excitable Cells. NANO LETTERS 2020; 20:4520-4529. [PMID: 32426984 PMCID: PMC7291358 DOI: 10.1021/acs.nanolett.0c01319] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/26/2020] [Revised: 05/19/2020] [Indexed: 05/30/2023]
Abstract
Atomic force microscopy based approaches have led to remarkable advances in the field of mechanobiology. However, linking the mechanical cues to biological responses requires complementary techniques capable of recording these physiological characteristics. In this study, we present an instrument for combined optical, force, and electrical measurements based on a novel type of scanning probe microscopy cantilever composed of a protruding volcano-shaped nanopatterned microelectrode (nanovolcano probe) at the tip of a suspended microcantilever. This probe enables simultaneous force and electrical recordings from single cells. Successful impedance measurements on mechanically stimulated neonatal rat cardiomyocytes in situ were achieved using these nanovolcano probes. Furthermore, proof of concept experiments demonstrated that extracellular field potentials (electrogram) together with contraction displacement curves could simultaneously be recorded. These features render the nanovolcano probe especially suited for mechanobiological studies aiming at linking mechanical stimuli to electrophysiological responses of single cells.
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Quartz tuning fork based three-dimensional topography imaging for sidewall with blind features. Ultramicroscopy 2019; 210:112916. [PMID: 31816542 DOI: 10.1016/j.ultramic.2019.112916] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/27/2019] [Revised: 11/21/2019] [Accepted: 11/30/2019] [Indexed: 11/22/2022]
Abstract
Atomic force microscopy has a tremendous number of applications in a wide variety of fields, particularly in the semiconductor area for the 3D-stacked device. Imaging three-dimensional (3D) structures with blind features has progressively become a critical technique. Recently, a 3D-atomic force microscopy (AFM) technique has been proposed to image 3D features, especially those having sharp apices, like silicon pillars. However, the scanning strategy has drawbacks, such as long scanning time, and unstable operation, based on the premature algorithm. Herein, an improved 3D-AFM algorithm is reported that overcomes the aforementioned problems by an intelligent 3D scanning algorithm that incorporates sidewall history tracking, troubleshooting for sharp sidewall and sticking, and reactive direction adjustment. The proposed algorithm enables the 3D imagery of ZnO nano-rods and silicon nano-pillars to be achieved by using a high aspect-ratio multiwall carbon nanotube-based AFM probe, without time-consuming disorientation. This study establishes a method to construct a 3D image of arbitrary shape in reduced scanning time.
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Localized surface curvature artifacts in tip-enhanced nanospectroscopy imaging. Ultramicroscopy 2019; 206:112811. [PMID: 31310887 DOI: 10.1016/j.ultramic.2019.112811] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/12/2019] [Revised: 06/26/2019] [Accepted: 07/04/2019] [Indexed: 01/27/2023]
Abstract
Tip-enhanced Raman spectroscopy (TERS) allows the chemical analysis with a spatial resolution at the nanoscale, well beyond what the diffraction limit of light makes possible. We can further boost the TERS sensitivity by using a metallic substrate in the so-called gap-mode TERS. In this context, the goal of this work is to provide a generalized view of imaging artifacts in TERS and near-field imaging that occur due to tip-sample coupling. Contrary to the case of gap-mode with a flat substrate where the size of the enhanced region is smaller than the tip size when visualizing 3D nanostructures the tip convolution effect may broaden the observed dimensions due to the local curvature of the sample. This effect is particularly critical considering that most works on gap-mode TERS consider a perfectly flat substrate which is rarely the case in actual experiments. We investigate a range of substrates to evidence these geometrical effects and to obtain an understanding of the nanoscale curvature role in TERS imaging. Our experimental results are complemented by numerical simulations and an analogy with atomic force microscopy artifacts is introduced. As a result, this work offers a useful analysis of gap-mode TERS imaging with tip- and substrate-related artifacts furthering our understanding and the reliability of near-field optical nanospectroscopy.
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The new FAST module: A portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes. Ultramicroscopy 2019; 205:49-56. [PMID: 31234102 DOI: 10.1016/j.ultramic.2019.05.010] [Citation(s) in RCA: 12] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/07/2018] [Revised: 05/03/2019] [Accepted: 05/24/2019] [Indexed: 11/15/2022]
Abstract
Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e.g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated.
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Abstract
Electron cryo-tomography using the scanning transmission modality (STEM) enables 3D reconstruction of unstained, vitrified specimens as thick as 1μm or more. Contrast is related to mass/thickness and atomic number, providing quantifiable chemical characterization and mass mapping of intact prokaryotic and eukaryotic cells. Energy dispersive X-ray spectroscopy by STEM provides a simple, on-the-spot chemical identification of the elemental composition in sub-cellular organic bodies or mineral deposits. This chapter provides basic background and practical information for performing cryo-STEM tomography on vitrified biological cells.
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Electrochemical behavior of titanium and platinum in dicarboxilic amino acids solution. Bioelectrochemistry 2018; 126:113-120. [PMID: 30554019 DOI: 10.1016/j.bioelechem.2018.11.015] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/06/2018] [Revised: 11/29/2018] [Accepted: 11/30/2018] [Indexed: 10/27/2022]
Abstract
Titanium and platinum samples as components of bimetallic implants for the osteoregeneration process have been modified in solutions modeling biological systems and studied by means of cyclic voltammetry, electrochemical impedance spectroscopy and scanning probe microscopy. While aspartic and glutamic acids did not adsorb significantly on platinum in the potential region investigated, the presence of the amino acids affects oxide layer growth on the titanium surface under anodic polarization. The two studied amino acids behave differently on the titanium electrode surface due to differences in adsorption modes of these substances. The adsorption of the glutamic acid depends on the polarization potential to a large extent, and most of quantitative adsorption characteristics (EIS data, the surface roughness) undergo drastic change at the polarization potential value of 750 mV (vs. Ag/AgCl) in the presence of this substance. Equivalent circuit modeling of the surface processes has been carried out, and a scheme for aspartic and glutamic acid adsorption onto the titanium surface has proposed.
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Thermoelectric stack sample cooling modification of a commercial atomic force microscopy. Ultramicroscopy 2018; 196:186-191. [PMID: 30439605 DOI: 10.1016/j.ultramic.2018.10.014] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/23/2018] [Revised: 09/07/2018] [Accepted: 10/30/2018] [Indexed: 11/30/2022]
Abstract
Enabling temperature dependent experiments in Atomic Force Microscopy is of great interest to study materials and surface properties at the nanoscale. By studying Curie temperature of multiferroic materials, temperature dependent phase transitions on crystalline structures or resistive switching phenomena are only a few examples of applications. We present an equipment capable of cooling samples using a thermoelectric cooling stage down to -61.4 °C in a 15 × 15 mm2 sample plate. The equipment uses a four-unit thermoelectric stack to achieve maximum temperature range, with low electrical and mechanical noise. The equipment is installed into a Keysight 5500LS Atomic Force Microscopy maintaining its compatibility with all Electrical and Mechanical modes of operation. We study the contribution of the liquid cooling pump vibration into the cantilever static deflection noise and the temperature dependence of the cantilever deflection. A La0.7Sr0.3MnO3-y thin film sample is used to demonstrate the performance of the equipment and its usability by analyzing the resistive switching phenomena associated with this oxide perovskite.
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Multifractal Characterization of Butterfly Wings Scales. Bull Math Biol 2018; 80:2856-2870. [PMID: 30194522 DOI: 10.1007/s11538-018-0490-7] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/30/2018] [Accepted: 08/24/2018] [Indexed: 02/07/2023]
Abstract
A lot of insect families have physical structures created by evolution for coloration. These structures are a source of ideas for new bio-inspired materials. The aim of this study was to quantitatively characterize the micromorphology of butterfly wings scales using atomic force microscopy and multifractal analysis. Two types of butterflies, Euploea mulciber ("striped blue crow") and Morpho didius ("giant blue morpho"), were studied. The three-dimensional (3D) surface texture of the butterfly wings scales was investigated focusing on two areas: where the perceived colors strongly depend on and where they do not depend on the viewing angle. The results highlight a correlation between the surface coloration and 3D surface microtexture of butterfly wings scales.
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Deep data analysis via physically constrained linear unmixing: universal framework, domain examples, and a community-wide platform. ADVANCED STRUCTURAL AND CHEMICAL IMAGING 2018; 4:6. [PMID: 29755927 PMCID: PMC5928180 DOI: 10.1186/s40679-018-0055-8] [Citation(s) in RCA: 30] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/14/2017] [Accepted: 03/19/2018] [Indexed: 01/05/2023]
Abstract
Many spectral responses in materials science, physics, and chemistry experiments can be characterized as resulting from the superposition of a number of more basic individual spectra. In this context, unmixing is defined as the problem of determining the individual spectra, given measurements of multiple spectra that are spatially resolved across samples, as well as the determination of the corresponding abundance maps indicating the local weighting of each individual spectrum. Matrix factorization is a popular linear unmixing technique that considers that the mixture model between the individual spectra and the spatial maps is linear. Here, we present a tutorial paper targeted at domain scientists to introduce linear unmixing techniques, to facilitate greater understanding of spectroscopic imaging data. We detail a matrix factorization framework that can incorporate different domain information through various parameters of the matrix factorization method. We demonstrate many domain-specific examples to explain the expressivity of the matrix factorization framework and show how the appropriate use of domain-specific constraints such as non-negativity and sum-to-one abundance result in physically meaningful spectral decompositions that are more readily interpretable. Our aim is not only to explain the off-the-shelf available tools, but to add additional constraints when ready-made algorithms are unavailable for the task. All examples use the scalable open source implementation from https://github.com/ramkikannan/nmflibrary that can run from small laptops to supercomputers, creating a user-wide platform for rapid dissemination and adoption across scientific disciplines.
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Nanoscale Mapping of Molecular Vibrational Modes via Vibrational Noise Spectroscopy. NANO LETTERS 2018; 18:1001-1009. [PMID: 29293349 DOI: 10.1021/acs.nanolett.7b04457] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
We have developed a "vibrational noise spectroscopy (VNS)" method to identify and map vibrational modes of molecular wires on a solid substrate. In the method, electrical-noises generated in molecules on a conducting substrate were measured using a conducting atomic force microscopy (AFM) with a nanoresolution. We found that the bias voltage applied to the conducting AFM probe can stimulate specific vibrational modes of measured molecules, resulting in enhanced electrical noises. Thus, by analyzing noise-voltage spectra, we could identify various vibrational modes of the molecular wires on the substrates. Further, we could image the distribution of vibrational modes on molecule patterns on the substrates. In addition, we found that VNS imaging data could be further analyzed to quantitatively estimate the density of a specific vibrational mode in the layers of different molecular species. The VNS method allows one to measure molecular vibrational modes under ambient conditions with a nanoresolution, and thus it can be a powerful tool for nanoscale electronics and materials researches in general.
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In-situ Near-Field Probe Microscopy of Plasma Processing. APPLIED PHYSICS LETTERS 2018; 113:10.1063/1.5049592. [PMID: 35023877 PMCID: PMC8752043 DOI: 10.1063/1.5049592] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/23/2018] [Accepted: 12/03/2018] [Indexed: 06/01/2023]
Abstract
There exists a great necessity for in situ nanoscale characterization of surfaces and thin films during plasma treatments. To address this need, the current approaches rely on either 'post mortem' sample microscopy, or in situ optical methods. The latter, however, lack the required nanoscale spatial resolution. In this paper, we propose scanning near-field microwave microscopy to monitor plasma-assisted processes with a submicron spatial resolution. In our approach, a plasma environment with an object of interest is separated from the near-field probe and the rest of the microscope by a SiN membrane of a few-10s nm thickness, and the imaging is performed through this membrane. As a proof of concept, we were able to monitor gradual transformations of carbon nanotube films upon plasma-induced oxidation by a low-pressure air plasma. In the implemented approach with the near-field probe in contact with the membrane, the plasma processing should be interrupted during imaging to preserve the membrane integrity. Possible solutions to achieve in situ real-time imaging during plasma conditions are discussed.
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Comparison on the effects of water-borne and dietary-borne accumulated ZnO nanoparticles on Daphnia magna. CHEMOSPHERE 2017; 189:94-103. [PMID: 28934659 DOI: 10.1016/j.chemosphere.2017.08.132] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/25/2017] [Revised: 08/14/2017] [Accepted: 08/24/2017] [Indexed: 06/07/2023]
Abstract
Nanoparticles (NPs) can exert toxicity to aquatic animals through water and dietary exposure. However, little is known about the contribution of the two exposure pathways to the total toxicity of NPs to aquatic animals. In the present study, we fed Daphnia magna with ZnO NPs-accumulated-algae or directly exposed them to ZnO NPs suspension at the same Zn concentration. The body Zn concentrations were the same in both treatments, but the surface elastic modulus in the water-borne group was lower than that in the dietary-borne group, indicating more severe surface damage in the water-borne treatment. Total egg numbers of the first brood in both Zn treatments were significantly lower than the control, but they were not significantly different between the two treatments. However, the first brood in the water-borne treatment was distinctly delayed than that in the dietary-borne group. The dietary-borne treatment suppressed the expression of Hem and SOD genes. The water-borne treatment significantly suppressed the expression of Pro, SOD, VTG, but increased the GST expression. In particular, the expression of Pro, a gene functions in modulation of cell multiplication, was lower in the water-borne treatment, which might be related to the suppression of body growth in D. magna. The expression of SOD in the water-borne treatment decreased by about four times in comparison with the dietary-borne treatment, and the SOD enzyme activity of the water-borne treatment was significantly lower than that of the dietary-borne treatment. These results indicate that the two exposure routes have different targets and responding toxic mechanisms.
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Abstract
Atomic force microscopy (AFM) was used to assess the indentation modulus Ms and pull-off force Fpo in four case studies of distinct evidence types, namely hair, questioned documents, fingerprints, and explosive particle-surface interactions. In the hair study, Ms decreased and Fpo increased after adding conditioner and bleach to the hair. For the questioned documents, Ms and Fpo of two inks were markedly different; ballpoint pen ink exhibited smaller variations relative to the mean value than printer ink. The fingerprint case study revealed that both maximum height and Fpo decreased over a three-day period. Finally, the study on explosive particle-surface interactions illustrated that two fabrics exhibited similar Ms, but different Fpo. Overall, it was found that AFM addresses needs in forensic science as defined by several federal agencies, in particular an improved ability to expand the information extracted from evidence and to quantify its evidentiary value.
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A scanning probe mounted on a field-effect transistor: Characterization of ion damage in Si. Micron 2017; 101:197-205. [PMID: 28797948 DOI: 10.1016/j.micron.2017.07.011] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/01/2017] [Revised: 07/21/2017] [Accepted: 07/21/2017] [Indexed: 10/19/2022]
Abstract
We have examined the capabilities of a Tip-On-Gate of Field-Effect Transistor (ToGoFET) probe for characterization of FIB-induced damage in Si surface. A ToGoFET probe is the SPM probe which the Field Effect Transistor(FET) is embedded at the end of a cantilever and a Pt tip was mounted at the gate of FET. The ToGoFET probe can detect the surface electrical properties by measuring source-drain current directly modulated by the charge on the tip. In this study, a Si specimen whose surface was processed with Ga+ ion beam was prepared. Irradiation and implantation with Ga+ ions induce highly localized modifications to the contact potential. The FET embedded on ToGoFET probe detected the surface electric field profile generated by schottky contact between the Pt tip and the sample surface. Experimentally, it was shown that significant differences of electric field due to the contact potential barrier in differently processed specimens were observed using ToGOFET probe. This result shows the potential that the local contact potential difference can be measured by simple working principle with high sensitivity.
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Switchable bi-stable multilayer magnetic probes for imaging of soft magnetic structures. Ultramicroscopy 2017; 179:41-46. [PMID: 28391037 DOI: 10.1016/j.ultramic.2017.03.032] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/07/2016] [Revised: 03/24/2017] [Accepted: 03/27/2017] [Indexed: 10/19/2022]
Abstract
We present the use of custom-made multilayer (ML) magnetic probes in magnetic force microscopy (MFM) for imaging soft magnetic structures, i.e. nickel submicron disks of different dimensions. One of the main advantages of a custom-made ML probe is that it can be controllably switched between standard (parallel) and low moment (antiparallel) states. We demonstrate that the predicted vortex and stripe domain states in the disks are observed when using the ML probes both in the antiparallel and parallel states. However, while the phase contrast is significantly larger in the parallel state, the images are dominated by strong sample - probe interactions that obscure the image. By comparison of the stripe domain width observed by MFM with the ML probe and those expected from the Kittel model, we show that the resolution of the probe in the AP and P states is ∼30-40nm, i.e. of the order of the probe geometrical apex and thus approaching the limit of spatial resolution. The ML probes are further compared to the commercial standard and low moment ones, showing that the quality of images obtained with the ML probe is superior to both commercial probes.
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Local Magnetoelectric Effect in La-Doped BiFeO3 Multiferroic Thin Films Revealed by Magnetic-Field-Assisted Scanning Probe Microscopy. NANOSCALE RESEARCH LETTERS 2016; 11:318. [PMID: 27356565 PMCID: PMC4927550 DOI: 10.1186/s11671-016-1534-2] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 04/14/2016] [Accepted: 06/24/2016] [Indexed: 06/06/2023]
Abstract
Multiferroic La-doped BiFeO3 thin films have been prepared by a sol-gel plus spin-coating process, and the local magnetoelectric coupling effect has been investigated by the magnetic-field-assisted scanning probe microscopy connected with a ferroelectric analyzer. The local ferroelectric polarization response to external magnetic fields is observed and a so-called optimized magnetic field of ~40 Oe is obtained, at which the ferroelectric polarization reaches the maximum. Moreover, we carry out the magnetic-field-dependent surface conductivity measurements and illustrate the origin of local magnetoresistance in the La-doped BiFeO3 thin films, which is closely related to the local ferroelectric polarization response to external magnetic fields. This work not only provides a useful technique to characterize the local magnetoelectric coupling for a wide range of multiferroic materials but also is significant for deeply understanding the local multiferroic behaviors in the BiFeO3-based systems.
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Green's function modeling of response of two-dimensional materials to point probes for scanning probe microscopy. PHYSICS LETTERS. A 2016; 380:1750-1756. [PMID: 28736478 PMCID: PMC5520644 DOI: 10.1016/j.physleta.2016.03.021] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
A Green's function (GF) method is developed for interpreting scanning probe microscopy (SPM) measurements on new two-dimensional (2D) materials. GFs for the Laplace/Poisson equations are calculated by using a virtual source method for two separate cases of a finite material containing a rectangular defect and a hexagonal defect. The prescribed boundary values are reproduced almost exactly by the calculated GFs. It is suggested that the GF is not just a mathematical artefact but a basic physical characteristic of material systems, which can be measured directly by SPM for 2D solids. This should make SPM an even more powerful technique for characterization of 2D materials.
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Outwitting the series resistance in scanning spreading resistance microscopy. Ultramicroscopy 2015; 161:59-65. [PMID: 26624516 DOI: 10.1016/j.ultramic.2015.10.029] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/13/2015] [Revised: 10/27/2015] [Accepted: 10/28/2015] [Indexed: 11/18/2022]
Abstract
The performance of nanoelectronics devices critically depends on the distribution of active dopants inside these structures. For this reason, dopant profiling has been defined as one of the major metrology challenges by the international technology roadmap of semiconductors. Scanning spreading resistance microscopy (SSRM) has evolved as one of the most viable approaches over the last decade due to its excellent spatial resolution, sensitivity and quantification accuracy. However, in case of advanced device architectures like fins and nanowires a proper measurement of the spreading resistance is often hampered by the increasing impact of parasitic series resistances (e.g. bulk series resistance) arising from the confined nature of the aforementioned structures. In order to overcome this limitation we report in this paper the development and implementation of a novel SSRM mode (fast Fourier transform-SSRM: FFT-SSRM) which essentially decouples the spreading resistance from parasitic series resistance components. We show that this can be achieved by a force modulation (leading to a modulated spreading resistance signal) in combination with a lock-in deconvolution concept. In this paper we first introduce the principle of operation of the technique. We discuss in detail the underlying physical mechanisms as well as the technical implementation on a state-of-the-art atomic force microscope (AFM). We demonstrate the performance of FFT-SSRM and its ability to remove substantial series resistance components in practice. Eventually, the possibility of decoupling the spreading resistance from the intrinsic probe resistance will be demonstrated and discussed.
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A scanning microscopy technique based on capacitive coupling with a field-effect transistor integrated with the tip. Ultramicroscopy 2015; 159 Pt 1:1-10. [PMID: 26231315 DOI: 10.1016/j.ultramic.2015.07.007] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/25/2014] [Revised: 07/07/2015] [Accepted: 07/23/2015] [Indexed: 11/24/2022]
Abstract
We propose a method for measuring the capacitance of a thin layer using a Tip-on-Gate of Field-Effect Transistor (ToGoFET) probe. A ToGoFET probe with a metal-oxide-semiconductor field-effect transistor (MOSFET) with an ion-implant channel was embedded at the end of a cantilever and a Pt tip was fabricated using micro-machining. The ToGoFET probe was used to detect an alternating electric field at the dielectric surface. A dielectric buried metal sample was prepared; a sinusoidal input signal was applied to the buried metal lines; and the ToGoFET probe detected the electric field at the tip via the dielectric. The AC signal detected by the ToGoFET probe was demodulated by a simple AC-to-DC converter. Experimentally, it was shown that an electric field could be measured at the surface of the dielectric layer above a buried metal line. This promising result shows that it is possible to measure the surface local capacitance.
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New fabrication technique for highly sensitive qPlus sensor with well-defined spring constant. Ultramicroscopy 2015; 158:33-7. [PMID: 26117434 DOI: 10.1016/j.ultramic.2015.06.008] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/14/2014] [Revised: 05/09/2015] [Accepted: 06/09/2015] [Indexed: 10/23/2022]
Abstract
A new technique for the fabrication of highly sensitive qPlus sensor for atomic force microscopy (AFM) is described. The focused ion beam was used to cut then weld onto a bare quartz tuning fork a sharp micro-tip from an electrochemically etched tungsten wire. The resulting qPlus sensor exhibits high resonance frequency and quality factor allowing increased force gradient sensitivity. Its spring constant can be determined precisely which allows accurate quantitative AFM measurements. The sensor is shown to be very stable and could undergo usual UHV tip cleaning including e-beam and field evaporation as well as in situ STM tip treatment. Preliminary results with STM and AFM atomic resolution imaging at 4.5 K of the silicon Si(111)-7×7 surface are presented.
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Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets. ADVANCED STRUCTURAL AND CHEMICAL IMAGING 2015; 1:6. [PMID: 27547705 PMCID: PMC4977326 DOI: 10.1186/s40679-015-0006-6] [Citation(s) in RCA: 67] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 01/27/2015] [Accepted: 04/21/2015] [Indexed: 11/10/2022]
Abstract
The development of electron and scanning probe microscopies in the second half of the twentieth century has produced spectacular images of the internal structure and composition of matter with nanometer, molecular, and atomic resolution. Largely, this progress was enabled by computer-assisted methods of microscope operation, data acquisition, and analysis. Advances in imaging technology in the beginning of the twenty-first century have opened the proverbial floodgates on the availability of high-veracity information on structure and functionality. From the hardware perspective, high-resolution imaging methods now routinely resolve atomic positions with approximately picometer precision, allowing for quantitative measurements of individual bond lengths and angles. Similarly, functional imaging often leads to multidimensional data sets containing partial or full information on properties of interest, acquired as a function of multiple parameters (time, temperature, or other external stimuli). Here, we review several recent applications of the big and deep data analysis methods to visualize, compress, and translate this multidimensional structural and functional data into physically and chemically relevant information.
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Surface- and Tip-Enhanced Raman Spectroscopy as Operando Probes for Monitoring and Understanding Heterogeneous Catalysis. Catal Letters 2014; 145:40-57. [PMID: 26052185 PMCID: PMC4449125 DOI: 10.1007/s10562-014-1420-4] [Citation(s) in RCA: 47] [Impact Index Per Article: 4.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/20/2014] [Accepted: 11/04/2014] [Indexed: 11/21/2022]
Abstract
ABSTRACT Surface-enhanced Raman spectroscopy (SERS) and tip-enhanced Raman spectroscopy (TERS) were until recently limited in their applicability to the majority of heterogeneous catalytic reactions. Recent developments begin to resolve the conflicting experimental requirements for SERS and TERS on the one hand, and heterogeneous catalysis on the other hand. This article discusses the development and use of SERS and TERS to study heterogeneous catalytic reactions, and the exciting possibilities that may now be within reach thanks to the latest technical developments. This will be illustrated with showcase examples from photo- and electrocatalysis. GRAPHICAL ABSTRACT
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Characterizing the S-layer structure and anti-S-layer antibody recognition on intact Tannerella forsythia cells by scanning probe microscopy and small angle X-ray scattering. J Mol Recognit 2014; 26:542-9. [PMID: 24089361 DOI: 10.1002/jmr.2298] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/10/2013] [Revised: 07/08/2013] [Accepted: 07/11/2013] [Indexed: 11/07/2022]
Abstract
Tannerella forsythia is among the most potent triggers of periodontal diseases, and approaches to understand underlying mechanisms are currently intensively pursued. A ~22-nm-thick, 2D crystalline surface (S-) layer that completely covers Tannerella forsythia cells is crucially involved in the bacterium-host cross-talk. The S-layer is composed of two intercalating glycoproteins (TfsA-GP, TfsB-GP) that are aligned into a periodic lattice. To characterize this unique S-layer structure at the nanometer scale directly on intact T. forsythia cells, three complementary methods, i.e., small-angle X-ray scattering (SAXS), atomic force microscopy (AFM), and single-molecular force spectroscopy (SMFS), were applied. SAXS served as a difference method using signals from wild-type and S-layer-deficient cells for data evaluation, revealing two possible models for the assembly of the glycoproteins. Direct high-resolution imaging of the outer surface of T. forsythia wild-type cells by AFM revealed a p4 structure with a lattice constant of ~9.0 nm. In contrast, on mutant cells, no periodic lattice could be visualized. Additionally, SMFS was used to probe specific interaction forces between an anti-TfsA antibody coupled to the AFM tip and the S-layer as present on T. forsythia wild-type and mutant cells, displaying TfsA-GP alone. Unbinding forces between the antibody and wild-type cells were greater than with mutant cells. This indicated that the TfsA-GP is not so strongly attached to the mutant cell surface when the co-assembling TfsB-GP is missing. Altogether, the data gained from SAXS, AFM, and SMFS confirm the current model of the S-layer architecture with two intercalating S-layer glycoproteins and TfsA-GP being mainly outwardly oriented.
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Micromechanical mapping of early osteoarthritic changes in the pericellular matrix of human articular cartilage. Osteoarthritis Cartilage 2013; 21:1895-903. [PMID: 24025318 PMCID: PMC3856176 DOI: 10.1016/j.joca.2013.08.026] [Citation(s) in RCA: 89] [Impact Index Per Article: 8.1] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Submit a Manuscript] [Subscribe] [Scholar Register] [Received: 04/28/2013] [Revised: 08/26/2013] [Accepted: 08/29/2013] [Indexed: 02/02/2023]
Abstract
OBJECTIVE Osteoarthritis (OA) is a degenerative joint disease characterized by the progressive loss of articular cartilage. While macroscale degradation of the cartilage extracellular matrix (ECM) has been extensively studied, microscale changes in the chondrocyte pericellular matrix (PCM) and immediate microenvironment with OA are not fully understood. The objective of this study was to quantify osteoarthritic changes in the micromechanical properties of the ECM and PCM of human articular cartilage in situ using atomic force microscopy (AFM). METHOD AFM elastic mapping was performed on cryosections of human cartilage harvested from both condyles of macroscopically normal and osteoarthritic knee joints. This method was used to test the hypotheses that both ECM and PCM regions exhibit a loss of mechanical properties with OA and that the size of the PCM is enlarged in OA cartilage as compared to normal tissue. RESULTS Significant decreases were observed in both ECM and PCM moduli of 45% and 30%, respectively, on the medial condyle of OA knee joints as compared to cartilage from macroscopically normal joints. Enlargement of the PCM, as measured biomechanically, was also observed in medial condyle OA cartilage, reflecting the underlying distribution of type VI collagen in the region. No significant differences were observed in elastic moduli or their spatial distribution on the lateral condyle between normal and OA joints. CONCLUSION Our findings provide new evidence of significant site-specific degenerative changes in the chondrocyte micromechanical environment with OA.
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Atomic force microscopy application in biological research: a review study. IRANIAN JOURNAL OF MEDICAL SCIENCES 2013; 38:76-83. [PMID: 23825885 PMCID: PMC3700051] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/07/2011] [Revised: 04/02/2012] [Accepted: 06/10/2012] [Indexed: 11/15/2022]
Abstract
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, including measuring friction, adhesion forces and viscoelastic properties as well as determining the Young modulus and imaging magnetic or electrostatic properties. The AFM technique can analyze any kind of samples such as polymers, adsorbed molecules, films or fibers, and powders in the air whether in a controlled atmosphere or in a liquid medium. In the past decade, the AFM has emerged as a powerful tool to obtain the nanostructural details and biomechanical properties of biological samples, including biomolecules and cells. The AFM applications, techniques, and -in particular- its ability to measure forces, are not still familiar to most clinicians. This paper reviews the literature on the main principles of the AFM modality and highlights the advantages of this technique in biology, medicine, and- especially- dentistry. This literature review was performed through E-resources, including Science Direct, PubMed, Blackwell Synergy, Embase, Elsevier, and Scholar Google for the references published between 1985 and 2010.
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Piezo-thermal Probe Array for High Throughput Applications. SENSORS AND ACTUATORS. A, PHYSICAL 2012; 186:125-129. [PMID: 23641125 PMCID: PMC3638734 DOI: 10.1016/j.sna.2012.03.033] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/11/2023]
Abstract
Microcantilevers are used in a number of applications including atomic-force microscopy (AFM). In this work, deflection-sensing elements along with heating elements are integrated onto micromachined cantilever arrays to increase sensitivity, and reduce complexity and cost. An array of probes with 5-10 nm gold ultrathin film sensors on silicon substrates for high throughput scanning probe microscopy is developed. The deflection sensitivity is 0.2 ppm/nm. Plots of the change in resistance of the sensing element with displacement are used to calibrate the probes and determine probe contact with the substrate. Topographical scans demonstrate high throughput and nanometer resolution. The heating elements are calibrated and the thermal coefficient of resistance (TCR) is 655 ppm/K. The melting temperature of a material is measured by locally heating the material with the heating element of the cantilever while monitoring the bending with the deflection sensing element. The melting point value measured with this method is in close agreement with the reported value in literature.
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Nanoscale Visualization of Elastic Inhomogeneities at TiN Coatings Using Ultrasonic Force Microscopy. NANOSCALE RESEARCH LETTERS 2009; 4:1493-1501. [PMID: 20652153 PMCID: PMC2894194 DOI: 10.1007/s11671-009-9426-3] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 05/26/2009] [Accepted: 08/18/2009] [Indexed: 05/29/2023]
Abstract
Ultrasonic force microscopy has been applied to the characterization of titanium nitride coatings deposited by physical vapor deposition dc magnetron sputtering on stainless steel substrates. The titanium nitride layers exhibit a rich variety of elastic contrast in the ultrasonic force microscopy images. Nanoscale inhomogeneities in stiffness on the titanium nitride films have been attributed to softer substoichiometric titanium nitride species and/or trapped subsurface gas. The results show that increasing the sputtering power at the Ti cathode increases the elastic homogeneity of the titanium nitride layers on the nanometer scale. Ultrasonic force microscopy elastic mapping on titanium nitride layers demonstrates the capability of the technique to provide information of high value for the engineering of improved coatings.
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