Self-compensation methodology for ultrasonic thickness gauges

There are many causes for the reduction of the thickness in pipelines, tanks and other mechanical structures. Corrosion, erosion, and abrasive wear cause degradation of mechanical structures and decrease their lifespan. These can be very slow processes that are difficult to track over time. Thickness gauging monitoring is commonly used as a way of preventive maintenance. The pulse-echo ultrasound can be a suitable technique to measure the thickness diminution in industrial facilities. Although ultrasound is considered a robust technique, in this particular application it presents two main difficulties: the mechanical stability of the assembly and the variation of the ultrasonic speed over time. Both mechanical assembly and acoustic propagation speed are strongly influenced by the temperature. In this paper, the implementation of a methodology that compensates for the temperature influences on the ultrasonic speed and the mechanical assembly is presented. The methodology can be applied in metallic structures to evaluate corrosion over long time periods. The temperature compensation data is obtained from the analysis of the ultrasonic signals. In this sense, the method can be called self-compensated. As initial data for the determination of thickness changes, the ultrasonic speed in the material at a reference temperature must be known. All results are evaluated at this temperature. An analysis of the uncertainty sources and limitations of the methodology is also included. To show the experimental application of the proposed technique, a rigid sample was designed in order to avoid mechanical instability. The results show that the methodology can compensate for the temperature, detecting a thickness reduction in the order of a few micrometers.

Systematic measuring cortical thickness in tibiae for bio-mechanical analysis

BACKGROUND AND OBJECTIVE

Measuring the thickness of cortical bone tissue helps diagnose bone diseases or monitor the progress of different treatments. This type of measurement can be performed visually from CAT images by a radiologist or by semi-automatic algorithms from Hounsfield values. This article proposes a mechanism capable of measuring thickness over the entire bone surface, aligning and orienting all the images in the same direction to have comparable references and reduce human intervention to a minimum. The objective is to batch process large numbers of patients' CAT images obtaining thicknesses profiles of their cortical tissue to be used in many applications.

METHODS

Classical morphological and Deep Learning segmentation is used to extract the area of interest, filtering and interpolation to clean the bones and contour detection and Signed Distance Functions to measure the cortical Thickness. The alignment of the set of bones is achieved by detecting their longitudinal direction, and the orientation is performed by computing their principal component of the center of mass slice.

RESULTS

The method processed in an unattended manner 67% of the patients in the first run and 100% in the second run. The difference in the thickness values between the values provided by the algorithm and the measures done by a radiologist was, on average, 0.25 millimetres with a standard deviation of 0.2.

CONCLUSION

Measuring the cortical thickness of a bone would allow us to prepare accurate traumatological surgeries or study their structural properties. Obtaining thickness profiles of an extensive set of patients opens the way for numerous studies to be carried out to find patterns between bone thickness and the patients' medical, social or demographic variables.

Coupling characteristics analysis of micro-emulsion cutting fluid for thickness on-machine measurement using ultrasonic

Stable and reliable coupling state between piezoelectric ultrasonic transducer and tested workpiece is very important for ultrasonic measurement. Traditional coupling agents need to be smeared manually or recycled separately, which cannot meet the requirement of on-machine thickness measurement by ultrasonic. Herein, a suitable coupling agent is selected for thickness on-machine measurement in industrial application of ultrasonics. The acoustic impedance and the attenuation coefficient are adopted to characterize the coupling effect of coupling agents and appropriate coupled flow field is selected theoretically. The experimental system of ultrasonic on-machine measurement is established with external circulating jet. The coupling characteristics of machining coolant liquid is calculated and analyzed. From experimental comparison with commonly used coupling agents, it is indicated that the micro-emulsion cutting fluid with volume concentration from 8% to 10% could be selected as compatible coupling agent for ultrasonic on-machine measurement, because it can not only meet the ultrasonic measurement requirements, but also perform friendly to industrial environment.

Ultrasonic thickness measurement of nonporous membranes with long wavelengths

A new thickness measurement technique is described in which air-coupled ultrasound is used to interrogate nonporous membranes at relatively long wavelengths. The thru-transmission technique compares a reference signal taken with the membrane absent to a material signal acquired when the membrane is present in the transducer's wave field. The technique uses both amplitude and phase information from the signals' frequency spectra to find the membrane's thickness along with its surface density. No a priori knowledge of the membrane's material properties is needed. The technique is experimentally verified by estimating the thicknesses of a number of metallic and non-metallic sheet-like materials. Thicknesses are typically measured to within 6% of their nominal values and the technique spans a range of roughly 10-100 μm.

Non-invasive three-dimensional thickness analysis of oral epithelium based on optical coherence tomography-development and diagnostic performance

Objectives

Evaluating structural changes in oral epithelium can assist with the diagnosis of cancerous lesions. Two-dimensional (2D) non-invasive optical coherence tomography (OCT) is an established technique for this purpose. The objective of this study was to develop and test the diagnostic accuracy of a three-dimensional (3D) evaluation method.

Methods

The oral lip mucosa of 10 healthy volunteers was scanned using an 870-nm spectral-domain OCT device (SD-OCT) with enhanced depth imaging (EDI). Four raters semi-automatically segmented the epithelial layer twice. Thus, eighty 3D datasets were created and analyzed for epithelial thickness. To provide a reference standard for comparison, the raters took cross-sectional 2D measurements at representative sites. The correlation between the 2D and 3D measurements, as well as intra- and inter-rater reliability, were analyzed using intraclass correlation coefficients (ICC).

Results

Mean epithelial thickness was 280 ± 64μm (range 178–500 μm) and 268 ± 49μm (range 163–425 μm) for the 2D and 3D analysis, respectively. The inter-modality correlation of the thickness values was good (ICC: 0.76 [0.626–0.846]), indicating that 3D analysis of epithelial thickness provides valid results. Intra-rater and inter-rater reliability were good (3D analysis) and excellent (2D analysis), suggesting high reproducibility.

Conclusions

Diagnostic accuracy was high for the developed 3D analysis of oral epithelia using non-invasive, radiation-free OCT imaging.

Clinical significance

This new 3D technique could potentially be used to improve time-efficiency and quality in the diagnosis of epithelial lesions compared with the 2D reference standard.

Thickness measurement via local ultrasonic resonance spectroscopy

Local ultrasonic resonance spectroscopy (LURS) is a new approach to material inspection, where the specimen is locally excited by a short mechanical impulse while its local mechanical response is recorded at a position nearby. The local material and geometrical properties can be extracted from the frequency spectrum of the response and visualized by performing a scan over the inspected area. In our experiment, the plate thickness and the reliefs of both plate surfaces (plate curvature) were obtained from thickness resonance and time of arrival analysis without physical contact to the specimen. Ultrasound was generated on the specimen surface by a laser pulse. Local mechanical response of a carbon fiber-reinforced polymer plate with a thickness ranging from 0.6 mm to 4.3 mm was recorded with a broadband optical microphone in through-transmission setup. The precision of this arrangement greatly exceeded the precision of conventional methods limited by the ultrasound wavelength. For thicknesses in the range around 1 mm, standard deviations of up to several µm were achieved. An influence of the through-plate ultrasound velocity on the measured relief of the plate surface nearest to the optical microphone was eliminated by a joint evaluation of thickness resonance and time of arrival. Furthermore, we demonstrated that internal delaminations have an influence on the spectrum of the local mechanical response and can therefore be detected by LURS.

Thickness determination of metal multilayers by ED-XRF multivariate analysis using Monte Carlo simulated standards

We present the thickness measurement of multilayer samples by X-ray fluorescence (XRF) using calibration curves obtained from simulated spectra through Monte Carlo (MC) algorithm. The XRF is a widespread technique for the analysis of single and multilayer films but the accuracy of quantitative analysis must be increased. Moreover, the use certified standards is not easy to implement due to the high variability of combination and/or concentration in layered samples. The results of this work were compared with fundamental parameter (FP) method and focussed ion beam scanning electron microscopy (FIB-SEM) analysis. The results show good quantitative values even without the use of any standard with known thickness. In addition to having built the calibration curves with a simple univariate approach, also multivariate data analysis was performed to consider multiple variables simultaneously. From the comparison of the obtained results, it can be inferred that the univariate analysis worked well in the case of single layer samples and in the determination of the upper layer in multilayer samples but only multivariate analysis, taking into account the matrix effect of each layer, provided maximum accuracy on each layer of multilayer samples.

Comparative study on the specimen thickness measurement using EELS and CBED methods

Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-Möllenstedt (K-M) fringe of the \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$ \mathbf{13}\overline{\mathbf{1}} $$\end{document}131¯ diffracted disk of austenite was analyzed to evaluate the thickness. The results prove the good coherency between both methods in the thickness range of 72 ~ 113 nm with a difference of less than 5%.

Measuring the areal density of nanomaterials by electron energy-loss spectroscopy

Thickness measurements of nanomaterials are usually performed using transmission electron microscopy (TEM) techniques such as convergent beam electron diffraction (CBED) patterns analysis and the log-ratio method based on electron energy-loss spectroscopy (EELS) spectrum. However, it is challenging to obtain both the thickness and elemental information, especially in non-crystalline materials or for very thin samples. In this work, we establish a series of procedures to calculate the areal density of the material by directly measuring the inelastic scattering probability in a thin sample. Core-loss EELS are fit with a quantitative model to extract atomic areal density. Knowledge of one of the parameters (volume density or sample thickness) allows a measurement of the other. The absolute error between the known thicknesses and those measured was less than 4% using two-dimensional materials with a well-defined thickness as test samples, which is much better than the log-ratio method for very thin samples. One promising advantage of this method is the thickness/areal density determination in mixed phase/element systems. We use Ag-Co bimetallic triangles and black rutile as examples to calculate the thickness map in mixture systems in different cases. We also demonstrate this technique can be applied to measure the argon gas density in spherical cavities. This allows a temperature vs pressure curve to be obtained and illustrates the unique capability of this technique.

Monte Carlo simulation and theoretical calculation of SEM image intensity and its application in thickness measurement

The intensity profiles of backscattered and secondary electrons from a pure Mg sample have shown a variation with sample thickness and acceleration voltage in the range of 5-30 kV, depending on the specimen holder used. The intensities of backscattered electron (BSE) and secondary electron (SE) signals increases with the sample thickness until saturation when using a scanning transmission electron microscopy (STEM) holder with a closed tube below the sample. However the SE signal increases to the maximum and then decreases with the sample thickness when using a transmission Kikuchi diffraction (TKD) holder with no shielding below the sample whereas the BSE signal again increases until saturation. The influence of the holder on the SE signals is caused by the fact that secondary electrons emitted from the bottom surface could be detected only when using the TKD holder but not the STEM holder. The experimental results obtained are consistent with the Monte Carlo simulation results. Application of the magnitude of the SE and BSE signals to measurement of sample thickness has been considered and the BSE image profile shows a reasonably good accuracy.

Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric

Position-averaged convergent beam electron diffraction patterns are formed by averaging the transmission diffraction pattern while scanning an atomically-fine electron probe across a sample. Visual comparison between experimental and simulated patterns is increasingly being used for sample thickness determination. We explore automating the comparison via a simple sum square difference metric. The thickness determination is shown to be accurate (i.e. the best-guess deduced thickness generally concurs with the true thickness), though factors such as noise, mistilt and inelastic scattering reduce the precision (i.e. increase the uncertainty range). Notably, the precision tends to be higher for smaller probe-forming aperture angles.

Absolute thickness measurement of pyrolytic graphite spheroids by STEM-EELS

This paper studies the absolute thickness measurement of pyrolytic graphite spheroids (GSs) by using STEM-EELS mode with log-ratio method and Kramers-Kroning (K-K) method, taking the measured thickness from TEM image as reference that is the diameter of GSs ranging from 60 to 250nm. The effect of collection semi-angle (β) on thickness measurement has been investigated. It is found that in general the thickness obtained by K-K analysis with surface effect corrected shows the best accuracy, followed by K-K sum rule and then log-ratio method for the three different collection semi-angles of 12.4, 17.3 and 21.1mrad applied. Of these angles, the smallest one gives an overestimated result and the largest one gives an underestimated result, whereas between the two, the angle of 17.3mrad that is about 2x convergence semi-angle (9.0mrad) is identified as more appropriate for K-K analysis. The surface-scattering correction, inelastic mean free path of GS and effect of refractive index n on thickness measurement for different β angles are also investigated. Moreover, the optical property deduced from the data collected at the center of graphite spheroid, which is related to its microstructure, is characterized by K-K analysis.

Thickness measurement of soft thin films on periodically patterned magnetic substrates by phase difference magnetic force microscopy

The need for accurate measurement of the thickness of soft thin films is continuously encouraging the development of techniques suitable for this purpose. We propose a method through which the thickness of the film is deduced from the quantitative measurement of the contrast in the phase images of the sample surface acquired by magnetic force microscopy, provided that the film is deposited on a periodically patterned magnetic substrate. The technique is demonstrated by means of magnetic substrates obtained from standard floppy disks. Colonies of Staphylococcus aureus adherent to such substrates were used to obtain soft layers with limited lateral (a few microns) and vertical (hundreds of nanometers) size. The technique is described and its specific merits, limitations and potentialities in terms of accuracy and measurable thickness range are discussed. These parameters depend on the characteristics of the sensing tip/cantilever as well as of the substrates, the latter in terms of spatial period and homogeneity of the magnetic domains. In particular, with the substrates used in this work we evaluated an uncertainty of about 10%, a limit of detection of 50-100 nm and an upper detection limit (maximum measurable thickness) of 1 μm, all obtained with standard lift height values (50-100 nm). Nonetheless, these parameters can be easily optimized by selecting/realizing substrates with suitable spacing and homogeneity of the magnetic domains. For example, the upper detection limit can be increased up to 25-50 μm while the limit of detection can be reduced to a few tens of nanometers or a few nanometers.