Characterization of ion-exchanged planar microlenses by ray tracing.
APPLIED OPTICS 1988;
27:468-471. [PMID:
20523623 DOI:
10.1364/ao.27.000468]
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Abstract
For the design and optimization of the fabrication condition of distributed-index planar microlenses, it is necessary to evaluate the N. A., focal length, focused spot, and aberration of a fabricated lens. In this paper, a ray tracing method is improved for this purpose, and properties of planar microlenses aie evaluated. An ion concentration matrix is proposed to simplify lens design.
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