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Antonova IV, Seleznev VA, Nebogatikova NA, Ivanov AI, Voloshin BV, Volodin VA, Kurkina II. Thin V 2O 5 films synthesized by plasma-enhanced atomic layer deposition for memristive applications. Phys Chem Chem Phys 2023; 25:32132-32141. [PMID: 37986588 DOI: 10.1039/d3cp03761d] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2023]
Abstract
In the present study, the V2O5 films synthesized by plasma-enhanced atomic layer deposition on p-Si and fluorinated graphene on Si (or FG/Si) substrates were analyzed for memristive applications. A number of samples were grown with V2O5 films with an average thickness of 1.0-10.0 nm, as determined by ellipsometric measurements. The study of surface morphology by atomic force microscopy showed that an island growth occurs in the initial stages of the film growth. The Raman spectra of the synthesized V2O5 films with an average thickness of more than 2.0 nm on the SiO2/Si substrates exhibit six distinct modes typical of the orthorhombic V2O5 phase. A large hysteresis was found in the C-V characteristics of the V2O5 films with a thickness of 1.0-4.2 nm. In general, the built-in charge in the V2O5 layers with an average thickness of 1.0-4.0 nm is positive and has a value of about ∼(2-8) × 1011 cm-2 at the 1 MHz frequency. Increasing the V2O5 film thickness leads to the accumulation of negative built-in charge up to -(1.7 to 2.3) × 1011 cm-2 at the 1 MHz frequency. The temperature dependence of the conductivity exhibits different electrically active states in V2O5/Si and V2O5/FG/Si structures. Thus, the FG layer can modify these states. V2O5 layers with an average film thickness of 1.0-3.6 nm demonstrate the memristive switching with an ON/OFF ratio of ∼1-4 orders of magnitude. At film thicknesses above 5.0 nm, the memristive switching practically vanishes. V2O5 films with an average thickness of 3.6 nm were found to be particularly stable and promising for memristive switching applications.
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Affiliation(s)
- Irina V Antonova
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev aven., Novosibirsk 630090, Russia.
- Novosibirsk State Technical University, 20 K. Marx str., Novosibirsk 630073, Russia
| | - Vladimir A Seleznev
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev aven., Novosibirsk 630090, Russia.
| | - Nadezhda A Nebogatikova
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev aven., Novosibirsk 630090, Russia.
| | - Artem I Ivanov
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev aven., Novosibirsk 630090, Russia.
| | - Bogdan V Voloshin
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev aven., Novosibirsk 630090, Russia.
| | - Vladimir A Volodin
- Rzhanov Institute of Semiconductor Physics SB RAS, 13 Lavrentiev aven., Novosibirsk 630090, Russia.
- Physical Department, Novosibirsk State University, 1 Pirogov str., Novosibirsk 630090, Russia
| | - Irina I Kurkina
- Institute of Physics and Technologies, North-Eastern Federal University, 58 Belinsky str., Yakutsk 677027, Russia
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Zhao J, Tong L, Niu J, Fang Z, Pei Y, Zhou Z, Sun Y, Wang Z, Wang H, Lou J, Yan X. A bidirectional thermal sensory leaky integrate-and-fire (LIF) neuron model based on bipolar NbO x volatile threshold devices with ultra-low operating current. NANOSCALE 2023; 15:17599-17608. [PMID: 37874690 DOI: 10.1039/d3nr03034b] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 10/26/2023]
Abstract
Brain-like artificial intelligence (AI) will become the main form and important platform in future computing. It will play an important and unique role in simulating brain functions, efficiently implementing AI algorithms, and improving computing power. Developing artificial neurons that can send facilitation/depression signals to artificial synapses, sense, and process temperature information is of great significance for achieving more efficient and compact brain-like computing systems. Herein, we have constructed a NbOx bipolar volatile threshold memristor, which could be operated by 1 μA ultra-low current and up to ∼104 switching ratios. By using a leaky integrate-and-fire (LIF) artificial neuron model, a bipolar LIF artificial neuron is constructed, which can realize the conventional threshold-driven firing, all-or-nothing spiking, refractory periods, and intensity-modulated frequency response bidirectionally at the positive/negative voltage stimulation, which will give the artificial synapse facilitation/depression signals. Furthermore, this bipolar LIF neuron can also explore different temperatures to output different signals, which could be constructed as a more compact thermal sensory neuron to avoid external harm to artificial robots. This study is of great significance for improving the computational efficiency of the system more effectively, achieving high integration density and low energy consumption artificial neural networks to meet the needs of brain-like neural computing.
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Affiliation(s)
- Jianhui Zhao
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Liang Tong
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Jiangzhen Niu
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Ziliang Fang
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Yifei Pei
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Physics Science and Technology, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China
| | - Zhenyu Zhou
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Yong Sun
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Zhongrong Wang
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Hong Wang
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Jianzhong Lou
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
| | - Xiaobing Yan
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Electronic and Information Engineering, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China.
- Key Laboratory of Brain-Like Neuromorphic Devices and Systems of Hebei Province, College of Physics Science and Technology, Institute of Life Science and Green Development, Hebei University, Baoding 071002, China
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3
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Ding G, Zhao J, Zhou K, Zheng Q, Han ST, Peng X, Zhou Y. Porous crystalline materials for memories and neuromorphic computing systems. Chem Soc Rev 2023; 52:7071-7136. [PMID: 37755573 DOI: 10.1039/d3cs00259d] [Citation(s) in RCA: 14] [Impact Index Per Article: 14.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 09/28/2023]
Abstract
Porous crystalline materials usually include metal-organic frameworks (MOFs), covalent organic frameworks (COFs), hydrogen-bonded organic frameworks (HOFs) and zeolites, which exhibit exceptional porosity and structural/composition designability, promoting the increasing attention in memory and neuromorphic computing systems in the last decade. From both the perspective of materials and devices, it is crucial to provide a comprehensive and timely summary of the applications of porous crystalline materials in memory and neuromorphic computing systems to guide future research endeavors. Moreover, the utilization of porous crystalline materials in electronics necessitates a shift from powder synthesis to high-quality film preparation to ensure high device performance. This review highlights the strategies for preparing porous crystalline materials films and discusses their advancements in memory and neuromorphic electronics. It also provides a detailed comparative analysis and presents the existing challenges and future research directions, which can attract the experts from various fields (e.g., materials scientists, chemists, and engineers) with the aim of promoting the applications of porous crystalline materials in memory and neuromorphic computing systems.
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Affiliation(s)
- Guanglong Ding
- Institute for Advanced Study, Shenzhen University, Shenzhen, China.
| | - JiYu Zhao
- Institute for Advanced Study, Shenzhen University, Shenzhen, China.
- State Key Laboratory of Fine Chemicals, Frontiers Science Center for Smart Materials, Dalian University of Technology, Dalian 116024, China
- State Key Laboratory of Fine Chemicals, College of Materials Science and Engineering, Shenzhen University, Shenzhen 518060, China
| | - Kui Zhou
- Institute for Advanced Study, Shenzhen University, Shenzhen, China.
| | - Qi Zheng
- Institute for Advanced Study, Shenzhen University, Shenzhen, China.
| | - Su-Ting Han
- College of Electronics and Information Engineering, Shenzhen University, Shenzhen, 518060, China
| | - Xiaojun Peng
- State Key Laboratory of Fine Chemicals, Frontiers Science Center for Smart Materials, Dalian University of Technology, Dalian 116024, China
- State Key Laboratory of Fine Chemicals, College of Materials Science and Engineering, Shenzhen University, Shenzhen 518060, China
| | - Ye Zhou
- Institute for Advanced Study, Shenzhen University, Shenzhen, China.
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Schofield P, Bradicich A, Gurrola RM, Zhang Y, Brown TD, Pharr M, Shamberger PJ, Banerjee S. Harnessing the Metal-Insulator Transition of VO 2 in Neuromorphic Computing. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2023; 35:e2205294. [PMID: 36036767 DOI: 10.1002/adma.202205294] [Citation(s) in RCA: 19] [Impact Index Per Article: 19.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/12/2022] [Revised: 08/02/2022] [Indexed: 06/15/2023]
Abstract
Future-generation neuromorphic computing seeks to overcome the limitations of von Neumann architectures by colocating logic and memory functions, thereby emulating the function of neurons and synapses in the human brain. Despite remarkable demonstrations of high-fidelity neuronal emulation, the predictive design of neuromorphic circuits starting from knowledge of material transformations remains challenging. VO2 is an attractive candidate since it manifests a near-room-temperature, discontinuous, and hysteretic metal-insulator transition. The transition provides a nonlinear dynamical response to input signals, as needed to construct neuronal circuit elements. Strategies for tuning the transformation characteristics of VO2 based on modification of material properties, interfacial structure, and field couplings, are discussed. Dynamical modulation of transformation characteristics through in situ processing is discussed as a means of imbuing synaptic function. Mechanistic understanding of site-selective modification; external, epitaxial, and chemical strain; defect dynamics; and interfacial field coupling in modifying local atomistic structure, the implications therein for electronic structure, and ultimately, the tuning of transformation characteristics, is emphasized. Opportunities are highlighted for inverse design and for using design principles related to thermodynamics and kinetics of electronic transitions learned from VO2 to inform the design of new Mott materials, as well as to go beyond energy-efficient computation to manifest intelligence.
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Affiliation(s)
- Parker Schofield
- Department of Chemistry, Texas A&M University, College Station, TX, 77843, USA
- Department of Materials Science and Engineering, Texas A&M University, College Station, TX, 77843, USA
| | - Adelaide Bradicich
- Department of Materials Science and Engineering, Texas A&M University, College Station, TX, 77843, USA
| | - Rebeca M Gurrola
- Department of Materials Science and Engineering, Texas A&M University, College Station, TX, 77843, USA
| | - Yuwei Zhang
- Department of Mechanical Engineering, Texas A&M University, College Station, TX, 77843, USA
| | | | - Matt Pharr
- Department of Mechanical Engineering, Texas A&M University, College Station, TX, 77843, USA
| | - Patrick J Shamberger
- Department of Materials Science and Engineering, Texas A&M University, College Station, TX, 77843, USA
| | - Sarbajit Banerjee
- Department of Chemistry, Texas A&M University, College Station, TX, 77843, USA
- Department of Materials Science and Engineering, Texas A&M University, College Station, TX, 77843, USA
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5
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Ye X, Zhu X, Yang H, Duan J, Gao S, Sun C, Liu X, Li RW. Selective Dual-Ion Modulation in Solid-State Magnetoelectric Heterojunctions for In-Memory Encryption. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2023; 19:e2206824. [PMID: 36683213 DOI: 10.1002/smll.202206824] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/04/2022] [Revised: 01/03/2023] [Indexed: 06/17/2023]
Abstract
Nanoionic technologies are identified as a promising approach to modulating the physical properties of solid-state dielectrics, which have resulted in various emergent nanodevices, such as nanoionic resistive switching devices and magnetoionic devices for memory and computing applications. Previous studies are limited to single-type ion manipulation, and the investigation of multiple-type ion modulation on the coupled magnetoelectric effects, for developing information devices with multiple integrated functionalities, remains elusive. Here, a dual-ion solid-state magnetoelectric heterojunction based on Pt/HfO2- x /NiOy /Ni with reconfigurable magnetoresistance (MR) characteristics is reported for in-memory encryption. It is shown that the oxygen anions and nickel cations can be selectively driven by voltages with controlled polarity and intensity, which concurrently change the overall electrical resistance and the interfacial magnetic coupling, thus significantly modulate the MR symmetry. Based on this device, a magnetoelectric memory prototype array with in-memory encryption functionality is designed for the secure storage of image and digit information. Along with the advantages including simple structure, multistate encryption, good reversibility, and nonvolatile modulation capability, this proof-of-concept device opens new avenues toward next-generation compact electronics with integrated information functionalities.
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Affiliation(s)
- Xiaoyu Ye
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- College of Materials Sciences and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing, 100049, China
| | - Xiaojian Zhu
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- College of Materials Sciences and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing, 100049, China
| | - Huali Yang
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Jipeng Duan
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- College of Materials Sciences and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing, 100049, China
| | - Shuang Gao
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Cui Sun
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Xuerong Liu
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
| | - Run-Wei Li
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, 315201, China
- College of Materials Sciences and Opto-Electronic Technology, University of Chinese Academy of Sciences, Beijing, 100049, China
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6
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Zhang W, Wu X, Li L, Zou C, Chen Y. Fabrication of a VO 2-Based Tunable Metasurface by Electric-Field Scanning Probe Lithography with Precise Depth Control. ACS APPLIED MATERIALS & INTERFACES 2023; 15:13517-13525. [PMID: 36856296 DOI: 10.1021/acsami.2c21935] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/18/2023]
Abstract
Vanadium dioxide (VO2) is widely employed in developing tunable optoelectronic devices due to its significant changes in optical and electric properties upon phase transition. To fabricate the VO2-based functional devices down to the micro/nanoscale, a high-resolution processing technique is in demand. Scanning probe lithography (SPL) on the basis of a tip-induced electric field provides a promising approach for prototyping. Here, we demonstrated a precise VO2 etching strategy by direct writing on a VO2 film with a negative tip bias and subsequent sonication removal of the written area. The effects of bias voltage, sonication, and thermal treatment as well as the mechanical difference between the tip-modulated area and the pristine VO2 film were investigated systematically. The results show that VO2 can be etched layer by layer via alternately repeating tip modulation and sonication, and arbitrary patterns can be written. Based on this route, we designed a kind of metasurface by arranging VO2-gold nanoblocks with different sizes and heights for spectrally selective tunable reflectivity in near- and mid-infrared. This electric-field SPL method demonstrates the prominent advantages of high resolution down to several tens of nanometers, quasi-3D patterning, and resist-free maskless direct writing, which should be applicable for prototyping other micro/nanodevices.
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Affiliation(s)
- Wenhao Zhang
- Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230027, China
- Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei 230027, China
| | - Xiqi Wu
- Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230027, China
- Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei 230027, China
| | - Liang Li
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
| | - Chongwen Zou
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China
| | - Yuhang Chen
- Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, Hefei 230027, China
- Key Laboratory of Precision Scientific Instrumentation of Anhui Higher Education Institutes, University of Science and Technology of China, Hefei 230027, China
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7
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Mohebbi E, Pavoni E, Mencarelli D, Stipa P, Pierantoni L, Laudadio E. Insights into first-principles characterization of the monoclinic VO 2(B) polymorph via DFT + U calculation: electronic, magnetic and optical properties. NANOSCALE ADVANCES 2022; 4:3634-3646. [PMID: 36134342 PMCID: PMC9400504 DOI: 10.1039/d2na00247g] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/21/2022] [Accepted: 07/22/2022] [Indexed: 05/14/2023]
Abstract
We have studied the structural, electronic, magnetic, and optical properties of the VO2(B) polymorph using first-principles calculations based on density functional theory (DFT). This polymorph was found to display four optimized structures namely VO2(B)PP, VO2(B)LP, VO2(B)PPD, and VO2(B)LPD using the generalized gradient approximation (GGA) PBE exchange-correlation functional by including/excluding van der Waals interaction. Our derivation provides a theoretical justification for adding an on-site Coulomb U value in the conventional DFT calculations to allow a direct comparison of the two methods. We predicted a zero bandgap of the VO2(B) structure based on GGA/PBE. However, by GGA/PBE + U, we found accurate bandgap values of 0.76, 0.66, and 0.70 eV for VO2(B)PP, VO2(B)LP, and VO2(B)PPD, respectively. The results obtained from DFT + U were accompanied by a structural transition from the metallic to semiconductor property. Here, we verified the non-magnetic characteristic of the monoclinic VO2(B) phase with some available experimental and theoretical data. However, the debate on the magnetic property of this polymorph remains unresolved. Imaginary and real parts of the dielectric function, as computed with the GGA/PBE functional and the GGA/PBE + U functional, were also reported. The first absorption peaks of all considered geometries in the imaginary part of the dielectric constants indicated that the VO2(B) structure could perfectly absorb infrared light. The computed static dielectric constants with positive values, as derived from the optical properties, confirmed the conductivity of this material. Among the four proposed geometries of VO2(B) in this study, the outcomes obtained by VO2(B)PPD reveal good results owing to the excellent consistency of its bandgap, magnetic and optical properties with other experimental and theoretical observations. The theoretical framework in our study will provide useful insight for future practical applications of the VO2(B) polymorph in electronics and optoelectronics.
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Affiliation(s)
- Elaheh Mohebbi
- Department of Materials, Environmental Sciences and Urban Planning, Marche Polytechnic University 60131 Ancona Italy
| | - Eleonora Pavoni
- Department of Materials, Environmental Sciences and Urban Planning, Marche Polytechnic University 60131 Ancona Italy
| | - Davide Mencarelli
- Information Engineering Department, Marche Polytechnic University 60131 Ancona Italy
| | - Pierluigi Stipa
- Department of Materials, Environmental Sciences and Urban Planning, Marche Polytechnic University 60131 Ancona Italy
| | - Luca Pierantoni
- Information Engineering Department, Marche Polytechnic University 60131 Ancona Italy
| | - Emiliano Laudadio
- Department of Materials, Environmental Sciences and Urban Planning, Marche Polytechnic University 60131 Ancona Italy
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He R, Lin JL, Liu Q, Liao Z, Shui L, Wang ZJ, Zhong Z, Li RW. Emergent Ferroelectricity in Otherwise Nonferroelectric Oxides by Oxygen Vacancy Design at Heterointerfaces. ACS APPLIED MATERIALS & INTERFACES 2020; 12:45602-45610. [PMID: 32929952 DOI: 10.1021/acsami.0c13314] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Introducing point defects in complex metal oxides is a very effective route to engineer crystal symmetry and therefore control physical properties. However, the inversion symmetry breaking, which is vital for many tantalizing properties, such as ferroelectricity and chiral spin structure, is usually hard to be induced in the bulk crystal by point defects. By designing the oxygen vacancy formation energy profile and migration path across the oxide heterostructure, our first-principles density functional theory (DFT) calculations demonstrate that the point defects can effectively break the inversion symmetry and hence create novel ferroelectricity in superlattices consisting of otherwise nonferroelectric materials SrTiO3 and SrRuO3. This induced ferroelectricity can be significantly enhanced by reducing the SrTiO3 thickness. Inspired by theory calculation, SrTiO3/SrRuO3 superlattices were experimentally fabricated and are found to exhibit surprising strong ferroelectric properties. Our finding paves a simple and effective pathway to engineer the inversion symmetry and thus properties by point defect control in oxide heterostructures.
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Affiliation(s)
- Ri He
- Key Laboratory of Magnetic Materials Devices & Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
- School of Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou 510006, China
- International Academy of Optoelectronics at Zhaoqing, South China Normal University, Zhaoqing 526238, China
| | - Jun Liang Lin
- College of Light Industry, Liaoning University, Shenyang 110036, China
- School of Materials Science and Engineering, Northeastern University, Shenyang 110819, China
| | - Qing Liu
- Key Laboratory of Magnetic Materials Devices & Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
| | - Zhaoliang Liao
- National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026, China
| | - Lingling Shui
- School of Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou 510006, China
| | - Zhan Jie Wang
- School of Materials Science and Engineering, Shenyang University of Technology, Shenyang 110870, China
| | - Zhicheng Zhong
- Key Laboratory of Magnetic Materials Devices & Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
- China Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
| | - Run-Wei Li
- Key Laboratory of Magnetic Materials Devices & Zhejiang Province Key Laboratory of Magnetic Materials and Application Technology, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo 315201, China
- China Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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Shen Z, Zhao C, Qi Y, Xu W, Liu Y, Mitrovic IZ, Yang L, Zhao C. Advances of RRAM Devices: Resistive Switching Mechanisms, Materials and Bionic Synaptic Application. NANOMATERIALS (BASEL, SWITZERLAND) 2020; 10:E1437. [PMID: 32717952 PMCID: PMC7466260 DOI: 10.3390/nano10081437] [Citation(s) in RCA: 56] [Impact Index Per Article: 14.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/31/2020] [Revised: 07/15/2020] [Accepted: 07/19/2020] [Indexed: 11/24/2022]
Abstract
Resistive random access memory (RRAM) devices are receiving increasing extensive attention due to their enhanced properties such as fast operation speed, simple device structure, low power consumption, good scalability potential and so on, and are currently considered to be one of the next-generation alternatives to traditional memory. In this review, an overview of RRAM devices is demonstrated in terms of thin film materials investigation on electrode and function layer, switching mechanisms and artificial intelligence applications. Compared with the well-developed application of inorganic thin film materials (oxides, solid electrolyte and two-dimensional (2D) materials) in RRAM devices, organic thin film materials (biological and polymer materials) application is considered to be the candidate with significant potential. The performance of RRAM devices is closely related to the investigation of switching mechanisms in this review, including thermal-chemical mechanism (TCM), valance change mechanism (VCM) and electrochemical metallization (ECM). Finally, the bionic synaptic application of RRAM devices is under intensive consideration, its main characteristics such as potentiation/depression response, short-/long-term plasticity (STP/LTP), transition from short-term memory to long-term memory (STM to LTM) and spike-time-dependent plasticity (STDP) reveal the great potential of RRAM devices in the field of neuromorphic application.
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Affiliation(s)
- Zongjie Shen
- Department of Electrical and Electronic Engineering, Xi’an Jiaotong-Liverpool University, Suzhou 215123, China; (Z.S.); (Y.Q.); (C.Z.)
- Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3BX, UK;
| | - Chun Zhao
- Department of Electrical and Electronic Engineering, Xi’an Jiaotong-Liverpool University, Suzhou 215123, China; (Z.S.); (Y.Q.); (C.Z.)
- Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3BX, UK;
| | - Yanfei Qi
- Department of Electrical and Electronic Engineering, Xi’an Jiaotong-Liverpool University, Suzhou 215123, China; (Z.S.); (Y.Q.); (C.Z.)
- School of Electronic and Information Engineering, Xi’an Jiaotong University, Xi’an 710061, China
| | - Wangying Xu
- College of Materials Science and Engineering, Shenzhen University, Shenzhen 518060, China;
| | - Yina Liu
- Department of Mathematical Sciences, Xi’an Jiaotong-Liverpool University, Suzhou 215123, China;
| | - Ivona Z. Mitrovic
- Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3BX, UK;
| | - Li Yang
- Department of Chemistry, Xi’an Jiaotong-Liverpool University, Suzhou 215123, China;
| | - Cezhou Zhao
- Department of Electrical and Electronic Engineering, Xi’an Jiaotong-Liverpool University, Suzhou 215123, China; (Z.S.); (Y.Q.); (C.Z.)
- Department of Electrical Engineering and Electronics, University of Liverpool, Liverpool L69 3BX, UK;
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10
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Zhou X, Gu D, Li Y, Qin H, Jiang Y, Xu J. A high performance electroformed single-crystallite VO 2 threshold switch. NANOSCALE 2019; 11:22070-22078. [PMID: 31720651 DOI: 10.1039/c9nr08364b] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Threshold switches (TSs) are an effective approach for resolving the sneak path problem within a memristor array. VO2 is a promising material for fabricating high-performance TSs. Here we report a single crystal VO2-based TS device with high switching performance. The single crystal monoclinic VO2 channel is obtained by electroforming in a composite vanadium oxide film consisting of VO2, V2O5 and V3O7. The formation mechanism on single crystal VO2 is thoroughly investigated by means of X-ray diffraction, transmission electron microscopy, and Raman spectroscopy. The single crystal VO2-based TS device exhibits better switching performance than the polycrystalline monoclinic VO2 counterpart. The TS device based on a single crystal channel with the (2[combining macron]11) orientation exhibits a steep turn-on voltage slope of <0.5 mV dec-1, a fast switching speed of 23 ns, an excellent endurance over 109 cycles, a high Ion/Ioff ratio of 143 and a low sample-to-sample variance. The enhanced switching performance originates from the single crystal feature and specified crystal orientation.
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Affiliation(s)
- Xin Zhou
- School of Optoelectronic Information, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, China.
| | - Deen Gu
- School of Optoelectronic Information, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, China.
| | - Yatao Li
- School of Optoelectronic Information, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, China.
| | - Haoxin Qin
- School of Optoelectronic Information, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, China.
| | - Yadong Jiang
- School of Optoelectronic Information, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, China.
| | - Jimmy Xu
- School of Engineering, Brown University, 184 Hope Street, Providence, Rhode Island 02912, USA
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11
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Wang D, Yan S, Chen Q, He Q, Xiao Y, Tang M, Zheng X. Direct Observation of Structural Deformation Immunity for Understanding Oxygen Plasma Treatment-Enhanced Resistive Switching in HfO x-Based Memristive Devices. NANOMATERIALS (BASEL, SWITZERLAND) 2019; 9:E1355. [PMID: 31546659 PMCID: PMC6836033 DOI: 10.3390/nano9101355] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/23/2019] [Revised: 09/17/2019] [Accepted: 09/18/2019] [Indexed: 11/16/2022]
Abstract
Oxygen ions' migration is the fundamental resistive switching (RS) mechanism of the binary metal oxides-based memristive devices, and recent studies have found that the RS performance can be enhanced through appropriate oxygen plasma treatment (OPT). However, the lack of experimental evidence observed directly from the microscopic level of materials and applicable understanding of how OPT improves the RS properties will cause significant difficulties in its further application. In this work, we apply scanning probe microscope (SPM)-based techniques to study the OPT-enhanced RS performance in prototypical HfOx based memristive devices through in situ morphology and electrical measurements. It is first found that the structural deformations in HfOx nanofilm induced by migration of oxygen ions and interfacial electrochemical reactions can be recovered by OPT effectively. More importantly, such structural deformations no longer occur after OPT due to the strengthening in lattice structure, which directly illustrates the enhanced quantity of HfOx nanofilm and the nature of enhanced RS properties after OPT. Finally, the underlying mechanisms of OPT-enhanced RS performance are analyzed by the results of X-ray photoelectron spectroscopic (XPS) surface analysis. In the OPT-enhanced HfOx nanofilm, oxygen vacancies in crystalline regions can be remarkably reduced by active oxygen ions' implantation. The oxygen ions transport will depend considerably on the grain boundaries and OPT-enhanced lattice structure will further guarantee the stability of conductive filaments, both of which ensure the uniformity and repeatability in RS processes. This study could provide a scientific basis for improving RS performance of oxides-based memristive devices by utilizing OPT.
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Affiliation(s)
- Dong Wang
- School of Mechanical Engineering, Xiangtan University, Xiangtan 411105, China
| | - Shaoan Yan
- School of Mechanical Engineering, Xiangtan University, Xiangtan 411105, China.
- Key Laboratory of Welding Robot and Application Technology of Hunan Province, School of Mechanical Engineering, Xiangtan University, Xiangtan 411105, China.
| | - Qilai Chen
- School of Mechanical Engineering, Xiangtan University, Xiangtan 411105, China
| | - Qiming He
- Key Laboratory of Microelectronics Devices and Integration Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
| | - Yongguang Xiao
- School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China
| | - Minghua Tang
- School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China
| | - Xuejun Zheng
- School of Mechanical Engineering, Xiangtan University, Xiangtan 411105, China.
- Key Laboratory of Welding Robot and Application Technology of Hunan Province, School of Mechanical Engineering, Xiangtan University, Xiangtan 411105, China.
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12
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Yao Z, Pan L, Liu L, Zhang J, Lin Q, Ye Y, Zhang Z, Xiang S, Chen B. Simultaneous implementation of resistive switching and rectifying effects in a metal-organic framework with switched hydrogen bond pathway. SCIENCE ADVANCES 2019; 5:eaaw4515. [PMID: 31414048 PMCID: PMC6677547 DOI: 10.1126/sciadv.aaw4515] [Citation(s) in RCA: 53] [Impact Index Per Article: 10.6] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/20/2018] [Accepted: 06/27/2019] [Indexed: 05/30/2023]
Abstract
Resistive random-access memory (RRAM) has evolved as one of the most promising candidates for the next-generation memory, but bistability for information storage, simultaneous implementation of resistive switching and rectification effects, and a better understanding of switching mechanism are still challenging in this field. Herein, we report a RRAM device based on a chiral metal-organic framework (MOF) FJU-23-H2O with switched hydrogen bond pathway within its channels, exhibiting an ultralow set voltage (~0.2 V), a high ON/OFF ratio (~105), and a high rectification ratio (~105). It is not only the first MOF with voltage-gated proton conduction but also the first single material showing both rectifying and resistive switching effects. By single-crystal x-ray diffraction analyses, the mechanism of the resistive switching has been demonstrated.
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Affiliation(s)
- Zizhu Yao
- Fujian Provincial Key Laboratory of Polymer Materials, College of Chemistry and Materials Science, Fujian Normal University, 32 Shangsan Road, Fuzhou 350007, China
| | - Liang Pan
- School of Materials Science and Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore
| | - Lizhen Liu
- Fujian Provincial Key Laboratory of Polymer Materials, College of Chemistry and Materials Science, Fujian Normal University, 32 Shangsan Road, Fuzhou 350007, China
| | - Jindan Zhang
- Fujian Provincial Key Laboratory of Polymer Materials, College of Chemistry and Materials Science, Fujian Normal University, 32 Shangsan Road, Fuzhou 350007, China
| | - Quanjie Lin
- Fujian Provincial Key Laboratory of Polymer Materials, College of Chemistry and Materials Science, Fujian Normal University, 32 Shangsan Road, Fuzhou 350007, China
| | - Yingxiang Ye
- Fujian Provincial Key Laboratory of Polymer Materials, College of Chemistry and Materials Science, Fujian Normal University, 32 Shangsan Road, Fuzhou 350007, China
| | - Zhangjing Zhang
- Fujian Provincial Key Laboratory of Polymer Materials, College of Chemistry and Materials Science, Fujian Normal University, 32 Shangsan Road, Fuzhou 350007, China
| | - Shengchang Xiang
- Fujian Provincial Key Laboratory of Polymer Materials, College of Chemistry and Materials Science, Fujian Normal University, 32 Shangsan Road, Fuzhou 350007, China
| | - Banglin Chen
- Department of Chemistry, University of Texas at San Antonio, One UTSA Circle, San Antonio, TX 78249-0698, USA
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13
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Solid-State Electrochemical Process and Performance Optimization of Memristive Materials and Devices. CHEMISTRY 2019. [DOI: 10.3390/chemistry1010005] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022] Open
Abstract
As an emerging technology, memristors are nanoionic-based electrochemical systems that retains their resistance state based on the history of the applied voltage/current. They can be used for on-chip memory and storage, biologically inspired computing, and in-memory computing. However, the underlying physicochemical processes of memristors still need deeper understanding for the optimization of the device properties to meet the practical application requirements. Herein, we review recent progress in understanding the memristive mechanisms and influential factors for the optimization of memristive switching performances. We first describe the working mechanisms of memristors, including the dynamic processes of active metal ions, native oxygen ions and other active ions in ECM cells, VCM devices and ion gel-based devices, and the switching mechanisms in organic devices, along with discussions on the influential factors of the device performances. The optimization of device properties by electrode/interface engineering, types/configurations of dielectric materials and bias scheme is then illustrated. Finally, we discuss the current challenges and the future development of the memristor.
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14
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Zhang B, Fan F, Xue W, Liu G, Fu Y, Zhuang X, Xu XH, Gu J, Li RW, Chen Y. Redox gated polymer memristive processing memory unit. Nat Commun 2019; 10:736. [PMID: 30760719 PMCID: PMC6374435 DOI: 10.1038/s41467-019-08642-y] [Citation(s) in RCA: 40] [Impact Index Per Article: 8.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/19/2018] [Accepted: 01/23/2019] [Indexed: 11/22/2022] Open
Abstract
Memristors with enormous storage capacity and superior processing efficiency are of critical importance to overcome the Moore’s Law limitation and von Neumann bottleneck problems in the big data and artificial intelligence era. In particular, the integration of multifunctionalities into a single memristor promises an essential strategy of obtaining a high-performance electronic device that satisfies the nowadays increasing demands of data storage and processing. In this contribution, we report a proof-of-concept polymer memristive processing-memory unit that demonstrates programmable information storage and processing capabilities. By introducing redox active moieties of triphenylamine and ferrocene onto the pendants of fluorene skeletons, the conjugated polymer exhibits triple oxidation behavior and interesting memristive switching characteristics. Associated with the unique electrochemical and electrical behavior, the polymer device is capable of executing multilevel memory, decimal arithmetic operations of addition, subtraction, multiplication and division, as well as simple Boolean logic operations. Though designing conductive polymers for memory devices is attractive for future low-cost flexible electronics, a proof-of-concept device has yet to be realized. Here, the authors report a redox-gated polymer memristive processing unit with programmable multilevel storage and logic functionalities.
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Affiliation(s)
- Bin Zhang
- Key Laboratory for Advanced Materials, Institute of Applied Chemistry, School of Chemistry and Molecular Engineering, East China University of Science and Technology, Shanghai, 200237, China
| | - Fei Fan
- Key Laboratory for Advanced Materials, Institute of Applied Chemistry, School of Chemistry and Molecular Engineering, East China University of Science and Technology, Shanghai, 200237, China
| | - Wuhong Xue
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China.,CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China.,Key Laboratory of Magnetic Molecules and Magnetic Information Materials of Ministry of Education, School of Chemistry and Materials Science, Shanxi Normal University, Linfen, Shanxi, 041004, China
| | - Gang Liu
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China. .,CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China.
| | - Yubin Fu
- Center for Advancing Electronics Dresden (cfaed) & Department of Chemistry and Food Chemistry, Technische Universität Dresden, Dresden, 01062, Germany.
| | - Xiaodong Zhuang
- School of Chemistry and Chemical Engineering, Shanghai Jiao Tong University, Shanghai, 200240, China.,Center for Advancing Electronics Dresden (cfaed) & Department of Chemistry and Food Chemistry, Technische Universität Dresden, Dresden, 01062, Germany
| | - Xiao-Hong Xu
- Key Laboratory of Magnetic Molecules and Magnetic Information Materials of Ministry of Education, School of Chemistry and Materials Science, Shanxi Normal University, Linfen, Shanxi, 041004, China
| | - Junwei Gu
- Shaanxi Key Laboratory of Macromolecular Science and Technology, Department of Applied Chemistry, School of Science, Northwestern Polytechnical University, Xi'an, Shaanxi, 710072, China
| | - Run-Wei Li
- CAS Key Laboratory of Magnetic Materials and Devices, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, Ningbo, Zhejiang, 315201, China
| | - Yu Chen
- Key Laboratory for Advanced Materials, Institute of Applied Chemistry, School of Chemistry and Molecular Engineering, East China University of Science and Technology, Shanghai, 200237, China.
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15
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Chen QL, Liu G, Tang MH, Chen XH, Zhang YJ, Zheng XJ, Li RW. A univariate ternary logic and three-valued multiplier implemented in a nano-columnar crystalline zinc oxide memristor. RSC Adv 2019; 9:24595-24602. [PMID: 35527853 PMCID: PMC9069711 DOI: 10.1039/c9ra04119b] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/31/2019] [Accepted: 07/22/2019] [Indexed: 11/21/2022] Open
Abstract
Memristors, which feature small sizes, fast speeds, low power, CMOS compatibility and nonvolatile modulation of device resistance, are promising candidates for next-generation data storage and in-memory computing paradigms. Compared to the binary logics enabled by memristor devices, ternary logics with larger information-carrying capacity can provide higher computation efficiency with simple operation schemes, reduced circuit complexity and smaller chip areas. In this study, we report the fabrication of memristor devices based on nano-columnar crystalline ZnO thin films; they show symmetric and reliable multi-level resistive switching characteristics over three hundred cycles, which benefits the implementation of univariate ternary logic operations. Experimental results demonstrate that a three-valued logic complete set can be realized by the univariate operations of the present ZnO memristor device, and a ternary multiplier unit circuit is designed for potential applications. The present methodology can be beneficial for constructing future high-performance computation architectures. Memristors, which feature small sizes, fast speeds, low power, CMOS compatibility and nonvolatile modulation of device resistance, are promising candidates for next-generation data storage and in-memory computing paradigms.![]()
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Affiliation(s)
- Qi-Lai Chen
- School of Mechanical Engineering
- Xiangtan University
- Xiangtan
- 411105 China
- School of Chemical and Chemical Engineering
| | - Gang Liu
- School of Chemical and Chemical Engineering
- Shanghai Jiao Tong University
- Shanghai
- China
- Ningbo Institute of Materials Technology and Engineering
| | - Ming-Hua Tang
- School of Materials Science and Engineering
- Xiangtan University
- Xiangtan
- 411105 China
| | - Xin-Hui Chen
- School of Chemical and Chemical Engineering
- Shanghai Jiao Tong University
- Shanghai
- China
- Ningbo Institute of Materials Technology and Engineering
| | - Yue-Jun Zhang
- Faculty of Electrical Engineering and Computer Science
- Ningbo University
- Ningbo
- 315211 China
| | - Xue-Jun Zheng
- School of Mechanical Engineering
- Xiangtan University
- Xiangtan
- 411105 China
| | - Run-Wei Li
- Ningbo Institute of Materials Technology and Engineering
- Chinese Academy of Sciences
- Ningbo
- 315201 China
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16
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Ke Y, Wang S, Liu G, Li M, White TJ, Long Y. Vanadium Dioxide: The Multistimuli Responsive Material and Its Applications. SMALL 2018; 14:e1802025. [PMID: 30085392 DOI: 10.1002/smll.201802025] [Citation(s) in RCA: 48] [Impact Index Per Article: 8.0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/27/2018] [Revised: 06/24/2018] [Indexed: 05/12/2023]
Affiliation(s)
- Yujie Ke
- School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue Singapore 639798 Singapore
| | - Shancheng Wang
- School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue Singapore 639798 Singapore
| | - Guowei Liu
- School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue Singapore 639798 Singapore
| | - Ming Li
- School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue Singapore 639798 Singapore
- Key Laboratory of Materials Physics; Anhui Key Laboratory of Nanomaterials and Nanotechnology; Institute of Solid State Physics; Chinese Academy of Sciences; Hefei 230031 P. R. China
| | - Timothy J. White
- School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue Singapore 639798 Singapore
| | - Yi Long
- School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue Singapore 639798 Singapore
- Singapore-HUJ Alliance for Research and Enterprise (SHARE); Nanomaterials for Energy and Energy-Water Nexus (NEW); Campus for Research Excellence and Technological Enterprise (CREATE); 1 Create Way Singapore 138602 Singapore
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17
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Kim S, Jung HJ, Kim JC, Lee KS, Park SS, Dravid VP, He K, Jeong HY. In Situ Observation of Resistive Switching in an Asymmetric Graphene Oxide Bilayer Structure. ACS NANO 2018; 12:7335-7342. [PMID: 29985600 DOI: 10.1021/acsnano.8b03806] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Graphene oxide decorated with oxygen functional groups is a promising candidate as an active layer in resistive switching devices due to its controllable physical-chemical properties, high flexibility, and transparency. However, the origin of conductive channels and their growth dynamics remain a major challenge. We use in situ transmission electron microscopy techniques to demonstrate that nanoscale graphene oxide sheets bonded with oxygen dynamically change their physical and chemical structures upon an applied electric field. Artificially engineered bilayer reduced graphene oxide films with asymmetric oxygen content exhibit nonvolatile write-once-read-many memory behaviors without experiencing the bubble destruction due to the efficient migration of oxygen ions. We clearly observe that a conductive graphitic channel with a conical shape evolves from the upper oxygen-rich region to the lower oxygen-poor region. These findings provide fundamental guidance for understanding the oxygen motions of oxygen-containing carbon materials for future carbon-based nanoelectronics.
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Affiliation(s)
- Sungkyu Kim
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- Department of Materials Science and Engineering , Clemson University , Clemson , South Carolina 29634 , United States
| | - Hee Joon Jung
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- International Institute of Nanotechnology, Evanston , Illinois 60208 , United States
| | - Jong Chan Kim
- School of Materials Science and Engineering , UNIST , Ulsan 44919 , Republic of Korea
| | - Kyung-Sun Lee
- UNIST Central Research Facilities (UCRF) , UNIST , Ulsan 44919 , Republic of Korea
| | - Sung Soo Park
- School of Materials Science and Engineering , UNIST , Ulsan 44919 , Republic of Korea
| | - Vinayak P Dravid
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- International Institute of Nanotechnology, Evanston , Illinois 60208 , United States
| | - Kai He
- Department of Materials Science and Engineering and NUANCE Center , Northwestern University , Evanston , Illinois 60208 , United States
- Department of Materials Science and Engineering , Clemson University , Clemson , South Carolina 29634 , United States
| | - Hu Young Jeong
- School of Materials Science and Engineering , UNIST , Ulsan 44919 , Republic of Korea
- UNIST Central Research Facilities (UCRF) , UNIST , Ulsan 44919 , Republic of Korea
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18
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Fan L, Wang X, Wang F, Zhang Q, Zhu L, Meng Q, Wang B, Zhang Z, Zou C. Revealing the role of oxygen vacancies on the phase transition of VO 2 film from the optical-constant measurements. RSC Adv 2018; 8:19151-19156. [PMID: 35539638 PMCID: PMC9080608 DOI: 10.1039/c8ra03292k] [Citation(s) in RCA: 19] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/17/2018] [Accepted: 05/18/2018] [Indexed: 11/21/2022] Open
Abstract
Vanadium dioxide (VO2) material shows a distinct metal–insulator transition (MIT) at the critical temperature of ∼340 K. Similar to other correlated oxides, the MIT properties of VO2 is always sensitive to those crystal defects such as oxygen vacancies. In this study, we investigated the oxygen vacancies related phase transition behavior of VO2 crystal film and systematically examined the effect of oxygen vacancies from the optical constant measurements. The results indicated that the oxygen vacancies changed not only the electron occupancy on V 3d–O 2p hybrid-orbitals, but also the electron–electron correlation energy and the related band gap, which modulated the MIT behavior and decreased the critical temperature resultantly. Our work not only provided a facile way to modulate the MIT behavior of VO2 crystal film, but also revealed the effects of the oxygen vacancies on the electronic inter-band transitions as well as the electronic correlations in driving this MIT process. Optical conductivity spectroscopy was performed to reveal the role of oxygen vacancies during VO2 metal–insulator transition.![]()
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Affiliation(s)
- Lele Fan
- Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology Yancheng 224051 P. R. China .,National Synchrotron Radiation Laboratory, University of Science and Technology of China Hefei 230029 P. R. China
| | - Xiangqi Wang
- Department of Physics, University of Science and Technology of China Hefei 230026 P. R. China
| | - Feng Wang
- Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology Yancheng 224051 P. R. China
| | - Qinfang Zhang
- Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology Yancheng 224051 P. R. China
| | - Lei Zhu
- Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology Yancheng 224051 P. R. China
| | - Qiangqiang Meng
- Key Laboratory for Advanced Technology in Environmental Protection of Jiangsu Province, Yancheng Institute of Technology Yancheng 224051 P. R. China
| | - Baolin Wang
- School of Physical Science and Technology, Nanjing Normal University Nanjing 210023 P. R. China
| | - Zengming Zhang
- Department of Physics, University of Science and Technology of China Hefei 230026 P. R. China
| | - Chongwen Zou
- National Synchrotron Radiation Laboratory, University of Science and Technology of China Hefei 230029 P. R. China
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