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For: You YW, Chang HY, Lin WC, Kuo CH, Lee SH, Kao WL, Yen GJ, Chang CJ, Liu CP, Huang CC, Liao HY, Shyue JJ. Molecular dynamic-secondary ion mass spectrometry (D-SIMS) ionized by co-sputtering with C60+ and Ar+. Rapid Commun Mass Spectrom 2011;25:2897-2904. [PMID: 21913268 DOI: 10.1002/rcm.5181] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Number Cited by Other Article(s)
1
Yin L, Zhang Z, Liu Y, Gao Y, Gu J. Recent advances in single-cell analysis by mass spectrometry. Analyst 2019;144:824-845. [PMID: 30334031 DOI: 10.1039/c8an01190g] [Citation(s) in RCA: 81] [Impact Index Per Article: 13.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/13/2022]
2
Goodwin CM, Voras ZE, Beebe TP. Gas-cluster ion sputtering: Effect on organic layer morphology. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. A, VACUUM, SURFACES, AND FILMS : AN OFFICIAL JOURNAL OF THE AMERICAN VACUUM SOCIETY 2018;36:051507. [PMID: 30078936 PMCID: PMC6063752 DOI: 10.1116/1.5044643] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2018] [Revised: 07/03/2018] [Accepted: 07/11/2018] [Indexed: 06/08/2023]
3
Chu YH, Liao HY, Lin KY, Chang HY, Kao WL, Kuo DY, You YW, Chu KJ, Wu CY, Shyue JJ. Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2(+) cosputtering. Analyst 2016;141:2523-33. [PMID: 27000483 DOI: 10.1039/c5an02677f] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
4
Liao HY, Chen JH, Shyue JJ, Shun CT, Chen HW, Liao SW, Hong CK, Chen PS. Rapid label-free determination of ketamine in whole blood using secondary ion mass spectrometry. Talanta 2015;143:50-55. [PMID: 26078127 DOI: 10.1016/j.talanta.2015.04.074] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/19/2015] [Revised: 04/23/2015] [Accepted: 04/26/2015] [Indexed: 01/09/2023]
5
Liao HY, Tsai MH, Kao WL, Kuo DY, Shyue JJ. Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering. Anal Chim Acta 2014;852:129-36. [DOI: 10.1016/j.aca.2014.08.044] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/06/2014] [Revised: 08/20/2014] [Accepted: 08/21/2014] [Indexed: 10/24/2022]
6
Liao HY, Lin KY, Kao WL, Chang HY, Huang CC, Shyue JJ. Enhancing the Sensitivity of Molecular Secondary Ion Mass Spectrometry with C60+-O2+ Cosputtering. Anal Chem 2013;85:3781-8. [DOI: 10.1021/ac400214t] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
7
Liao HY, Tsai MH, Chang HY, You YW, Huang CC, Shyue JJ. Effect of Cosputtering and Sample Rotation on Improving C60+ Depth Profiling of Materials. Anal Chem 2012;84:9318-23. [DOI: 10.1021/ac3020824] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/17/2023]
8
Liao HY, Tsai MH, You YW, Chang HY, Huang CC, Shyue JJ. Dramatically Enhanced Oxygen Uptake and Ionization Yield of Positive Secondary Ions with C60+ Sputtering. Anal Chem 2012;84:3355-61. [DOI: 10.1021/ac300147g] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/15/2022]
9
Paruch RJ, Garrison BJ, Postawa Z. Partnering Analytic Models and Dynamic Secondary Ion Mass Spectrometry Simulations to Interpret Depth Profiles Due to Kiloelectronvolt Cluster Bombardment. Anal Chem 2012;84:3010-6. [DOI: 10.1021/ac300363j] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/18/2023]
10
Garrison BJ, Schiffer ZJ, Kennedy PE, Postawa Z. Modeling dynamic cluster SIMS experiments. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.4905] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
11
Chang CJ, Chang HY, You YW, Liao HY, Kuo YT, Kao WL, Yen GJ, Tsai MH, Shyue JJ. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60+–Ar+ co-sputtering. Anal Chim Acta 2012;718:64-9. [DOI: 10.1016/j.aca.2011.12.064] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/14/2011] [Revised: 12/25/2011] [Accepted: 12/28/2011] [Indexed: 10/14/2022]
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