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Yin L, Zhang Z, Liu Y, Gao Y, Gu J. Recent advances in single-cell analysis by mass spectrometry. Analyst 2019; 144:824-845. [PMID: 30334031 DOI: 10.1039/c8an01190g] [Citation(s) in RCA: 81] [Impact Index Per Article: 13.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/13/2022]
Abstract
Cells are the most basic structural units that play vital roles in the functioning of living organisms. Analysis of the chemical composition and content of a single cell plays a vital role in ensuring precise investigations of cellular metabolism, and is a crucial aspect of lipidomic and proteomic studies. In addition, structural knowledge provides a better understanding of cell behavior as well as the cellular and subcellular mechanisms. However, single-cell analysis can be very challenging due to the very small size of each cell as well as the large variety and extremely low concentrations of substances found in individual cells. On account of its high sensitivity and selectivity, mass spectrometry holds great promise as an effective technique for single-cell analysis. Numerous mass spectrometric techniques have been developed to elucidate the molecular profiles at the cellular level, including electrospray ionization mass spectrometry (ESI-MS), secondary ion mass spectrometry (SIMS), laser-based mass spectrometry and inductively coupled plasma mass spectrometry (ICP-MS). In this review, the recent advances in single-cell analysis by mass spectrometry are summarized. The strategies of different ionization modes to achieve single-cell analysis are classified and discussed in detail.
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Affiliation(s)
- Lei Yin
- Research Institute of Translational Medicine, The First Hospital of Jilin University, Jilin University, Dongminzhu Street, Changchun 130061, PR China.
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Goodwin CM, Voras ZE, Beebe TP. Gas-cluster ion sputtering: Effect on organic layer morphology. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. A, VACUUM, SURFACES, AND FILMS : AN OFFICIAL JOURNAL OF THE AMERICAN VACUUM SOCIETY 2018; 36:051507. [PMID: 30078936 PMCID: PMC6063752 DOI: 10.1116/1.5044643] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/14/2018] [Revised: 07/03/2018] [Accepted: 07/11/2018] [Indexed: 06/08/2023]
Abstract
Analysis of the surface of thin Irganox 1010 films before and after sputtering with an argon gas-cluster ion beam was performed with AFM and XPS to determine the effect that Zalar rotation has on the chemistry and morphology of the surface. The analysis is based on the change in roughness of the surface by comparing the same location on the surface before and after sputtering. The ion beam used was an Ar n + of size n = 1000 and energy 4 keV. The XPS analysis agreed with previous results in which the ion beam did not cause measurable accumulation of damaged material. Based on the AFM results, the Irganox 1010 surface became rougher as a result of ion sputtering, and the degree of roughening was quantified, as was the sputter rate. Furthermore, Zalar rotation during ion sputtering did not have a significant effect on surface roughening, surprisingly.
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Affiliation(s)
- Christopher M Goodwin
- Department of Chemistry and Biochemistry, University of Delaware, Newark, Delaware 19716
| | - Zachary E Voras
- Department of Chemistry and Biochemistry, University of Delaware, Newark, Delaware 19716
| | - Thomas P Beebe
- Department of Chemistry and Biochemistry, University of Delaware, Newark, Delaware 19716
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Chu YH, Liao HY, Lin KY, Chang HY, Kao WL, Kuo DY, You YW, Chu KJ, Wu CY, Shyue JJ. Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2(+) cosputtering. Analyst 2016; 141:2523-33. [PMID: 27000483 DOI: 10.1039/c5an02677f] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
Abstract
Over the last decade, cluster ion beams have displayed their capability to analyze organic materials and biological specimens. Compared with atomic ion beams, cluster ion beams non-linearly enhance the sputter yield, suppress damage accumulation and generate high mass fragments during sputtering. These properties allow successful Secondary Ion Mass Spectroscopy (SIMS) analysis of soft materials beyond the static limit. Because the intensity of high mass molecular ions is intrinsically low, enhancing the intensity of these secondary ions while preserving the sample in its original state is the key to highly sensitive molecular depth profiles. In this work, bulk poly(ethylene terephthalate) (PET) was used as a model material and analyzed using Time-of-Flight SIMS (ToF-SIMS) with a pulsed Bi3(2+) primary ion. The optimized hardware of a 10 kV Ar2500(+) Gas Cluster Ion Beam (GCIB) with a low kinetic energy (200-500 V) oxygen ion (O2(+)) as a cosputter beam was employed for generating depth profiles and for examining the effect of beam parameters. The results were then quantitatively analyzed using an established erosion model. It was found that the ion intensity of the PET monomer ([M + H](+)) and its large molecular fragment ([M - C2H4O + H](+)) steadily declined during single GCIB sputtering, with distortion of the distribution information. However, under an optimized GCIB-O2(+) cosputter, the secondary ion intensity quickly reached a steady state and retained >95% intensity with respect to the pristine surface, although the damage cross-section was larger than that of single GCIB sputtering. This improvement was due to the oxidation of molecules and the formation of -OH groups that serve as proton donors to particles emitted from the surface. As a result, the ionization yield was enhanced and damage to the chemical structure was masked. Although O2(+) is known to alter the chemical structure and cause damage accumulation, the concurrently used GCIB could sufficiently remove the surface layer and allow the damage to be masked by the enhanced ionization yield when the ion-solid interaction volume was kept shallow with a low O2(+) energy. This low O2(+) energy (200 V) cosputtering also produced a smoother surface than a single GCIB. Because the oxidized species were produced by O2(+) and removed by GCIB simultaneously, a sufficiently high O2(+) current density was required to produce adequate enhancements. Therefore, it was found that 10 kV with 2 × 10(-6) A per cm(2) Ar2500(+) and 200 V with 3.2 × 10(-4) A per cm(2) O2(+) produced the best profile.
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Affiliation(s)
- Yi-Hsuan Chu
- Department of Materials Science and Engineering, National Taiwan University, Taipei, Taiwan.
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Liao HY, Chen JH, Shyue JJ, Shun CT, Chen HW, Liao SW, Hong CK, Chen PS. Rapid label-free determination of ketamine in whole blood using secondary ion mass spectrometry. Talanta 2015; 143:50-55. [PMID: 26078127 DOI: 10.1016/j.talanta.2015.04.074] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/19/2015] [Revised: 04/23/2015] [Accepted: 04/26/2015] [Indexed: 01/09/2023]
Abstract
A fast and accurate drug screening to identify the possible presence of a wide variety of pharmaceutical and illicit drugs is increasingly requested in forensic and clinical toxicology. The current first-line screening relies on immunoassays. They determine only certain common drugs of which antibodies are commercially available. To address the issue, a rapid screening using secondary ion mass spectrometry (SIMS) has been developed. In the study, SIMS directly analyzed ketamine in whole blood without any pretreatment. While the untreated blood has a complicated composition, principal-components analysis (PCA) is used to detect unknown specimens by building up an analytical model from blank samples which were spiked with ketamine at 100 ng mL(-1), to simulate the presence of ketamine. Each characteristics m/z is normalized and scaled by multiplying the root square of intensity and square of corresponding m/z, developed by National Institute of Standards and Technology (NIST). Using linear regression and the result of PCA, this study enables to correctly distinguish ketamine positive and negative groups in an unknown set of specimens. The quantity of ketamine in an unknown set was determined using gas chromatography-mass spectrometry (GC-MS) as the reference methodology. Instead limited by commercially available antibodies, SIMS detects target molecules straight despite the label-free detection capabilities of SIMS, additional data processing (here, PCA) can be used to fully analyse the produced data, which extends the range of analytes of interest on drug screening. Furthermore, extremely low sample volume, 5 µL, is required owing to the high spatial resolution of SIMS. In addition, while the whole blood is analyzed within 3 min, the whole analysis has been shortened significantly and high throughput can be achieved.
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Affiliation(s)
- Hua-Yang Liao
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan
| | - Jung-Hsuan Chen
- Forensic and Clinical Toxicology Center, National Taiwan University College of Medicine and National Taiwan University Hospital, Taipei 100, Taiwan; Graduate Institute of Toxicology, National Taiwan University College of Medicine, National Taiwan University, Taipei 100, Taiwan
| | - Jing-Jong Shyue
- Research Center for Applied Sciences, Academia Sinica, Taipei 115, Taiwan; Department of Materials Science and Engineering, National Taiwan University, Taipei 106, Taiwan
| | - Chia-Tung Shun
- Forensic and Clinical Toxicology Center, National Taiwan University College of Medicine and National Taiwan University Hospital, Taipei 100, Taiwan; Department and Graduate Institute of Forensic Medicine, National Taiwan University, Taipei 100, Taiwan
| | - Huei-Wen Chen
- Graduate Institute of Toxicology, National Taiwan University College of Medicine, National Taiwan University, Taipei 100, Taiwan
| | - Su-Wei Liao
- Department and Graduate Institute of Forensic Medicine, National Taiwan University, Taipei 100, Taiwan
| | - Chih-Kang Hong
- Department and Graduate Institute of Forensic Medicine, National Taiwan University, Taipei 100, Taiwan
| | - Pai-Shan Chen
- Forensic and Clinical Toxicology Center, National Taiwan University College of Medicine and National Taiwan University Hospital, Taipei 100, Taiwan; Department and Graduate Institute of Forensic Medicine, National Taiwan University, Taipei 100, Taiwan.
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Liao HY, Tsai MH, Kao WL, Kuo DY, Shyue JJ. Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering. Anal Chim Acta 2014; 852:129-36. [DOI: 10.1016/j.aca.2014.08.044] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/06/2014] [Revised: 08/20/2014] [Accepted: 08/21/2014] [Indexed: 10/24/2022]
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Liao HY, Lin KY, Kao WL, Chang HY, Huang CC, Shyue JJ. Enhancing the Sensitivity of Molecular Secondary Ion Mass Spectrometry with C60+-O2+ Cosputtering. Anal Chem 2013; 85:3781-8. [DOI: 10.1021/ac400214t] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Affiliation(s)
- Hua-Yang Liao
- Research Center for Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Kang-Yi Lin
- Research Center for Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Wei-Lun Kao
- Research Center for Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Hsun-Yun Chang
- Research Center for Applied
Science, Academia Sinica, Tapei 115, Taiwan
- Nanoscience
and Technology Program,
Taiwan International Graduate Program, Academia Sinica, Taipei 115, Taiwan
- Department
of Engineering and
System Science, National Tsing Hua University, Hsin-Chu, 300, Taiwan
| | - Chih-Chieh Huang
- Department of Materials Science
and Engineering, Nation Taiwan University, Taipei 106, Taiwan
| | - Jing-Jong Shyue
- Research Center for Applied
Science, Academia Sinica, Tapei 115, Taiwan
- Department of Materials Science
and Engineering, Nation Taiwan University, Taipei 106, Taiwan
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7
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Liao HY, Tsai MH, Chang HY, You YW, Huang CC, Shyue JJ. Effect of Cosputtering and Sample Rotation on Improving C60+ Depth Profiling of Materials. Anal Chem 2012; 84:9318-23. [DOI: 10.1021/ac3020824] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/17/2023]
Affiliation(s)
- Hua-Yang Liao
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Meng-Hung Tsai
- Department of Materials Science
and Engineering, Nation Taiwan University, Taipei 106, Taiwan
| | - Hsun-Yun Chang
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Yun-Wen You
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Chih-Chieh Huang
- Department of Materials Science
and Engineering, Nation Taiwan University, Taipei 106, Taiwan
| | - Jing-Jong Shyue
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
- Department of Materials Science
and Engineering, Nation Taiwan University, Taipei 106, Taiwan
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Liao HY, Tsai MH, You YW, Chang HY, Huang CC, Shyue JJ. Dramatically Enhanced Oxygen Uptake and Ionization Yield of Positive Secondary Ions with C60+ Sputtering. Anal Chem 2012; 84:3355-61. [DOI: 10.1021/ac300147g] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/15/2022]
Affiliation(s)
- Hua-Yang Liao
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Meng-Hung Tsai
- Department
of Materials Science and Engineering, Nation Taiwan University, Taipei 106, Taiwan
| | - Yun-Wen You
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Hsun-Yun Chang
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
| | - Chih-Chieh Huang
- Department
of Materials Science and Engineering, Nation Taiwan University, Taipei 106, Taiwan
| | - Jing-Jong Shyue
- Research Center for
Applied
Science, Academia Sinica, Tapei 115, Taiwan
- Department
of Materials Science and Engineering, Nation Taiwan University, Taipei 106, Taiwan
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9
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Paruch RJ, Garrison BJ, Postawa Z. Partnering Analytic Models and Dynamic Secondary Ion Mass Spectrometry Simulations to Interpret Depth Profiles Due to Kiloelectronvolt Cluster Bombardment. Anal Chem 2012; 84:3010-6. [DOI: 10.1021/ac300363j] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/18/2023]
Affiliation(s)
- Robert J. Paruch
- Smoluchowski Institute of Physics, Jagiellonian University, ul. Reymonta 4, 30-059 Kraków,
Poland
| | - Barbara J. Garrison
- Department of Chemistry,
104
Chemistry Building, Penn State University, University Park, Pennsylvania 16802, United States
| | - Zbigniew Postawa
- Smoluchowski Institute of Physics, Jagiellonian University, ul. Reymonta 4, 30-059 Kraków,
Poland
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10
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Garrison BJ, Schiffer ZJ, Kennedy PE, Postawa Z. Modeling dynamic cluster SIMS experiments. SURF INTERFACE ANAL 2012. [DOI: 10.1002/sia.4905] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Affiliation(s)
- Barbara J. Garrison
- Department of Chemistry; Penn State University; University Park PA 16802 USA
| | - Zachary J. Schiffer
- Department of Chemistry; Penn State University; University Park PA 16802 USA
| | - Paul E. Kennedy
- Department of Chemistry; Penn State University; University Park PA 16802 USA
| | - Zbigniew Postawa
- Smoluchowski Institute of Physics; Jagiellonian University; ul. Reymonta 4 30-059 Kraków Poland
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Chang CJ, Chang HY, You YW, Liao HY, Kuo YT, Kao WL, Yen GJ, Tsai MH, Shyue JJ. Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60+–Ar+ co-sputtering. Anal Chim Acta 2012; 718:64-9. [DOI: 10.1016/j.aca.2011.12.064] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/14/2011] [Revised: 12/25/2011] [Accepted: 12/28/2011] [Indexed: 10/14/2022]
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