Ink identification by time-of-flight secondary ion mass spectroscopy

Artefact Profiling: Panomics Approaches for Understanding the Materiality of Written Artefacts

This review explains the strategies behind genomics, proteomics, metabolomics, metallomics and isotopolomics approaches and their applicability to written artefacts. The respective sub-chapters give an insight into the analytical procedure and the conclusions drawn from such analyses. A distinction is made between information that can be obtained from the materials used in the respective manuscript and meta-information that cannot be obtained from the manuscript itself, but from residues of organisms such as bacteria or the authors and readers. In addition, various sampling techniques are discussed in particular, which pose a special challenge in manuscripts. The focus is on high-resolution, non-targeted strategies that can be used to extract the maximum amount of information about ancient objects. The combination of the various omics disciplines (panomics) especially offers potential added value in terms of the best possible interpretations of the data received. The information obtained can be used to understand the production of ancient artefacts, to gain impressions of former living conditions, to prove their authenticity, to assess whether there is a toxic hazard in handling the manuscripts, and to be able to determine appropriate measures for their conservation and restoration.

Comparison of optical techniques and MeV SIMS in determining deposition order between optically distinguishable and indistinguishable inks from different writing tools

In the forensic investigation of questioned documents, it is often very important to know the deposition order of ink traces from two different writing tools at their intersection on a paper. In the present work, intersections of inks from several writing tools were studied using optical techniques that are standardly applied for questioned documents examination in a forensic laboratory, and an accelerator-based Ion Beam Analysis (IBA) technique called Secondary Ion Mass Spectrometry using MeV ions (MeV SIMS) that is applied in an accelerator facility. MeV SIMS provides molecular information about the studied inks from writing tools, which is an added value and can be also applied for determination of deposition order but was so far relatively rarely used in forensic studies. Aim of this paper is to compare performance of optical techniques and MeV SIMS for several combinations of intersecting lines. Cases were divided into those in which optical techniques can distinguish used inks and those which are optically completely indistinguishable. In the latter cases, we show that although mass spectra of used inks (from blue ballpoint pens) had extremely small differences, these in combination with advanced and most importantly objective multivariate algorithms could be very beneficial in resolving the deposition order at the intersection of optically indistinguishable inks. In general, MeV SIMS proved to be more efficient for oil-based inks while difficulties were encountered with water-based ones, similar to optical methods.

Writing sequence identification of seals and signatures in documents using ambient mass spectrometry imaging with chemometric methods

Identifying the writing sequence of seals and signatures in documents is often performed and difficult to resolve in forensic determination. Morphological and physical-chemical analysis methods are often limited by the destructive nature of samples, a high signal response strength and specific materials. Mass spectrometry imaging (MSI) has been used as an alternative method because it can generate molecular images from many surfaces and produce rich chemical information. Herein, we developed a sequence identification method by coupling an air flow-assisted desorption electrospray ionization (AFADESI)-MSI system with a chemometric analysis, which can holistically and directly analyse document samples under ambient, moderate and selectable conditions and maintain the original appearance of the paper documents after sampling. By integrating principal component analysis (PCA) and the partial least squares discriminant analysis (PLS-DA), equivocal point analysis can be objectively performed, where knowing the components of the seal or signature is not necessary to identify the sequence. In total, 28 prepared samples with known sequences and two original blind test samples were analysed. One prepared sample was analysed in negative ionization mode, and other samples were inferred in positive ionization mode. All writing sequences were in accordance with the actual case. The writing sequence of the blind testing of the original samples was correctly identified. This study provided a convenient, objective and quasi-nondestructive method to investigate the sequence differences among equivocal document samples and is promising for providing an alternative method for the sequence identification of seals and signatures in questionable documents.

Determining the chronological sequence of inks deposited with different writing and printing tools using ion beam analysis

Determining the sequence of inks in a questioned document is important in forensic science. Conventional and micro beam-based ion beam analysis using Rutherford backscattering spectrometry (RBS) and particle-induced X-ray emission were employed to study the depth distribution of chemical elements in plain paper and inks/toner deposited by different pens as well as inkjet and laser printers. Composition depth profiling with high lateral resolution was performed with focus on areas where two different coloring agents overlapped. We identify under which conditions the sequence of inks deposited can be reconstructed, analyzing the continuity of characteristic contributions to the obtained signals, with a focus on the depth-resolved RBS data. The order of deposition was correctly determined for combinations of two different laser printers and in certain cases for pens. Results indicate a potential for analysis, depending on the composition of staining agent, that is, in particular if heavy species are present in sufficiently high concentration. In such cases, also characters obscured or modified by an agent of different composition can be revealed. Changing the probing depth by modifying the beam energy could yield additional information.

Determination of Deposition Order of Toners, Inkjet Inks, and Blue Ballpoint Pen Combining MeV-Secondary Ion Mass Spectrometry and Particle Induced X-ray Emission

Determination of the deposition order of different writing tools is very important for the forensic investigation of questioned documents. Here we present a novel application of two ion beam analysis (IBA) techniques: secondary ion mass spectrometry using MeV ions (MeV-SIMS) and particle induced X-ray emission (PIXE) to determine the deposition order of intersecting lines made of ballpoint pen ink, inkjet printer ink, and laser printer toners. MeV-SIMS is an emerging mass spectrometry technique where incident heavy MeV ions are used to desorb secondary molecular ions from the uppermost layers of an organic sample. In contrast, PIXE provides information about sample elemental composition through characteristic X-ray spectra coming from greater depth. In the case of PIXE, the information depth depends on incident ion energy, sample matrix and self-absorption of X-rays on the way out from the sample to the X-ray detector. The measurements were carried out using a heavy ion microprobe at the Ruđer Bošković Institute. Principal component analysis (PCA) was employed for image processing of the data. We will demonstrate that MeV-SIMS alone was successful to determine the deposition order of all intersections not involving inkjet printer ink. The fact that PIXE yields information from deeper layers was crucial to resolve cases where inkjet printer ink was included due to its adherence and penetration properties. This is the first time the different information depths of PIXE and MeV-SIMS have been exploited for a practical application. The use of both techniques, MeV-SIMS and PIXE, allowed the correct determination of deposition order for four out of six pairs of samples.

Analysis of red inks by micellar electrokinetic capillary chromatography with laser-induced fluorescence detection

A combination of MEKC with a--highly sensitive but not commonly used--LIF detector was tested regarding the possibility of differentiation of red inks. The separation process was conducted in a fused silica capillary (id 50 μm, 60/50 cm total/effective length) in BGE consisting of 40 mM sodium borate, 20 mM SDS and 10% v/v ACN with 30 kV applied. The optimized temperature of storage and capillary was 10 and 25°C, respectively. The samples were prepared using 20 dots (ø 0.5 mm), extracted in 35 μL BGE and diluted with 30 μL of water. The proposed method showed excellent repeatability and reproducibility (RSD (tm ) < 0.8 and < 2.5%, respectively). It was applied to group identification and differentiation of different brands, models, and batches of red printing, stamp, and pen inks. It was demonstrated that differentiation can be performed effectively on the basis of migration times and ratios of peak areas. The high efficiency of the developed method was indicated by discriminating power ranging from 87.3 to 98.8%, for stamp and pen inks, respectively. The results showed that the proposed procedure can be valuable for an objective examination of the red parts of questioned documents.

Time-of-flight-secondary ion mass spectrometry method development for high-sensitivity analysis of acid dyes in nylon fibers

A minimally destructive technique for the determination of dyes in finished fibers provides an important tool for crime scene and other forensic investigations. The analytical power and the minimal sample consumption of time-of-flight-secondary ion mass spectrometric (TOF-SIMS) analysis provides the ability to obtain definitive molecular and elemental information relevant to fiber identification, including identification of dyes, from a very small volume of sample. For both fiber surface analysis and, with the aid of cryomicrotomy, fiber cross-section analysis, TOF-SIMS was used to identify various dyes in finished textile fibers. The analysis of C.I. Acid Blue 25 in nylon is presented as a representative example. The molecular ion of C.I. Acid Blue 25 with lower than 3% on weight-of-fiber (owf) dye loading cannot be identified on dyed nylon surfaces by TOF-SIMS using a Bi(3)(+) primary ion beam. Sputtering with C(60)(+) provided the ability to remove surface contamination as well as at least partially remove Bi-induced damage, resulting in a greatly improved signal-to-noise ratio for the Acid Blue 25 molecular ion. The use of C(60)(+) for damage removal in a cyclic manner along with Bi for data acquisition provided the ability to unambiguously identify Acid Blue 25 via its molecular ion at a concentration of 0.1% owf from both fiber surfaces and cross sections.